KR102393083B1 - 도전성 입자 및 이를 포함하는 검사용 소켓 - Google Patents

도전성 입자 및 이를 포함하는 검사용 소켓 Download PDF

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Publication number
KR102393083B1
KR102393083B1 KR1020200105157A KR20200105157A KR102393083B1 KR 102393083 B1 KR102393083 B1 KR 102393083B1 KR 1020200105157 A KR1020200105157 A KR 1020200105157A KR 20200105157 A KR20200105157 A KR 20200105157A KR 102393083 B1 KR102393083 B1 KR 102393083B1
Authority
KR
South Korea
Prior art keywords
conductive
conductive particles
socket
conductive part
inspection
Prior art date
Application number
KR1020200105157A
Other languages
English (en)
Korean (ko)
Other versions
KR20220023438A (ko
Inventor
김규선
Original Assignee
주식회사 스노우
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 스노우 filed Critical 주식회사 스노우
Priority to KR1020200105157A priority Critical patent/KR102393083B1/ko
Priority to US17/340,841 priority patent/US11693027B2/en
Priority to TW110122108A priority patent/TWI787868B/zh
Priority to CN202110717687.0A priority patent/CN114078610A/zh
Publication of KR20220023438A publication Critical patent/KR20220023438A/ko
Application granted granted Critical
Publication of KR102393083B1 publication Critical patent/KR102393083B1/ko

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B7/00—Insulated conductors or cables characterised by their form
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/16—Magnets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
KR1020200105157A 2020-08-21 2020-08-21 도전성 입자 및 이를 포함하는 검사용 소켓 KR102393083B1 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1020200105157A KR102393083B1 (ko) 2020-08-21 2020-08-21 도전성 입자 및 이를 포함하는 검사용 소켓
US17/340,841 US11693027B2 (en) 2020-08-21 2021-06-07 Conductive particle and testing socket comprising the same
TW110122108A TWI787868B (zh) 2020-08-21 2021-06-17 導電性顆粒及包括其的測試插座
CN202110717687.0A CN114078610A (zh) 2020-08-21 2021-06-28 导电性颗粒及包括其的测试插座

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020200105157A KR102393083B1 (ko) 2020-08-21 2020-08-21 도전성 입자 및 이를 포함하는 검사용 소켓

Publications (2)

Publication Number Publication Date
KR20220023438A KR20220023438A (ko) 2022-03-02
KR102393083B1 true KR102393083B1 (ko) 2022-05-03

Family

ID=80269511

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020200105157A KR102393083B1 (ko) 2020-08-21 2020-08-21 도전성 입자 및 이를 포함하는 검사용 소켓

Country Status (4)

Country Link
US (1) US11693027B2 (zh)
KR (1) KR102393083B1 (zh)
CN (1) CN114078610A (zh)
TW (1) TWI787868B (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20240010319A (ko) * 2022-07-15 2024-01-23 주식회사 아이에스시 전기적 검사를 위한 도전성 입자, 검사용 커넥터 및 도전성 입자의 제조방법

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008108842A (ja) 2006-10-24 2008-05-08 Nissan Motor Co Ltd 半導体装置及びその製造方法
KR101525520B1 (ko) * 2015-02-03 2015-06-03 (주)티에스이 결합 형상의 도전성 입자를 가지는 검사용 소켓
KR101586340B1 (ko) * 2014-12-26 2016-01-18 주식회사 아이에스시 전기적 검사 소켓 및 전기적 검사 소켓용 도전성 입자의 제조방법
KR101739536B1 (ko) * 2016-05-11 2017-05-24 주식회사 아이에스시 검사용 소켓 및 도전성 입자
KR101739537B1 (ko) 2016-05-11 2017-05-25 주식회사 아이에스시 검사용 소켓 및 도전성 입자
KR101769882B1 (ko) * 2016-02-15 2017-09-05 (주)티에스이 검사용 소켓

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Publication number Priority date Publication date Assignee Title
JP4467721B2 (ja) * 2000-06-26 2010-05-26 富士通マイクロエレクトロニクス株式会社 コンタクタ及びコンタクタを使用した試験方法
JP2006194620A (ja) * 2005-01-11 2006-07-27 Tokyo Electron Ltd プローブカード及び検査用接触構造体
US8174279B2 (en) * 2009-08-21 2012-05-08 Freescale Semiconductor, Inc. Socket connector for connection lead of semiconductor device under test with tester
KR101282044B1 (ko) * 2010-08-02 2013-07-05 이진배 풍력발전기
JP2016505155A (ja) * 2013-02-19 2016-02-18 株式会社アイエスシーＩｓｃ Ｃｏ．， Ｌｔｄ． 高密度導電部を有するテスト用ソケット
KR101782604B1 (ko) 2016-02-02 2017-09-27 (주)티에스이 검사용 소켓
KR101830935B1 (ko) * 2016-03-18 2018-02-22 주식회사 오킨스전자 와이어 본딩과 가압 성형을 이용한 테스트 소켓의 도전성 파티클 제조 방법 및 장치
KR101805834B1 (ko) 2016-05-11 2017-12-07 주식회사 아이에스시 검사용 소켓 및 도전성 입자
KR101864859B1 (ko) 2016-12-07 2018-06-05 주식회사 아이에스시 검사용 소켓장치
KR101901982B1 (ko) 2017-07-19 2018-09-27 주식회사 아이에스시 검사용 소켓 및 도전성 입자
KR101973609B1 (ko) 2018-02-19 2019-04-29 (주)티에스이 정형 및 비정형의 도전성 입자가 혼재된 도전부를 구비하는 반도체 검사용 러버소켓
KR102089653B1 (ko) * 2019-12-30 2020-03-16 신종천 테스트 소켓 조립체
KR102359547B1 (ko) * 2020-09-25 2022-02-08 (주)티에스이 테스트 소켓 및 이를 포함하는 테스트 장치
KR102629074B1 (ko) * 2021-08-27 2024-01-24 주식회사 티에스이 반도체 패키지의 테스트 장치

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008108842A (ja) 2006-10-24 2008-05-08 Nissan Motor Co Ltd 半導体装置及びその製造方法
KR101586340B1 (ko) * 2014-12-26 2016-01-18 주식회사 아이에스시 전기적 검사 소켓 및 전기적 검사 소켓용 도전성 입자의 제조방법
KR101525520B1 (ko) * 2015-02-03 2015-06-03 (주)티에스이 결합 형상의 도전성 입자를 가지는 검사용 소켓
KR101769882B1 (ko) * 2016-02-15 2017-09-05 (주)티에스이 검사용 소켓
KR101739536B1 (ko) * 2016-05-11 2017-05-24 주식회사 아이에스시 검사용 소켓 및 도전성 입자
KR101739537B1 (ko) 2016-05-11 2017-05-25 주식회사 아이에스시 검사용 소켓 및 도전성 입자

Also Published As

Publication number Publication date
US11693027B2 (en) 2023-07-04
TW202208864A (zh) 2022-03-01
CN114078610A (zh) 2022-02-22
US20220057434A1 (en) 2022-02-24
TWI787868B (zh) 2022-12-21
KR20220023438A (ko) 2022-03-02

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