KR102378350B1 - 기판 액 처리 장치 및 기판 액 처리 방법 - Google Patents
기판 액 처리 장치 및 기판 액 처리 방법 Download PDFInfo
- Publication number
- KR102378350B1 KR102378350B1 KR1020150081944A KR20150081944A KR102378350B1 KR 102378350 B1 KR102378350 B1 KR 102378350B1 KR 1020150081944 A KR1020150081944 A KR 1020150081944A KR 20150081944 A KR20150081944 A KR 20150081944A KR 102378350 B1 KR102378350 B1 KR 102378350B1
- Authority
- KR
- South Korea
- Prior art keywords
- substrates
- wafer
- substrate
- holding
- substrate holder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000000758 substrate Substances 0.000 title claims abstract description 127
- 239000007788 liquid Substances 0.000 title claims abstract description 86
- 238000003672 processing method Methods 0.000 title claims description 4
- 238000000034 method Methods 0.000 claims description 26
- 238000007599 discharging Methods 0.000 claims description 6
- 239000004065 semiconductor Substances 0.000 claims description 5
- 235000012431 wafers Nutrition 0.000 description 314
- 239000000126 substance Substances 0.000 description 86
- 238000005406 washing Methods 0.000 description 28
- 238000004140 cleaning Methods 0.000 description 27
- 239000000243 solution Substances 0.000 description 24
- 230000007246 mechanism Effects 0.000 description 20
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 19
- 238000003860 storage Methods 0.000 description 18
- 238000001035 drying Methods 0.000 description 13
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 9
- 230000015572 biosynthetic process Effects 0.000 description 9
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 6
- 238000005530 etching Methods 0.000 description 4
- 238000007689 inspection Methods 0.000 description 4
- 229910052581 Si3N4 Inorganic materials 0.000 description 3
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000003085 diluting agent Substances 0.000 description 3
- 239000008155 medical solution Substances 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- 210000000078 claw Anatomy 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 238000005192 partition Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000004308 accommodation Effects 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 238000010923 batch production Methods 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 238000007865 diluting Methods 0.000 description 1
- 238000010790 dilution Methods 0.000 description 1
- 239000012895 dilution Substances 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67057—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Weting (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2014-128617 | 2014-06-23 | ||
| JP2014128617A JP6189257B2 (ja) | 2014-06-23 | 2014-06-23 | 基板液処理装置及び基板液処理方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20150146397A KR20150146397A (ko) | 2015-12-31 |
| KR102378350B1 true KR102378350B1 (ko) | 2022-03-23 |
Family
ID=55129084
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020150081944A Active KR102378350B1 (ko) | 2014-06-23 | 2015-06-10 | 기판 액 처리 장치 및 기판 액 처리 방법 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP6189257B2 (enExample) |
| KR (1) | KR102378350B1 (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6645900B2 (ja) | 2016-04-22 | 2020-02-14 | キオクシア株式会社 | 基板処理装置および基板処理方法 |
| CN107086188B (zh) * | 2016-09-09 | 2020-07-03 | 深圳市新纶科技股份有限公司 | 一种晶元清洗装置 |
| CN109994402B (zh) * | 2017-12-29 | 2021-04-06 | 山东华光光电子股份有限公司 | 一种半导体研磨板上芯片清洗容器及其使用方法 |
| JP6985957B2 (ja) | 2018-02-21 | 2021-12-22 | キオクシア株式会社 | 半導体処理装置 |
| JP7336956B2 (ja) * | 2019-10-10 | 2023-09-01 | 東京エレクトロン株式会社 | 基板処理システム、及び基板処理方法 |
| CN111085498A (zh) * | 2019-12-23 | 2020-05-01 | 南安泊阅工业设计有限公司 | 一种晶圆洗边系统 |
| CN112371611B (zh) * | 2020-10-13 | 2022-02-01 | 江苏亚电科技有限公司 | 一种无篮晶圆清洗装置 |
| JP7539818B2 (ja) | 2020-11-11 | 2024-08-26 | 東京エレクトロン株式会社 | 基板処理装置および基板処理方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4828503B1 (enExample) | 1970-12-28 | 1973-09-01 | ||
| JP2539042B2 (ja) * | 1989-06-13 | 1996-10-02 | 富士通株式会社 | ウエハキャリア |
| JPH03232229A (ja) * | 1990-02-07 | 1991-10-16 | Mitsubishi Electric Corp | 半導体基板の洗浄装置およびその洗浄方法 |
| JPH04151833A (ja) * | 1990-10-16 | 1992-05-25 | Nippon Steel Corp | シリコンウエハ洗浄方法 |
| JP2598360B2 (ja) * | 1992-11-26 | 1997-04-09 | 株式会社スガイ | 基板の洗浄装置 |
| JPH0817782A (ja) * | 1994-06-28 | 1996-01-19 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
| JPH0845887A (ja) * | 1994-07-29 | 1996-02-16 | Nippon Steel Corp | ウェハ洗浄方法 |
| JPH09181042A (ja) * | 1995-12-21 | 1997-07-11 | Nec Corp | ウェット処理装置 |
| JP3510463B2 (ja) * | 1997-11-10 | 2004-03-29 | 東京エレクトロン株式会社 | 基板の整列装置及び整列方法 |
| KR101210263B1 (ko) * | 2006-12-07 | 2012-12-10 | 주식회사 케이씨텍 | 기판 가이드 및 이를 구비하는 기판 세정 장치 |
| JP5599754B2 (ja) | 2010-05-31 | 2014-10-01 | 東京エレクトロン株式会社 | 基板処理装置、基板処理方法、およびこの基板処理方法を実行するためのコンピュータプログラムが記録された記録媒体 |
-
2014
- 2014-06-23 JP JP2014128617A patent/JP6189257B2/ja active Active
-
2015
- 2015-06-10 KR KR1020150081944A patent/KR102378350B1/ko active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP6189257B2 (ja) | 2017-08-30 |
| JP2016009729A (ja) | 2016-01-18 |
| KR20150146397A (ko) | 2015-12-31 |
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