KR102148330B1 - 전기접속용 커넥터 - Google Patents

전기접속용 커넥터 Download PDF

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Publication number
KR102148330B1
KR102148330B1 KR1020180138752A KR20180138752A KR102148330B1 KR 102148330 B1 KR102148330 B1 KR 102148330B1 KR 1020180138752 A KR1020180138752 A KR 1020180138752A KR 20180138752 A KR20180138752 A KR 20180138752A KR 102148330 B1 KR102148330 B1 KR 102148330B1
Authority
KR
South Korea
Prior art keywords
carbon nanotubes
connector
vertical direction
magnetic particles
elastic
Prior art date
Application number
KR1020180138752A
Other languages
English (en)
Korean (ko)
Other versions
KR20200055280A (ko
Inventor
정영배
Original Assignee
주식회사 아이에스시
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 아이에스시 filed Critical 주식회사 아이에스시
Priority to KR1020180138752A priority Critical patent/KR102148330B1/ko
Priority to PCT/KR2019/015313 priority patent/WO2020101317A1/fr
Priority to CN201980074601.8A priority patent/CN113015914A/zh
Priority to TW108141031A priority patent/TWI730498B/zh
Publication of KR20200055280A publication Critical patent/KR20200055280A/ko
Application granted granted Critical
Publication of KR102148330B1 publication Critical patent/KR102148330B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755—Material aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0491—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets for testing integrated circuits on wafers, e.g. wafer-level test cartridge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
  • Measuring Leads Or Probes (AREA)
KR1020180138752A 2018-11-13 2018-11-13 전기접속용 커넥터 KR102148330B1 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1020180138752A KR102148330B1 (ko) 2018-11-13 2018-11-13 전기접속용 커넥터
PCT/KR2019/015313 WO2020101317A1 (fr) 2018-11-13 2019-11-12 Connecteur destiné à une connexion électrique
CN201980074601.8A CN113015914A (zh) 2018-11-13 2019-11-12 用于电连接的连接器
TW108141031A TWI730498B (zh) 2018-11-13 2019-11-12 電性連接用連接器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020180138752A KR102148330B1 (ko) 2018-11-13 2018-11-13 전기접속용 커넥터

Publications (2)

Publication Number Publication Date
KR20200055280A KR20200055280A (ko) 2020-05-21
KR102148330B1 true KR102148330B1 (ko) 2020-08-26

Family

ID=70731255

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020180138752A KR102148330B1 (ko) 2018-11-13 2018-11-13 전기접속용 커넥터

Country Status (4)

Country Link
KR (1) KR102148330B1 (fr)
CN (1) CN113015914A (fr)
TW (1) TWI730498B (fr)
WO (1) WO2020101317A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20230005593A (ko) * 2021-07-01 2023-01-10 주식회사 아이에스시 검사용 소켓

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102635714B1 (ko) * 2021-09-14 2024-02-13 주식회사 아이에스시 검사용 소켓 제조 방법
CN117825767B (zh) * 2024-03-06 2024-05-07 季华实验室 单分子器件探针进针装置、电学检测装置及电学检测装置的导通控制方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002093866A (ja) 2000-09-12 2002-03-29 Hoya Corp ウエハ一括コンタクトボード用コンタクト部品及びその製造方法
JP2002124318A (ja) 2000-10-12 2002-04-26 Jsr Corp 複合シートおよびその製造方法
KR101246301B1 (ko) 2012-01-18 2013-03-22 이재학 미세선형체가 마련된 테스트용 소켓
KR101393601B1 (ko) * 2013-07-24 2014-05-13 주식회사 아이에스시 도전성 커넥터 및 그 제조방법
KR101588844B1 (ko) 2014-12-30 2016-01-26 주식회사 아이에스시 코일형 탄소나노튜브를 가지는 검사용 커넥터
KR101839949B1 (ko) * 2016-10-14 2018-03-19 부경대학교 산학협력단 반도체 소자 테스트용 소켓의 제조 방법

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Publication number Priority date Publication date Assignee Title
JPH04186173A (ja) * 1990-11-21 1992-07-02 Nisshin Koki Kk 電子部品検査用具
CN1546365A (zh) * 2003-12-04 2004-11-17 东南大学 磁性纳米管及其制备方法
WO2007002297A2 (fr) * 2005-06-24 2007-01-04 Crafts Douglas E Dispositif de contact electrique plan provisoire et procede permettant d'utiliser des structures de contact a nanotubes compressibles verticalement
CN100453456C (zh) * 2006-12-31 2009-01-21 哈尔滨工业大学 一种磁性可控的超顺磁性纳米碳管的制备方法
CN101559938B (zh) * 2008-04-18 2011-05-11 中国科学院大连化学物理研究所 一种高度石墨化纳米碳材料的制备方法
KR101299197B1 (ko) * 2009-12-02 2013-08-23 주식회사 오킨스전자 반도체칩 패키지 테스트용 콘택트
KR101378505B1 (ko) 2009-12-02 2014-03-31 주식회사 오킨스전자 반도체칩 패키지 테스트용 콘택트
KR101573450B1 (ko) * 2014-07-17 2015-12-11 주식회사 아이에스시 테스트용 소켓
KR101833009B1 (ko) * 2016-03-18 2018-02-27 주식회사 오킨스전자 도전성 파티클이 자화된 도전 와이어에 의하여 자성 배열되는 테스트 소켓 및 그 제조 방법

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002093866A (ja) 2000-09-12 2002-03-29 Hoya Corp ウエハ一括コンタクトボード用コンタクト部品及びその製造方法
JP2002124318A (ja) 2000-10-12 2002-04-26 Jsr Corp 複合シートおよびその製造方法
KR101246301B1 (ko) 2012-01-18 2013-03-22 이재학 미세선형체가 마련된 테스트용 소켓
KR101393601B1 (ko) * 2013-07-24 2014-05-13 주식회사 아이에스시 도전성 커넥터 및 그 제조방법
KR101588844B1 (ko) 2014-12-30 2016-01-26 주식회사 아이에스시 코일형 탄소나노튜브를 가지는 검사용 커넥터
KR101839949B1 (ko) * 2016-10-14 2018-03-19 부경대학교 산학협력단 반도체 소자 테스트용 소켓의 제조 방법

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20230005593A (ko) * 2021-07-01 2023-01-10 주식회사 아이에스시 검사용 소켓
KR102571582B1 (ko) 2021-07-01 2023-08-28 주식회사 아이에스시 검사용 소켓

Also Published As

Publication number Publication date
TW202024646A (zh) 2020-07-01
TWI730498B (zh) 2021-06-11
KR20200055280A (ko) 2020-05-21
WO2020101317A1 (fr) 2020-05-22
CN113015914A (zh) 2021-06-22

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