KR102140053B1 - 방사선 검사 장치 및 방사선 검사 방법 - Google Patents

방사선 검사 장치 및 방사선 검사 방법 Download PDF

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Publication number
KR102140053B1
KR102140053B1 KR1020180093597A KR20180093597A KR102140053B1 KR 102140053 B1 KR102140053 B1 KR 102140053B1 KR 1020180093597 A KR1020180093597 A KR 1020180093597A KR 20180093597 A KR20180093597 A KR 20180093597A KR 102140053 B1 KR102140053 B1 KR 102140053B1
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KR
South Korea
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subject
radiation
detector
image
stage
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KR1020180093597A
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English (en)
Korean (ko)
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KR20190093105A (ko
Inventor
마사미 도미자와
히로키 와타나베
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도시바 아이티 앤 콘트롤 시스템 가부시키가이샤
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Publication of KR20190093105A publication Critical patent/KR20190093105A/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
KR1020180093597A 2018-01-31 2018-08-10 방사선 검사 장치 및 방사선 검사 방법 KR102140053B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018015631A JP6995653B2 (ja) 2018-01-31 2018-01-31 放射線検査装置及び放射線検査方法
JPJP-P-2018-015631 2018-01-31

Publications (2)

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KR20190093105A KR20190093105A (ko) 2019-08-08
KR102140053B1 true KR102140053B1 (ko) 2020-07-31

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KR1020180093597A KR102140053B1 (ko) 2018-01-31 2018-08-10 방사선 검사 장치 및 방사선 검사 방법

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Country Link
JP (1) JP6995653B2 (ja)
KR (1) KR102140053B1 (ja)
CN (1) CN110108728B (ja)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3545073B2 (ja) 1994-11-25 2004-07-21 財団法人ファインセラミックスセンター 差分画像処理を用いた放射線透視法
KR101334721B1 (ko) * 2011-01-17 2013-11-29 야마하하쓰도키 가부시키가이샤 방사선 검사 장치, 방사선 검사 방법, 및 촬상 조건 산출 장치
WO2015128969A1 (ja) * 2014-02-26 2015-09-03 株式会社日立製作所 Ｘ線撮像装置及びｘ線撮像方法
JP2017097689A (ja) * 2015-11-26 2017-06-01 Ｔａｋｕｍｉ Ｖｉｓｉｏｎ株式会社 物体検出装置、物体検出方法、及びコンピュータプログラム

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS545073A (en) 1977-06-14 1979-01-16 Sekine Sumie Food preserving box
JPH03114443A (ja) * 1989-09-29 1991-05-15 Hitachi Medical Corp デイジタルｘ線テレビ装置
JP2000184284A (ja) 1998-12-11 2000-06-30 Hitachi Medical Corp Ｘ線撮影装置におけるシェ―デング除去装置
EP1980846A1 (en) 2007-04-13 2008-10-15 Universiteit Gent Methods and systems for performing differential radiography
JP2009236637A (ja) 2008-03-26 2009-10-15 Panasonic Electric Works Co Ltd Ｘ線異物検査装置及びそれに用いられるｘ線異物検査方法
JP5188440B2 (ja) 2009-03-31 2013-04-24 富士フイルム株式会社 放射線画像補正方法および放射線画像撮影装置
WO2011048629A1 (ja) 2009-10-21 2011-04-28 株式会社島津製作所 放射線撮像装置
JP5813923B2 (ja) 2010-03-15 2015-11-17 株式会社日立ハイテクサイエンス Ｘ線透過検査装置及びｘ線透過検査方法
JP2015021784A (ja) * 2013-07-17 2015-02-02 株式会社島津製作所 二次元画像検出システム
JP6690819B2 (ja) * 2016-03-16 2020-04-28 東芝Ｉｔコントロールシステム株式会社 コンピュータ断層撮影装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3545073B2 (ja) 1994-11-25 2004-07-21 財団法人ファインセラミックスセンター 差分画像処理を用いた放射線透視法
KR101334721B1 (ko) * 2011-01-17 2013-11-29 야마하하쓰도키 가부시키가이샤 방사선 검사 장치, 방사선 검사 방법, 및 촬상 조건 산출 장치
WO2015128969A1 (ja) * 2014-02-26 2015-09-03 株式会社日立製作所 Ｘ線撮像装置及びｘ線撮像方法
JP2017097689A (ja) * 2015-11-26 2017-06-01 Ｔａｋｕｍｉ Ｖｉｓｉｏｎ株式会社 物体検出装置、物体検出方法、及びコンピュータプログラム

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CN110108728B (zh) 2022-05-27
JP6995653B2 (ja) 2022-01-14
JP2019132727A (ja) 2019-08-08
CN110108728A (zh) 2019-08-09
KR20190093105A (ko) 2019-08-08

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