KR102104915B1 - 반도체 장치 검사 환경에서의 디버깅 - Google Patents

반도체 장치 검사 환경에서의 디버깅 Download PDF

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KR102104915B1
KR102104915B1 KR1020157012641A KR20157012641A KR102104915B1 KR 102104915 B1 KR102104915 B1 KR 102104915B1 KR 1020157012641 A KR1020157012641 A KR 1020157012641A KR 20157012641 A KR20157012641 A KR 20157012641A KR 102104915 B1 KR102104915 B1 KR 102104915B1
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South Korea
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debug
inspection
dut
command
program
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KR1020157012641A
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Korean (ko)
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KR20150087227A (ko
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마르크 루우벤 허트너
존 에프. 로웨
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테라다인 인코퍼레이티드
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/2733—Test interface between tester and unit under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31705—Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31707—Test strategies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2294—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by remote test
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/362—Software debugging
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for program control, e.g. control units
    • G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G06F9/44—Arrangements for executing specific programs
    • G06F9/455—Emulation; Interpretation; Software simulation, e.g. virtualisation or emulation of application or operating system execution engines

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Software Systems (AREA)
  • Microelectronics & Electronic Packaging (AREA)
KR1020157012641A 2012-11-19 2013-11-08 반도체 장치 검사 환경에서의 디버깅 KR102104915B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/680,407 US9959186B2 (en) 2012-11-19 2012-11-19 Debugging in a semiconductor device test environment
US13/680,407 2012-11-19
PCT/US2013/069215 WO2014078196A1 (en) 2012-11-19 2013-11-08 Debugging in a semiconductor device test environment

Publications (2)

Publication Number Publication Date
KR20150087227A KR20150087227A (ko) 2015-07-29
KR102104915B1 true KR102104915B1 (ko) 2020-04-27

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Application Number Title Priority Date Filing Date
KR1020157012641A KR102104915B1 (ko) 2012-11-19 2013-11-08 반도체 장치 검사 환경에서의 디버깅

Country Status (5)

Country Link
US (1) US9959186B2 (zh)
KR (1) KR102104915B1 (zh)
CN (1) CN104797948B (zh)
TW (2) TWI619955B (zh)
WO (1) WO2014078196A1 (zh)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9430349B2 (en) * 2013-01-24 2016-08-30 Xcerra Corporation Scalable test platform in a PCI express environment with direct memory access
US9459978B2 (en) * 2013-01-24 2016-10-04 Xcerra Corporation Automated test platform utilizing segmented data sequencers to provide time controlled test sequences to device under test
US9430348B2 (en) * 2013-01-24 2016-08-30 Xcerra Corporation Scalable test platform in a PCI express environment with direct memory access
US9336108B2 (en) 2013-01-24 2016-05-10 Xcerra Corporation Scalable test platform
US20140230052A1 (en) * 2013-02-11 2014-08-14 Motorola Mobility Llc System and method for testing a secured manufactured device
CN104133745A (zh) * 2013-04-30 2014-11-05 鸿富锦精密工业（深圳）有限公司 具有测试功能的电子装置及测试方法和系统
US9244126B2 (en) * 2013-11-06 2016-01-26 Teradyne, Inc. Automated test system with event detection capability
CN105446866A (zh) * 2014-08-22 2016-03-30 全智科技股份有限公司 一种跨平台测试装置
US9514032B2 (en) 2014-09-23 2016-12-06 International Business Machines Corporation Real-time usage checking of dynamically generated program output
EP3213214B1 (fr) * 2014-10-30 2021-03-03 SPHEREA Test & Services Banc et logiciel pour tester un appareillage electrique, notamment un calculateur
TWI628942B (zh) * 2015-02-05 2018-07-01 絡達科技股份有限公司 可自我檢測操作狀態之通訊模組、通訊裝置及其檢測方法
FR3033412B1 (fr) * 2015-03-06 2019-04-12 Starchip Testeur de circuits integres sur une galette de silicium et circuit integre.
US10429437B2 (en) * 2015-05-28 2019-10-01 Keysight Technologies, Inc. Automatically generated test diagram
KR20160148921A (ko) * 2015-06-17 2016-12-27 에스케이하이닉스 주식회사 반도체 장치를 위한 휴대 가능한 테스트 장치 및 이를 이용한 테스트 방법
CN106330593B (zh) * 2015-07-01 2021-03-26 中兴通讯股份有限公司 协议检测方法及装置
CN105044508B (zh) * 2015-07-10 2017-10-27 珠海格力电器股份有限公司 产品测试方法和装置及测试系统
CN106569970A (zh) * 2015-10-08 2017-04-19 中兴通讯股份有限公司 Smi接口器件的调试装置及方法
CN105445644A (zh) * 2015-11-18 2016-03-30 南昌欧菲生物识别技术有限公司 多类型芯片测试板、测试系统及测试机台
US10235272B2 (en) * 2017-03-06 2019-03-19 Xilinx, Inc. Debugging system and method
US10782348B2 (en) * 2017-03-10 2020-09-22 Keithley Instruments, Llc Automatic device detection and connection verification
TWI762538B (zh) * 2017-12-13 2022-05-01 英業達股份有限公司 電路板的電壓腳位導通檢測系統及其方法
US11295051B2 (en) * 2018-03-13 2022-04-05 Hcl Technologies Limited System and method for interactively controlling the course of a functional simulation
US10789153B2 (en) * 2018-04-03 2020-09-29 Xilinx, Inc. Debug controller circuit
US11030381B2 (en) 2019-01-16 2021-06-08 Taiwan Semiconductor Manufacturing Co., Ltd. Leakage analysis on semiconductor device
WO2020152230A1 (en) * 2019-01-22 2020-07-30 Advantest Corporation Automated text equipment using an on-chip-system test controller
CN114190101A (zh) * 2019-08-06 2022-03-15 爱德万测试公司 用于测试包括处理单元和程序和/或数据存储器的被测装置的自动化测试设备和包括测试控制器、与被测装置的一个或多个接口、共享存储器的自动化测试设备以及用于测试被测装置的方法
CN110634530B (zh) * 2019-09-10 2021-05-25 珠海博雅科技有限公司 芯片的测试系统和测试方法
CN111258826B (zh) * 2020-01-09 2023-08-15 深圳市德明利技术股份有限公司 一种存储设备的命令序列测试方法和装置以及设备
DE112020007444T5 (de) * 2020-07-21 2023-06-15 Advantest Corporation Automatische Testeinrichtung, Prozess und Computerprogramm zum Testen eines oder mehrerer zu testender Geräte, wobei unterschiedliche Testaktivitäten Teilsätze von Ressourcen des zu testenden Geräts nutzen
CN111984435A (zh) * 2020-08-20 2020-11-24 中电科仪器仪表有限公司 一种测试程序的执行与调试方法及系统
CN112630651A (zh) * 2020-11-27 2021-04-09 四川诚邦浩然测控技术有限公司 一种电机性能测控管理平台
US11544210B1 (en) 2021-07-15 2023-01-03 Beijing Tenafe Electronic Technology Co., Ltd. Collection of runtime information for debug and analysis
US11620176B2 (en) 2021-07-15 2023-04-04 Beijing Tenafe Electronic Technology Co., Ltd. Visualization system for debug or performance analysis of SOC systems
CN114646867B (zh) * 2022-05-18 2022-10-28 南京宏泰半导体科技有限公司 一种集成电路并发测试装置及方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7085980B2 (en) 2002-05-02 2006-08-01 International Business Machines Corporation Method and apparatus for determining the failing operation of a device-under-test

Family Cites Families (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4894829A (en) * 1988-04-21 1990-01-16 Honeywell Inc. Comprehensive design and maintenance environment for test program sets
US5668745A (en) * 1995-10-20 1997-09-16 Lsi Logic Corporation Method and apparatus for testing of semiconductor devices
US6134707A (en) * 1996-11-14 2000-10-17 Altera Corporation Apparatus and method for in-system programming of integrated circuits containing programmable elements
US6182258B1 (en) 1997-06-03 2001-01-30 Verisity Ltd. Method and apparatus for test generation during circuit design
US6128759A (en) * 1998-03-20 2000-10-03 Teradyne, Inc. Flexible test environment for automatic test equipment
US6681351B1 (en) * 1999-10-12 2004-01-20 Teradyne, Inc. Easy to program automatic test equipment
US6581191B1 (en) 1999-11-30 2003-06-17 Synplicity, Inc. Hardware debugging in a hardware description language
US6622272B1 (en) * 2000-03-10 2003-09-16 Teradyne, Inc. Automatic test equipment methods and apparatus for interfacing with an external device
JP4574894B2 (ja) * 2001-05-10 2010-11-04 株式会社アドバンテスト 半導体試験用プログラムデバッグ装置
US7996827B2 (en) 2001-08-16 2011-08-09 Martin Vorbach Method for the translation of programs for reconfigurable architectures
US6941504B2 (en) * 2001-11-15 2005-09-06 International Business Machines Corporation Method and apparatus for test case evaluation using a cyclic redundancy checker
US6973607B2 (en) * 2001-11-29 2005-12-06 International Business Machines Corporation Method and apparatus for testing electronic components
US20030115517A1 (en) * 2001-12-18 2003-06-19 Rutten Ivo Wilhelmus Johaooes Marie Microprocessor-based probe for integrated circuit testing
TWI328164B (en) 2002-05-29 2010-08-01 Tokyo Electron Ltd Method and apparatus for monitoring tool performance
JP4009517B2 (ja) * 2002-10-18 2007-11-14 株式会社アドバンテスト プログラム開発支援装置およびコンパイル方法
US7139949B1 (en) * 2003-01-17 2006-11-21 Unisys Corporation Test apparatus to facilitate building and testing complex computer products with contract manufacturers without proprietary information
EP1672508A4 (en) * 2003-10-07 2010-06-30 Advantest Corp TEST PROGRAM DE-GROWING DEVICE, SEMICONDUCTOR TESTING DEVICE, AND TESTING METHOD
US7107173B2 (en) * 2004-02-03 2006-09-12 Credence Systems Corporation Automatic test equipment operating architecture
US7362089B2 (en) * 2004-05-21 2008-04-22 Advantest Corporation Carrier module for adapting non-standard instrument cards to test systems
ATE427529T1 (de) * 2004-10-08 2009-04-15 Verigy Pte Ltd Singapore Merkmalorientierte testprogrammentwicklung und ausfuhrung
US7552360B2 (en) * 2005-03-21 2009-06-23 Texas Instruments Incorporated Debug and test system with format select register circuitry
US7376876B2 (en) * 2004-12-23 2008-05-20 Honeywell International Inc. Test program set generation tool
US7251763B2 (en) * 2005-03-07 2007-07-31 Motorola, Inc. Boundary scan testing system
US7343558B2 (en) * 2005-03-31 2008-03-11 Teradyne, Inc. Configurable automatic-test-equipment system
US7536597B2 (en) * 2005-04-27 2009-05-19 Texas Instruments Incorporated Apparatus and method for controlling power, clock, and reset during test and debug procedures for a plurality of processor/cores
JP4427002B2 (ja) * 2005-05-20 2010-03-03 株式会社アドバンテスト 半導体試験用プログラムデバッグ装置
WO2007000806A1 (ja) 2005-06-28 2007-01-04 Genesis Technology Inc. 半導体集積回路開発支援システム
US20070262879A1 (en) * 2006-05-12 2007-11-15 Robert Greiner I/O bus for analog sensors in an IC
US7590903B2 (en) * 2006-05-15 2009-09-15 Verigy (Singapore) Pte. Ltd. Re-configurable architecture for automated test equipment
US8065663B2 (en) * 2006-07-10 2011-11-22 Bin1 Ate, Llc System and method for performing processing in a testing system
US20080126655A1 (en) * 2006-09-06 2008-05-29 Heinz Baier Single pci card implementation of development system controller, lab instrument controller, and jtag debugger
US20090112548A1 (en) * 2007-10-30 2009-04-30 Conner George W A method for testing in a reconfigurable tester
US20090113245A1 (en) 2007-10-30 2009-04-30 Teradyne, Inc. Protocol aware digital channel apparatus
JP5022262B2 (ja) * 2008-02-12 2012-09-12 株式会社アドバンテスト デバッグ中にツールを使用可能な試験システム及び方法
WO2010054669A1 (en) 2008-11-11 2010-05-20 Verigy (Singapore) Pte.Ltd. Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipment
US8533545B2 (en) * 2009-03-04 2013-09-10 Alcatel Lucent Method and apparatus for system testing using multiple instruction types
US8195419B2 (en) 2009-03-13 2012-06-05 Teradyne, Inc. General purpose protocol engine
US9164859B2 (en) * 2009-09-25 2015-10-20 Qualcomm Incorporated Computing device for enabling concurrent testing
TWI463502B (zh) * 2010-11-17 2014-12-01 Hoy Technologies Co 內嵌式測試模組
US8639981B2 (en) * 2011-08-29 2014-01-28 Apple Inc. Flexible SoC design verification environment
US8806453B1 (en) * 2011-09-15 2014-08-12 Lockheed Martin Corporation Integrating disparate programming languages to form a new programming language
US20130227367A1 (en) * 2012-01-17 2013-08-29 Allen J. Czamara Test IP-Based A.T.E. Instrument Architecture
US9311201B2 (en) * 2012-08-22 2016-04-12 International Business Machines Corporation Real-time rule engine for adaptive testing of integrated circuits

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7085980B2 (en) 2002-05-02 2006-08-01 International Business Machines Corporation Method and apparatus for determining the failing operation of a device-under-test

Also Published As

Publication number Publication date
US9959186B2 (en) 2018-05-01
TWI619955B (zh) 2018-04-01
US20140143600A1 (en) 2014-05-22
TW201809709A (zh) 2018-03-16
TW201421053A (zh) 2014-06-01
CN104797948B (zh) 2017-08-08
KR20150087227A (ko) 2015-07-29
CN104797948A (zh) 2015-07-22
WO2014078196A1 (en) 2014-05-22

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