KR101799357B1 - Dram 서브-어레이 레벨 리프레시 - Google Patents
Dram 서브-어레이 레벨 리프레시 Download PDFInfo
- Publication number
- KR101799357B1 KR101799357B1 KR1020167002714A KR20167002714A KR101799357B1 KR 101799357 B1 KR101799357 B1 KR 101799357B1 KR 1020167002714 A KR1020167002714 A KR 1020167002714A KR 20167002714 A KR20167002714 A KR 20167002714A KR 101799357 B1 KR101799357 B1 KR 101799357B1
- Authority
- KR
- South Korea
- Prior art keywords
- sub
- dram
- refresh
- row
- array
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
- G11C11/40618—Refresh operations over multiple banks or interleaving
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/14—Handling requests for interconnection or transfer
- G06F13/16—Handling requests for interconnection or transfer for access to memory bus
- G06F13/1605—Handling requests for interconnection or transfer for access to memory bus based on arbitration
- G06F13/161—Handling requests for interconnection or transfer for access to memory bus based on arbitration with latency improvement
- G06F13/1636—Handling requests for interconnection or transfer for access to memory bus based on arbitration with latency improvement using refresh
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
- G11C11/40611—External triggering or timing of internal or partially internal refresh operations, e.g. auto-refresh or CAS-before-RAS triggered refresh
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Dram (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201361843110P | 2013-07-05 | 2013-07-05 | |
| US61/843,110 | 2013-07-05 | ||
| US14/088,098 | 2013-11-22 | ||
| US14/088,098 US8982654B2 (en) | 2013-07-05 | 2013-11-22 | DRAM sub-array level refresh |
| PCT/US2014/039385 WO2015002704A1 (en) | 2013-07-05 | 2014-05-23 | Dram sub-array level refresh |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20160030212A KR20160030212A (ko) | 2016-03-16 |
| KR101799357B1 true KR101799357B1 (ko) | 2017-11-20 |
Family
ID=52132725
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020167002714A Expired - Fee Related KR101799357B1 (ko) | 2013-07-05 | 2014-05-23 | Dram 서브-어레이 레벨 리프레시 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8982654B2 (enExample) |
| EP (1) | EP3017452B1 (enExample) |
| JP (1) | JP6227774B2 (enExample) |
| KR (1) | KR101799357B1 (enExample) |
| CN (1) | CN105378846B (enExample) |
| WO (1) | WO2015002704A1 (enExample) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9524771B2 (en) | 2013-07-12 | 2016-12-20 | Qualcomm Incorporated | DRAM sub-array level autonomic refresh memory controller optimization |
| US9721640B2 (en) * | 2015-12-09 | 2017-08-01 | Intel Corporation | Performance of additional refresh operations during self-refresh mode |
| US9659626B1 (en) * | 2015-12-26 | 2017-05-23 | Intel Corporation | Memory refresh operation with page open |
| US9514800B1 (en) * | 2016-03-26 | 2016-12-06 | Bo Liu | DRAM and self-refresh method |
| US9824742B1 (en) | 2016-04-28 | 2017-11-21 | Qualcomm Incorporated | DRAM access in self-refresh state |
| CN110556139B (zh) * | 2018-05-31 | 2021-06-18 | 联发科技股份有限公司 | 用以控制存储器的电路及相关的方法 |
| US10535393B1 (en) * | 2018-07-21 | 2020-01-14 | Advanced Micro Devices, Inc. | Configuring dynamic random access memory refreshes for systems having multiple ranks of memory |
| US10991414B2 (en) * | 2019-04-12 | 2021-04-27 | Western Digital Technologies, Inc. | Granular refresh rate control for memory devices based on bit position |
| US10991413B2 (en) * | 2019-07-03 | 2021-04-27 | Micron Technology, Inc. | Memory with programmable die refresh stagger |
| US20210064368A1 (en) * | 2019-08-28 | 2021-03-04 | Micron Technology, Inc. | Command tracking |
| CN111158585B (zh) * | 2019-11-27 | 2023-08-01 | 核芯互联科技(青岛)有限公司 | 一种内存控制器刷新优化方法、装置、设备和存储介质 |
| KR20240067516A (ko) * | 2022-11-09 | 2024-05-17 | 삼성전자주식회사 | 메모리 장치 및 그의 동작 방법 |
| US12406716B2 (en) | 2023-12-05 | 2025-09-02 | Nxp Usa, Inc. | Refresh operations in embedded dynamic random access memories (DRAMs) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110141836A1 (en) | 2009-12-16 | 2011-06-16 | Innovative Silicon Isi Sa | Techniques for reducing impact of array disturbs in a semiconductor memory device |
| US20110225355A1 (en) | 2010-03-12 | 2011-09-15 | Elpida Memory Inc. | Semiconductor device, refresh control method thereof and computer system |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4344157A (en) * | 1978-06-26 | 1982-08-10 | Texas Instruments Incorporated | On-chip refresh address generator for dynamic memory |
| US5313428A (en) * | 1987-11-12 | 1994-05-17 | Sharp Kabushiki Kaisha | Field memory self-refreshing device utilizing a refresh clock signal selected from two separate clock signals |
| US5307320A (en) | 1992-09-23 | 1994-04-26 | Intel Corporation | High integration DRAM controller |
| KR950014089B1 (ko) * | 1993-11-08 | 1995-11-21 | 현대전자산업주식회사 | 동기식 디램의 히든 셀프 리프레쉬 방법 및 장치 |
| JPH09306165A (ja) * | 1996-05-16 | 1997-11-28 | Hitachi Commun Syst Inc | Dramリフレッシュ制御回路 |
| US5818777A (en) * | 1997-03-07 | 1998-10-06 | Micron Technology, Inc. | Circuit for implementing and method for initiating a self-refresh mode |
| US6697909B1 (en) | 2000-09-12 | 2004-02-24 | International Business Machines Corporation | Method and apparatus for performing data access and refresh operations in different sub-arrays of a DRAM cache memory |
| JP2002216473A (ja) | 2001-01-16 | 2002-08-02 | Matsushita Electric Ind Co Ltd | 半導体メモリ装置 |
| US6560155B1 (en) * | 2001-10-24 | 2003-05-06 | Micron Technology, Inc. | System and method for power saving memory refresh for dynamic random access memory devices after an extended interval |
| US6721224B2 (en) * | 2002-08-26 | 2004-04-13 | Mosel Vitelic, Inc. | Memory refresh methods and circuits |
| US7088632B2 (en) | 2004-05-26 | 2006-08-08 | Freescale Semiconductor, Inc. | Automatic hidden refresh in a dram and method therefor |
| JP2006107245A (ja) * | 2004-10-07 | 2006-04-20 | Canon Inc | メモリコントローラ |
| US7313047B2 (en) | 2006-02-23 | 2007-12-25 | Hynix Semiconductor Inc. | Dynamic semiconductor memory with improved refresh mechanism |
| JP4117323B2 (ja) * | 2006-04-18 | 2008-07-16 | エルピーダメモリ株式会社 | 半導体記憶装置 |
| JP5428687B2 (ja) * | 2009-09-14 | 2014-02-26 | 株式会社リコー | メモリ制御装置 |
| KR101861647B1 (ko) * | 2011-05-24 | 2018-05-28 | 삼성전자주식회사 | 메모리 시스템 및 그 리프레시 제어 방법 |
-
2013
- 2013-11-22 US US14/088,098 patent/US8982654B2/en active Active
-
2014
- 2014-05-23 CN CN201480038159.0A patent/CN105378846B/zh active Active
- 2014-05-23 EP EP14733440.3A patent/EP3017452B1/en active Active
- 2014-05-23 KR KR1020167002714A patent/KR101799357B1/ko not_active Expired - Fee Related
- 2014-05-23 WO PCT/US2014/039385 patent/WO2015002704A1/en not_active Ceased
- 2014-05-23 JP JP2016523745A patent/JP6227774B2/ja not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110141836A1 (en) | 2009-12-16 | 2011-06-16 | Innovative Silicon Isi Sa | Techniques for reducing impact of array disturbs in a semiconductor memory device |
| US20110225355A1 (en) | 2010-03-12 | 2011-09-15 | Elpida Memory Inc. | Semiconductor device, refresh control method thereof and computer system |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3017452A1 (en) | 2016-05-11 |
| US8982654B2 (en) | 2015-03-17 |
| US20150009769A1 (en) | 2015-01-08 |
| EP3017452B1 (en) | 2017-08-16 |
| WO2015002704A1 (en) | 2015-01-08 |
| KR20160030212A (ko) | 2016-03-16 |
| JP6227774B2 (ja) | 2017-11-08 |
| CN105378846A (zh) | 2016-03-02 |
| JP2016526749A (ja) | 2016-09-05 |
| CN105378846B (zh) | 2018-08-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR101799357B1 (ko) | Dram 서브-어레이 레벨 리프레시 | |
| US9524771B2 (en) | DRAM sub-array level autonomic refresh memory controller optimization | |
| KR102452241B1 (ko) | 수정된 명령과 관련 방법 및 시스템을 갖는 반도체 디바이스 | |
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| US11416333B2 (en) | Semiconductor device with power-saving mode and associated methods and systems | |
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| KR100429348B1 (ko) | 용이하게 특성을 평가할 수 있는 반도체 기억 장치 | |
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St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
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| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
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| A201 | Request for examination | ||
| A302 | Request for accelerated examination | ||
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St.27 status event code: A-2-3-E10-E13-lim-X000 |
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| P13-X000 | Application amended |
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| PA0201 | Request for examination |
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