KR101749782B1 - 센서간 균일성 보정을 사용한 광학적 웨브-기반 결함 검출 - Google Patents

센서간 균일성 보정을 사용한 광학적 웨브-기반 결함 검출 Download PDF

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KR101749782B1
KR101749782B1 KR1020127020459A KR20127020459A KR101749782B1 KR 101749782 B1 KR101749782 B1 KR 101749782B1 KR 1020127020459 A KR1020127020459 A KR 1020127020459A KR 20127020459 A KR20127020459 A KR 20127020459A KR 101749782 B1 KR101749782 B1 KR 101749782B1
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normalization
web
pixel
delete delete
defect
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KR20120115356A (ko
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스티븐 피 플로에더
맷튜 브이 룬드퀴스트
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쓰리엠 이노베이티브 프로퍼티즈 컴파니
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
KR1020127020459A 2010-01-08 2011-01-03 센서간 균일성 보정을 사용한 광학적 웨브-기반 결함 검출 Expired - Fee Related KR101749782B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/684,170 2010-01-08
US12/684,170 US8270701B2 (en) 2010-01-08 2010-01-08 Optical web-based defect detection using intrasensor uniformity correction
PCT/US2011/020028 WO2011084914A2 (en) 2010-01-08 2011-01-03 Optical web-based defect detection using intrasensor uniformity correction

Publications (2)

Publication Number Publication Date
KR20120115356A KR20120115356A (ko) 2012-10-17
KR101749782B1 true KR101749782B1 (ko) 2017-06-21

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KR1020127020459A Expired - Fee Related KR101749782B1 (ko) 2010-01-08 2011-01-03 센서간 균일성 보정을 사용한 광학적 웨브-기반 결함 검출

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US (1) US8270701B2 (enExample)
JP (1) JP5702404B2 (enExample)
KR (1) KR101749782B1 (enExample)
CN (1) CN102971619B (enExample)
SG (1) SG182314A1 (enExample)
TW (1) TW201135220A (enExample)
WO (1) WO2011084914A2 (enExample)

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CN104298190A (zh) * 2013-07-09 2015-01-21 Abb技术股份公司 用于现场仪器的维护系统
CN108475294B (zh) 2016-01-15 2023-04-04 康宁股份有限公司 表征多孔陶瓷制品的等静压强度的非接触式方法
CN110998655B (zh) * 2017-07-25 2023-10-20 富士胶片株式会社 损伤图创建方法、损伤图创建装置、损伤图创建系统及记录介质
DE102019109791A1 (de) * 2019-04-12 2020-10-15 Stephan Krebs Vorrichtung zur Druckbildkontrolle für eine Druck- oder Konfektioniermaschine und Verfahren zur Validierung von Inspektionsalgorithmen einer Vorrichtung zur Druckbildkontrolle
US11151710B1 (en) * 2020-05-04 2021-10-19 Applied Materials Israel Ltd. Automatic selection of algorithmic modules for examination of a specimen
CN117745603B (zh) * 2024-02-20 2024-06-14 湖南科洛德科技有限公司 基于线阵扫描设备的产品图像校正方法及设备和存储介质
CN119180783B (zh) * 2024-08-26 2025-11-21 西北工业大学深圳研究院 适用于卷绕系统的石墨卷材形态学异常检测方法
CN119444671B (zh) * 2024-10-11 2025-07-22 华南师范大学 基于自适应归一化改进技术的红外锁相无损检测方法

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US6757442B1 (en) 2000-11-22 2004-06-29 Ge Medical Systems Global Technology Company, Llc Image enhancement method with simultaneous noise reduction, non-uniformity equalization, and contrast enhancement

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US6687396B1 (en) 1998-07-29 2004-02-03 Pentax Corporation Optical member inspection apparatus, image-processing apparatus, image-processing method, and computer readable medium
US6757442B1 (en) 2000-11-22 2004-06-29 Ge Medical Systems Global Technology Company, Llc Image enhancement method with simultaneous noise reduction, non-uniformity equalization, and contrast enhancement

Also Published As

Publication number Publication date
SG182314A1 (en) 2012-08-30
TW201135220A (en) 2011-10-16
CN102971619B (zh) 2015-08-12
US20110170762A1 (en) 2011-07-14
JP2013519069A (ja) 2013-05-23
KR20120115356A (ko) 2012-10-17
JP5702404B2 (ja) 2015-04-15
CN102971619A (zh) 2013-03-13
US8270701B2 (en) 2012-09-18
WO2011084914A3 (en) 2013-02-21
WO2011084914A2 (en) 2011-07-14

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