CN102971619B - 使用传感器内均匀度校正进行基于幅材的光学缺陷检测的方法和系统 - Google Patents
使用传感器内均匀度校正进行基于幅材的光学缺陷检测的方法和系统 Download PDFInfo
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- CN102971619B CN102971619B CN201180012632.4A CN201180012632A CN102971619B CN 102971619 B CN102971619 B CN 102971619B CN 201180012632 A CN201180012632 A CN 201180012632A CN 102971619 B CN102971619 B CN 102971619B
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Classifications
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0006—Industrial image inspection using a design-rule based approach
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10016—Video; Image sequence
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30124—Fabrics; Textile; Paper
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- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Quality & Reliability (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Textile Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/684,170 US8270701B2 (en) | 2010-01-08 | 2010-01-08 | Optical web-based defect detection using intrasensor uniformity correction |
| US12/684,170 | 2010-01-08 | ||
| PCT/US2011/020028 WO2011084914A2 (en) | 2010-01-08 | 2011-01-03 | Optical web-based defect detection using intrasensor uniformity correction |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102971619A CN102971619A (zh) | 2013-03-13 |
| CN102971619B true CN102971619B (zh) | 2015-08-12 |
Family
ID=44258562
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201180012632.4A Active CN102971619B (zh) | 2010-01-08 | 2011-01-03 | 使用传感器内均匀度校正进行基于幅材的光学缺陷检测的方法和系统 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8270701B2 (enExample) |
| JP (1) | JP5702404B2 (enExample) |
| KR (1) | KR101749782B1 (enExample) |
| CN (1) | CN102971619B (enExample) |
| SG (1) | SG182314A1 (enExample) |
| TW (1) | TW201135220A (enExample) |
| WO (1) | WO2011084914A2 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8553228B2 (en) * | 2011-09-30 | 2013-10-08 | 3M Innovative Properties Company | Web inspection calibration system and related methods |
| US8923571B2 (en) | 2012-07-16 | 2014-12-30 | Hewlett-Packard Development Company, L.P. | Automated camera flat fielding and alignment |
| CN104298190A (zh) * | 2013-07-09 | 2015-01-21 | Abb技术股份公司 | 用于现场仪器的维护系统 |
| WO2017123919A1 (en) | 2016-01-15 | 2017-07-20 | Corning Incorporated | Non-contact method of characterizing isostatic strength of cellular ceramic articles |
| JP6807459B2 (ja) * | 2017-07-25 | 2021-01-06 | 富士フイルム株式会社 | 損傷図作成方法、損傷図作成装置、損傷図作成システム、及び記録媒体 |
| DE102019109791A1 (de) * | 2019-04-12 | 2020-10-15 | Stephan Krebs | Vorrichtung zur Druckbildkontrolle für eine Druck- oder Konfektioniermaschine und Verfahren zur Validierung von Inspektionsalgorithmen einer Vorrichtung zur Druckbildkontrolle |
| US11151710B1 (en) * | 2020-05-04 | 2021-10-19 | Applied Materials Israel Ltd. | Automatic selection of algorithmic modules for examination of a specimen |
| CN117745603B (zh) * | 2024-02-20 | 2024-06-14 | 湖南科洛德科技有限公司 | 基于线阵扫描设备的产品图像校正方法及设备和存储介质 |
| CN119180783B (zh) * | 2024-08-26 | 2025-11-21 | 西北工业大学深圳研究院 | 适用于卷绕系统的石墨卷材形态学异常检测方法 |
| CN119444671B (zh) * | 2024-10-11 | 2025-07-22 | 华南师范大学 | 基于自适应归一化改进技术的红外锁相无损检测方法 |
Citations (10)
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| CN1147634A (zh) * | 1995-03-15 | 1997-04-16 | 圣戈班玻璃制造公司 | 对反射表面涂层上缺陷的识别和估算方法 |
| US6757442B1 (en) * | 2000-11-22 | 2004-06-29 | Ge Medical Systems Global Technology Company, Llc | Image enhancement method with simultaneous noise reduction, non-uniformity equalization, and contrast enhancement |
| JP2004251781A (ja) * | 2003-02-20 | 2004-09-09 | Tani Electronics Corp | 画像認識による不良検査方法 |
| CN1633592A (zh) * | 2001-02-12 | 2005-06-29 | 3M创新有限公司 | 卷筒材料的检查方法和装置 |
| JP2006177852A (ja) * | 2004-12-24 | 2006-07-06 | Toshiba Corp | 表面検査装置、およびその方法 |
| JP2006275802A (ja) * | 2005-03-29 | 2006-10-12 | Nippon Steel Corp | 欠陥検査方法及び装置 |
| JP2008164400A (ja) * | 2006-12-27 | 2008-07-17 | Daio Paper Corp | シートロール形状不良判別装置及び判別方法 |
| JP2008164461A (ja) * | 2006-12-28 | 2008-07-17 | Kochi Univ Of Technology | 薄板状部品の検査方法と検査装置 |
| JP2009204388A (ja) * | 2008-02-27 | 2009-09-10 | Toppan Printing Co Ltd | 欠陥検査方法 |
| CN101600957A (zh) * | 2007-01-16 | 2009-12-09 | 奥林巴斯株式会社 | 缺陷检测装置及缺陷检测方法 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US4602291A (en) | 1984-05-09 | 1986-07-22 | Xerox Corporation | Pixel non-uniformity correction system |
| JPS647174A (en) | 1987-06-29 | 1989-01-11 | Mitsubishi Electric Corp | Background correction method |
| US4899054A (en) | 1988-01-19 | 1990-02-06 | General Electric Company | Gamma camera with image uniformity by energy correction offsets |
| DE69119589T2 (de) | 1991-09-26 | 1996-12-19 | Dornier Medizintechnik | Automatische Optimalisierung der gleichmässigen Intensität eines Bildes für ein Ultraschallabbildungsystem |
| JPH09178666A (ja) * | 1995-10-24 | 1997-07-11 | Nkk Corp | 表面検査装置 |
| JP3809226B2 (ja) | 1996-06-06 | 2006-08-16 | 富士写真フイルム株式会社 | リニアイメージセンサの出力画像信号の補正方法 |
| JP3466855B2 (ja) | 1997-02-07 | 2003-11-17 | 株式会社リコー | 画像読取装置 |
| JP3397101B2 (ja) * | 1997-10-29 | 2003-04-14 | 株式会社日立製作所 | 欠陥検査方法および装置 |
| JP4024381B2 (ja) * | 1998-04-21 | 2007-12-19 | 株式会社ルネサステクノロジ | 欠陥検査方法および装置 |
| US6687396B1 (en) * | 1998-07-29 | 2004-02-03 | Pentax Corporation | Optical member inspection apparatus, image-processing apparatus, image-processing method, and computer readable medium |
| TW380180B (en) | 1998-11-13 | 2000-01-21 | China Textile Inst | On-line uniformity inspection method and apparatus for web applying digital image processing |
| US20050033185A1 (en) | 2003-08-06 | 2005-02-10 | Cytometrics, Llc | Method for correcting vessel and background light intensities used in beer's law for light scattering in tissue |
| JP4731698B2 (ja) | 2000-04-06 | 2011-07-27 | キヤノン株式会社 | 画像処理装置、撮影装置、画像処理システム、画像処理方法、及び記憶媒体 |
| US6970577B2 (en) | 2000-12-19 | 2005-11-29 | Lockheed Martin Corporation | Fast fourier transform correlation tracking algorithm with background correction |
| JP2003284707A (ja) | 2002-03-27 | 2003-10-07 | Canon Inc | 撮影装置、ゲイン補正方法、記録媒体及びプログラム |
| JP4468083B2 (ja) | 2003-08-26 | 2010-05-26 | キヤノン株式会社 | 放射線撮影装置、放射線撮影方法 |
| DE10340166B4 (de) | 2003-09-01 | 2016-12-08 | Robert Bosch Gmbh | Verfahren zur Erweiterung des Dynamik-Bereichs eines Halbleiter-Bildsensors |
| US7335183B2 (en) | 2003-09-15 | 2008-02-26 | Aligned Innovation, Inc. | Nursing aid system |
| US7027934B2 (en) | 2003-09-24 | 2006-04-11 | 3M Innovative Properties Company | Apparatus and method for automated web inspection |
| EP1704589A4 (en) | 2003-12-31 | 2008-05-28 | 3M Innovative Properties Co | MAXIMIZING RETURN OF ARTICLES IN SAIL |
| KR101203325B1 (ko) | 2003-12-31 | 2012-11-20 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | 시트-기반 물품에 대한 재고품 제어 |
| US7259857B2 (en) | 2004-01-14 | 2007-08-21 | Xerox Corporation | Methods for automated uniformity assessment and modification of image non-uniformities |
| JP2009300426A (ja) * | 2008-05-16 | 2009-12-24 | Nuflare Technology Inc | レチクル欠陥検査装置およびレチクル欠陥検査方法 |
-
2010
- 2010-01-08 US US12/684,170 patent/US8270701B2/en active Active
-
2011
- 2011-01-03 WO PCT/US2011/020028 patent/WO2011084914A2/en not_active Ceased
- 2011-01-03 SG SG2012048914A patent/SG182314A1/en unknown
- 2011-01-03 KR KR1020127020459A patent/KR101749782B1/ko not_active Expired - Fee Related
- 2011-01-03 CN CN201180012632.4A patent/CN102971619B/zh active Active
- 2011-01-03 JP JP2012548062A patent/JP5702404B2/ja active Active
- 2011-01-07 TW TW100100704A patent/TW201135220A/zh unknown
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1147634A (zh) * | 1995-03-15 | 1997-04-16 | 圣戈班玻璃制造公司 | 对反射表面涂层上缺陷的识别和估算方法 |
| US6757442B1 (en) * | 2000-11-22 | 2004-06-29 | Ge Medical Systems Global Technology Company, Llc | Image enhancement method with simultaneous noise reduction, non-uniformity equalization, and contrast enhancement |
| CN1633592A (zh) * | 2001-02-12 | 2005-06-29 | 3M创新有限公司 | 卷筒材料的检查方法和装置 |
| JP2004251781A (ja) * | 2003-02-20 | 2004-09-09 | Tani Electronics Corp | 画像認識による不良検査方法 |
| JP2006177852A (ja) * | 2004-12-24 | 2006-07-06 | Toshiba Corp | 表面検査装置、およびその方法 |
| JP2006275802A (ja) * | 2005-03-29 | 2006-10-12 | Nippon Steel Corp | 欠陥検査方法及び装置 |
| JP2008164400A (ja) * | 2006-12-27 | 2008-07-17 | Daio Paper Corp | シートロール形状不良判別装置及び判別方法 |
| JP2008164461A (ja) * | 2006-12-28 | 2008-07-17 | Kochi Univ Of Technology | 薄板状部品の検査方法と検査装置 |
| CN101600957A (zh) * | 2007-01-16 | 2009-12-09 | 奥林巴斯株式会社 | 缺陷检测装置及缺陷检测方法 |
| JP2009204388A (ja) * | 2008-02-27 | 2009-09-10 | Toppan Printing Co Ltd | 欠陥検査方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2013519069A (ja) | 2013-05-23 |
| WO2011084914A3 (en) | 2013-02-21 |
| US8270701B2 (en) | 2012-09-18 |
| JP5702404B2 (ja) | 2015-04-15 |
| SG182314A1 (en) | 2012-08-30 |
| KR101749782B1 (ko) | 2017-06-21 |
| KR20120115356A (ko) | 2012-10-17 |
| US20110170762A1 (en) | 2011-07-14 |
| WO2011084914A2 (en) | 2011-07-14 |
| CN102971619A (zh) | 2013-03-13 |
| TW201135220A (en) | 2011-10-16 |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |