KR101726699B1 - 증폭기 결함 보호 장치 및 방법 - Google Patents

증폭기 결함 보호 장치 및 방법 Download PDF

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Publication number
KR101726699B1
KR101726699B1 KR1020157002780A KR20157002780A KR101726699B1 KR 101726699 B1 KR101726699 B1 KR 101726699B1 KR 1020157002780 A KR1020157002780 A KR 1020157002780A KR 20157002780 A KR20157002780 A KR 20157002780A KR 101726699 B1 KR101726699 B1 KR 101726699B1
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South Korea
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transistor
control circuit
voltage
signal pin
transistors
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Korean (ko)
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KR20150034752A (ko
Inventor
개빈 코즈그레이브
하비에르 알레한드로 살세도
위홍 황
데이비드 제이. 클라크
민셩 리
Original Assignee
아나로그 디바이시즈 인코포레이티드
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/52—Circuit arrangements for protecting such amplifiers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03G—CONTROL OF AMPLIFICATION
    • H03G1/00—Details of arrangements for controlling amplification
    • H03G1/0005—Circuits characterised by the type of controlling devices operated by a controlling current or voltage signal
    • H03G1/0088—Circuits characterised by the type of controlling devices operated by a controlling current or voltage signal using discontinuously variable devices, e.g. switch-operated
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03G—CONTROL OF AMPLIFICATION
    • H03G11/00—Limiting amplitude; Limiting rate of change of amplitude
    • H03G11/08—Limiting rate of change of amplitude
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/02—Arrangements in which the value to be measured is automatically compared with a reference value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H3/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
    • H02H3/20—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection responsive to excess voltage
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H3/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
    • H02H3/24—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection responsive to undervoltage or no-voltage
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/426—Indexing scheme relating to amplifiers the amplifier comprising circuitry for protection against overload
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/444—Diode used as protection means in an amplifier, e.g. as a limiter or as a switch

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Amplifiers (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Protection Of Static Devices (AREA)
KR1020157002780A 2012-08-08 2013-07-30 증폭기 결함 보호 장치 및 방법 Active KR101726699B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/570,101 2012-08-08
US13/570,101 US9088256B2 (en) 2012-08-08 2012-08-08 Apparatus and methods for amplifier fault protection
PCT/US2013/052711 WO2014025574A1 (en) 2012-08-08 2013-07-30 Apparatus and methods for amplifier fault protection

Publications (2)

Publication Number Publication Date
KR20150034752A KR20150034752A (ko) 2015-04-03
KR101726699B1 true KR101726699B1 (ko) 2017-04-13

Family

ID=49999312

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020157002780A Active KR101726699B1 (ko) 2012-08-08 2013-07-30 증폭기 결함 보호 장치 및 방법

Country Status (5)

Country Link
US (1) US9088256B2 (enExample)
JP (1) JP5917775B2 (enExample)
KR (1) KR101726699B1 (enExample)
DE (1) DE102013108302B4 (enExample)
WO (1) WO2014025574A1 (enExample)

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US10734806B2 (en) 2016-07-21 2020-08-04 Analog Devices, Inc. High voltage clamps with transient activation and activation release control
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DE102017208171B3 (de) 2017-05-15 2018-10-11 Pepperl + Fuchs Gmbh Verfahren zur Überwachung eines Betriebs einer binären Schnittstelle und entsprechende binäre Schnittstelle
US10608431B2 (en) 2017-10-26 2020-03-31 Analog Devices, Inc. Silicon controlled rectifier dynamic triggering and shutdown via control signal amplification
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DE102018126913A1 (de) 2018-10-29 2020-04-30 Knorr-Bremse Systeme für Nutzfahrzeuge GmbH Überspannungsschutzschaltung für ein Steuergerät für ein Fahrzeug, Steuergerät für ein Fahrzeug und Verfahren zum Testen einer Überspannungsschutzschaltung für ein Steuergerät für ein Fahrzeug
US11387648B2 (en) 2019-01-10 2022-07-12 Analog Devices International Unlimited Company Electrical overstress protection with low leakage current for high voltage tolerant high speed interfaces
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US11469717B2 (en) 2019-05-03 2022-10-11 Analog Devices International Unlimited Company Microwave amplifiers tolerant to electrical overstress
CN119855223A (zh) 2019-09-09 2025-04-18 亚德诺半导体国际无限责任公司 配置用于栅极电介质监控的半导体器件
US12032014B2 (en) 2019-09-09 2024-07-09 Analog Devices International Unlimited Company Semiconductor device configured for gate dielectric monitoring
US11552190B2 (en) 2019-12-12 2023-01-10 Analog Devices International Unlimited Company High voltage double-diffused metal oxide semiconductor transistor with isolated parasitic bipolar junction transistor region
US11595036B2 (en) 2020-04-30 2023-02-28 Analog Devices, Inc. FinFET thyristors for protecting high-speed communication interfaces
US11499995B2 (en) 2020-10-26 2022-11-15 Analog Devices, Inc. Leakage compensation technique for current sensor
US12174773B2 (en) * 2021-01-28 2024-12-24 Realtek Semiconductor Corp. Transmission control architecture between sensing device and host device
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Also Published As

Publication number Publication date
DE102013108302A1 (de) 2014-02-13
WO2014025574A1 (en) 2014-02-13
JP5917775B2 (ja) 2016-05-18
KR20150034752A (ko) 2015-04-03
US9088256B2 (en) 2015-07-21
DE102013108302B4 (de) 2016-09-22
US20140043715A1 (en) 2014-02-13
JP2015532034A (ja) 2015-11-05

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