KR101676120B1 - 오프셋 인쇄용 클리쉐 및 이의 제조방법 - Google Patents

오프셋 인쇄용 클리쉐 및 이의 제조방법 Download PDF

Info

Publication number
KR101676120B1
KR101676120B1 KR1020140169920A KR20140169920A KR101676120B1 KR 101676120 B1 KR101676120 B1 KR 101676120B1 KR 1020140169920 A KR1020140169920 A KR 1020140169920A KR 20140169920 A KR20140169920 A KR 20140169920A KR 101676120 B1 KR101676120 B1 KR 101676120B1
Authority
KR
South Korea
Prior art keywords
fine pattern
line
pattern line
substrate
cliche
Prior art date
Application number
KR1020140169920A
Other languages
English (en)
Korean (ko)
Other versions
KR20160065656A (ko
Inventor
성지현
김사라
이동현
이승헌
황지영
Original Assignee
주식회사 엘지화학
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 엘지화학 filed Critical 주식회사 엘지화학
Priority to KR1020140169920A priority Critical patent/KR101676120B1/ko
Priority to CN201510674415.1A priority patent/CN105644133B/zh
Publication of KR20160065656A publication Critical patent/KR20160065656A/ko
Application granted granted Critical
Publication of KR101676120B1 publication Critical patent/KR101676120B1/ko

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
    • H01L21/0273Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
    • H01L21/0274Photolithographic processes

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Printing Methods (AREA)
  • Printing Plates And Materials Therefor (AREA)
  • Manufacture Or Reproduction Of Printing Formes (AREA)
KR1020140169920A 2014-12-01 2014-12-01 오프셋 인쇄용 클리쉐 및 이의 제조방법 KR101676120B1 (ko)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR1020140169920A KR101676120B1 (ko) 2014-12-01 2014-12-01 오프셋 인쇄용 클리쉐 및 이의 제조방법
CN201510674415.1A CN105644133B (zh) 2014-12-01 2015-10-16 用于胶印的移印版及其制备方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020140169920A KR101676120B1 (ko) 2014-12-01 2014-12-01 오프셋 인쇄용 클리쉐 및 이의 제조방법

Publications (2)

Publication Number Publication Date
KR20160065656A KR20160065656A (ko) 2016-06-09
KR101676120B1 true KR101676120B1 (ko) 2016-11-14

Family

ID=56138921

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020140169920A KR101676120B1 (ko) 2014-12-01 2014-12-01 오프셋 인쇄용 클리쉐 및 이의 제조방법

Country Status (2)

Country Link
KR (1) KR101676120B1 (zh)
CN (1) CN105644133B (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102154216B1 (ko) * 2017-09-18 2020-09-09 주식회사 아모그린텍 터치 스크린 패널용 기판, 이를 포함하는 터치 스크린 패널 및 이의 제조 방법
TWI781884B (zh) * 2022-02-10 2022-10-21 南韓商皮埃斯產業有限公司 顯示板側面終端印刷系統

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101226914B1 (ko) 2012-03-13 2013-01-29 이동열 미세패턴 형성방법 및 이를 이용하여 제조된 클리쉐

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001264962A (ja) * 2000-03-17 2001-09-28 Dainippon Printing Co Ltd オフセット印刷版
US6413286B1 (en) * 2000-05-03 2002-07-02 Saint-Gobain Abrasives Technology Company Production tool process
KR101335910B1 (ko) * 2005-09-16 2013-12-02 미쓰비시 마테리알 가부시키가이샤 인쇄용 잉크 및 그 잉크를 사용한 도막의 제조 방법
JP2008142956A (ja) * 2006-12-07 2008-06-26 Nec Lcd Technologies Ltd 印刷版及びその製造方法並びに液晶表示装置
KR100988437B1 (ko) 2007-09-21 2010-10-18 주식회사 엘지화학 네가티브 포토레지스트를 이용한 유리 또는 금속 식각방법 및 이를 이용한 클리쉐의 제조방법
JP6322139B2 (ja) * 2011-09-02 2018-05-09 エルジー・ケム・リミテッド クリシェおよびその製造方法
JP5433668B2 (ja) * 2011-11-28 2014-03-05 富士フイルム株式会社 レーザー彫刻用樹脂組成物、レーザー彫刻用フレキソ印刷版原版及びその製造方法、並びに、フレキソ印刷版及びその製版方法
US9764541B2 (en) * 2012-05-31 2017-09-19 Lg Chem, Ltd. Cliché and printing apparatus comprising same
WO2014010888A1 (ko) * 2012-07-11 2014-01-16 주식회사 엘지화학 리버스 오프셋 인쇄용 인쇄판 및 그의 제조방법

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101226914B1 (ko) 2012-03-13 2013-01-29 이동열 미세패턴 형성방법 및 이를 이용하여 제조된 클리쉐

Also Published As

Publication number Publication date
KR20160065656A (ko) 2016-06-09
CN105644133A (zh) 2016-06-08
CN105644133B (zh) 2018-07-13

Similar Documents

Publication Publication Date Title
US8728331B2 (en) Methods of fabricating imprint mold and of forming pattern using the imprint mold
JP2011066238A (ja) パターン形成用テンプレートの作製方法
EP3196924B1 (en) Method for manufacturing microscopic structural body
TW201539541A (zh) 電漿蝕刻方法及圖案化基板的製造方法
US9040149B2 (en) Printing plate and method for manufacturing same
KR101676120B1 (ko) 오프셋 인쇄용 클리쉐 및 이의 제조방법
KR101385843B1 (ko) 오프셋 인쇄용 클리쉐 및 이의 제조방법
JP2012199410A (ja) パターン形成方法
CN104054157B (zh) 用于反向胶印的印刷版及其制备方法
KR101367784B1 (ko) 쿠션성을 가지는 그라비아판 및 그 제조방법
JP2013222791A (ja) ナノインプリント方法およびナノインプリント用基板並びにそれらを用いたパターン化基板の製造方法
JP2009145800A5 (zh)
CN105911628A (zh) 一种线栅偏振器结构、显示基板母板及制作方法
JP4944514B2 (ja) 印刷版の製造方法
KR102092993B1 (ko) 포토마스크, 상기 포토마스크를 포함하는 적층체 및 상기 포토마스크의 제조방법
US11966163B2 (en) Photomask for imprinting and manufacturing method therefor
JP2013184457A (ja) 反転印刷方法および反転印刷装置
CN107107603B (zh) 用于胶版印刷的铅版的制造方法以及用于胶版印刷的铅版
KR101235168B1 (ko) 인쇄판 및 그 제조방법
KR102154561B1 (ko) 임프린트용 몰드 및 임프린트 방법
CN108550527A (zh) 一种图形化方法
CN106681103A (zh) 滚轮及其制造方法、压印设备
KR100505246B1 (ko) 플라즈마 디스플레이 패널의 격벽 형성 방법 및 격벽 형성 장치
KR101234150B1 (ko) 대면적 미세 패턴 형성용 인쇄판 및 그의 제조 방법
KR20090065899A (ko) 미세 회로가 형성된 필름 기판 및 그 제조방법

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant