KR101675625B1 - 플라즈마 처리 부하에 대한 시스템 레벨 전원 공급 - Google Patents
플라즈마 처리 부하에 대한 시스템 레벨 전원 공급 Download PDFInfo
- Publication number
- KR101675625B1 KR101675625B1 KR1020137019332A KR20137019332A KR101675625B1 KR 101675625 B1 KR101675625 B1 KR 101675625B1 KR 1020137019332 A KR1020137019332 A KR 1020137019332A KR 20137019332 A KR20137019332 A KR 20137019332A KR 101675625 B1 KR101675625 B1 KR 101675625B1
- Authority
- KR
- South Korea
- Prior art keywords
- generator
- matching network
- sensor
- power
- local controller
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
- H01J37/32183—Matching circuits
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/26—Plasma torches
- H05H1/32—Plasma torches using an arc
- H05H1/34—Details, e.g. electrodes, nozzles
- H05H1/40—Details, e.g. electrodes, nozzles using applied magnetic fields, e.g. for focusing or rotating the arc
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
- H03H7/38—Impedance-matching networks
- H03H7/40—Automatic matching of load impedance to source impedance
-
- H10P50/242—
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H2242/00—Auxiliary systems
- H05H2242/20—Power circuits
- H05H2242/26—Matching networks
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Plasma Technology (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161429472P | 2011-01-04 | 2011-01-04 | |
| US61/429,472 | 2011-01-04 | ||
| PCT/US2012/020219 WO2012094416A1 (en) | 2011-01-04 | 2012-01-04 | System level power delivery to a plasma processing load |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20130133815A KR20130133815A (ko) | 2013-12-09 |
| KR101675625B1 true KR101675625B1 (ko) | 2016-11-22 |
Family
ID=46457699
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020137019332A Active KR101675625B1 (ko) | 2011-01-04 | 2012-01-04 | 플라즈마 처리 부하에 대한 시스템 레벨 전원 공급 |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US9088267B2 (enExample) |
| JP (3) | JP5946227B2 (enExample) |
| KR (1) | KR101675625B1 (enExample) |
| WO (1) | WO2012094416A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20180002814A (ko) * | 2015-05-05 | 2018-01-08 | 트럼프 휴팅거 에스피 제트 오. 오. | 플라즈마 임피던스 정합 유닛, 플라즈마 부하에 rf 전력을 공급하기 위한 시스템, 및 플라즈마 부하에 rf 전력을 공급하는 방법 |
Families Citing this family (71)
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| CA2711143C (en) * | 2007-12-31 | 2015-12-08 | Ray Ganong | Method, system, and computer program for identification and sharing of digital images with face signatures |
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| KR101303040B1 (ko) * | 2012-02-28 | 2013-09-03 | 주식회사 뉴파워 프라즈마 | 플라즈마 챔버의 아크 검출 방법 및 장치 |
| US9685297B2 (en) | 2012-08-28 | 2017-06-20 | Advanced Energy Industries, Inc. | Systems and methods for monitoring faults, anomalies, and other characteristics of a switched mode ion energy distribution system |
| JP6113450B2 (ja) * | 2012-09-07 | 2017-04-12 | 株式会社ダイヘン | インピーダンス調整装置 |
| JP6084417B2 (ja) | 2012-09-28 | 2017-02-22 | 株式会社ダイヘン | インピーダンス調整装置 |
| CN103730316B (zh) | 2012-10-16 | 2016-04-06 | 中微半导体设备(上海)有限公司 | 一种等离子处理方法及等离子处理装置 |
| US8736377B2 (en) * | 2012-10-30 | 2014-05-27 | Mks Instruments, Inc. | RF pulse edge shaping |
| US9620334B2 (en) * | 2012-12-17 | 2017-04-11 | Lam Research Corporation | Control of etch rate using modeling, feedback and impedance match |
| US9536713B2 (en) * | 2013-02-27 | 2017-01-03 | Advanced Energy Industries, Inc. | Reliable plasma ignition and reignition |
| US10821542B2 (en) | 2013-03-15 | 2020-11-03 | Mks Instruments, Inc. | Pulse synchronization by monitoring power in another frequency band |
| US9854659B2 (en) * | 2014-10-16 | 2017-12-26 | Advanced Energy Industries, Inc. | Noise based frequency tuning and identification of plasma characteristics |
| US9721758B2 (en) * | 2015-07-13 | 2017-08-01 | Mks Instruments, Inc. | Unified RF power delivery single input, multiple output control for continuous and pulse mode operation |
| KR101777762B1 (ko) * | 2015-09-03 | 2017-09-12 | 에이피시스템 주식회사 | 고주파 전원 공급장치 및 이를 포함하는 기판 처리장치 |
| US9577516B1 (en) * | 2016-02-18 | 2017-02-21 | Advanced Energy Industries, Inc. | Apparatus for controlled overshoot in a RF generator |
| KR102901060B1 (ko) * | 2016-03-03 | 2025-12-16 | 램 리써치 코포레이션 | 매칭 네트워크 모델의 파라미터들을 결정하도록 하나 이상의 픽스처들 및 효율을 사용하기 위한 시스템들 및 방법들 |
| JP6157036B1 (ja) | 2016-07-08 | 2017-07-05 | 株式会社京三製作所 | 高周波電源装置、及び高周波電源装置の制御方法 |
| JP2017073770A (ja) * | 2016-09-30 | 2017-04-13 | 株式会社ダイヘン | 高周波整合システム |
| JP2017073772A (ja) * | 2016-09-30 | 2017-04-13 | 株式会社ダイヘン | 高周波整合システム |
| JP6463786B2 (ja) * | 2017-01-25 | 2019-02-06 | 株式会社ダイヘン | 高周波整合システムのインピーダンス調整方法 |
| US10879044B2 (en) * | 2017-04-07 | 2020-12-29 | Lam Research Corporation | Auxiliary circuit in RF matching network for frequency tuning assisted dual-level pulsing |
| US11615943B2 (en) | 2017-07-07 | 2023-03-28 | Advanced Energy Industries, Inc. | Inter-period control for passive power distribution of multiple electrode inductive plasma source |
| KR102504624B1 (ko) | 2017-07-07 | 2023-02-27 | 어드밴스드 에너지 인더스트리즈 인코포레이티드 | 플라즈마 전력 전달 시스템을 위한 주기 간 제어 시스템 및 그 동작 방법 |
| US11651939B2 (en) | 2017-07-07 | 2023-05-16 | Advanced Energy Industries, Inc. | Inter-period control system for plasma power delivery system and method of operating same |
| US10679825B2 (en) * | 2017-11-15 | 2020-06-09 | Lam Research Corporation | Systems and methods for applying frequency and match tuning in a non-overlapping manner for processing substrate |
| US12505986B2 (en) | 2017-11-17 | 2025-12-23 | Advanced Energy Industries, Inc. | Synchronization of plasma processing components |
| US12230476B2 (en) | 2017-11-17 | 2025-02-18 | Advanced Energy Industries, Inc. | Integrated control of a plasma processing system |
| US11437221B2 (en) | 2017-11-17 | 2022-09-06 | Advanced Energy Industries, Inc. | Spatial monitoring and control of plasma processing environments |
| TWI872423B (zh) | 2017-11-17 | 2025-02-11 | 新加坡商Aes 全球公司 | 用於在空間域和時間域上控制基板上的電漿處理之系統和方法,及相關的電腦可讀取媒體 |
| KR102644960B1 (ko) | 2017-11-29 | 2024-03-07 | 코멧 테크놀로지스 유에스에이, 인크. | 임피던스 매칭 네트워크 제어를 위한 리튜닝 |
| US12288673B2 (en) | 2017-11-29 | 2025-04-29 | COMET Technologies USA, Inc. | Retuning for impedance matching network control |
| US10553400B2 (en) * | 2018-03-30 | 2020-02-04 | Applied Materials, Inc. | Methods and apparatus for frequency generator and match network communication |
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| KR20210149225A (ko) | 2019-04-29 | 2021-12-08 | 램 리써치 코포레이션 | Rf 플라즈마 툴들의 멀티 레벨 펄싱을 위한 시스템들 및 방법들 |
| KR102763163B1 (ko) * | 2019-04-29 | 2025-02-07 | 삼성전자주식회사 | Rf 파워 모니터링 장치, 및 그 장치를 포함하는 pe 시스템 |
| US11527385B2 (en) | 2021-04-29 | 2022-12-13 | COMET Technologies USA, Inc. | Systems and methods for calibrating capacitors of matching networks |
| US11114279B2 (en) | 2019-06-28 | 2021-09-07 | COMET Technologies USA, Inc. | Arc suppression device for plasma processing equipment |
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| KR102884261B1 (ko) | 2019-08-28 | 2025-11-10 | 코멧 테크놀로지스 유에스에이, 인크. | 고전력 저주파 코일들 |
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| KR102850760B1 (ko) * | 2024-05-09 | 2025-08-28 | 엠케이에스코리아 유한회사 | 펄스 발생기의 비대칭 멀티-레벨 제어 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070139122A1 (en) * | 2005-10-31 | 2007-06-21 | Mks Instruments, Inc. | Radio Frequency Power Delivery System |
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| JP3251087B2 (ja) * | 1993-02-16 | 2002-01-28 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| JP2929284B2 (ja) * | 1997-09-10 | 1999-08-03 | 株式会社アドテック | 高周波プラズマ処理装置のためのインピーダンス整合及び電力制御システム |
| JP4088499B2 (ja) * | 2002-08-28 | 2008-05-21 | 株式会社ダイヘン | インピーダンス整合器の出力端特性解析方法、およびインピーダンス整合器、ならびにインピーダンス整合器の出力端特性解析システム |
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| KR100877304B1 (ko) * | 2003-11-27 | 2009-01-09 | 가부시키가이샤 다이헨 | 고주파 전력 공급 시스템 |
| US7169256B2 (en) * | 2004-05-28 | 2007-01-30 | Lam Research Corporation | Plasma processor with electrode responsive to multiple RF frequencies |
| JP4739793B2 (ja) * | 2005-03-31 | 2011-08-03 | 株式会社ダイヘン | 高周波電源装置 |
| US20080179948A1 (en) * | 2005-10-31 | 2008-07-31 | Mks Instruments, Inc. | Radio frequency power delivery system |
| JP5512127B2 (ja) * | 2005-10-31 | 2014-06-04 | エム ケー エス インストルメンツ インコーポレーテッド | 無線周波数電力搬送システム及び方法 |
| JP2007336148A (ja) * | 2006-06-14 | 2007-12-27 | Daihen Corp | 電気特性調整装置 |
| JP2007313432A (ja) | 2006-05-25 | 2007-12-06 | Nippon Kankyo Calcium Kenkyusho:Kk | 廃棄物処分場を覆う盛土部における設備 |
| JP2008157906A (ja) * | 2006-12-25 | 2008-07-10 | Adtec Plasma Technology Co Ltd | 出力インピーダンス検出方法およびこの方法を用いたインピーダンスのセンサー、高周波電源につながる負荷側の電力モニターならびに高周波電源の制御装置 |
| KR101528528B1 (ko) | 2008-05-14 | 2015-06-12 | 어플라이드 머티어리얼스, 인코포레이티드 | Rf 전력 전달을 위한 시간 분해된 조정 방식을 이용하는 펄스화된 플라즈마 처리를 위한 방법 및 장치 |
| US8040068B2 (en) * | 2009-02-05 | 2011-10-18 | Mks Instruments, Inc. | Radio frequency power control system |
| JP5946227B2 (ja) * | 2011-01-04 | 2016-07-05 | アドバンスト・エナジー・インダストリーズ・インコーポレイテッドAdvanced Energy Industries, Inc. | 電力送達システム、電力制御システム、および、電力を送達するまたは電力制御する方法 |
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2012
- 2012-01-04 JP JP2013547731A patent/JP5946227B2/ja active Active
- 2012-01-04 US US13/343,576 patent/US9088267B2/en not_active Expired - Fee Related
- 2012-01-04 KR KR1020137019332A patent/KR101675625B1/ko active Active
- 2012-01-04 WO PCT/US2012/020219 patent/WO2012094416A1/en not_active Ceased
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2015
- 2015-06-16 US US14/740,955 patent/US9478397B2/en active Active
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2016
- 2016-03-17 JP JP2016053392A patent/JP6141478B2/ja active Active
-
2017
- 2017-05-02 JP JP2017091857A patent/JP6425765B2/ja active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070139122A1 (en) * | 2005-10-31 | 2007-06-21 | Mks Instruments, Inc. | Radio Frequency Power Delivery System |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20180002814A (ko) * | 2015-05-05 | 2018-01-08 | 트럼프 휴팅거 에스피 제트 오. 오. | 플라즈마 임피던스 정합 유닛, 플라즈마 부하에 rf 전력을 공급하기 위한 시스템, 및 플라즈마 부하에 rf 전력을 공급하는 방법 |
| KR102499938B1 (ko) | 2015-05-05 | 2023-02-14 | 트럼프 휴팅거 에스피 제트 오.오. | 플라즈마 임피던스 정합 유닛, 플라즈마 부하에 rf 전력을 공급하기 위한 시스템, 및 플라즈마 부하에 rf 전력을 공급하는 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20130002136A1 (en) | 2013-01-03 |
| JP2014508378A (ja) | 2014-04-03 |
| US20150279625A1 (en) | 2015-10-01 |
| KR20130133815A (ko) | 2013-12-09 |
| JP2016149366A (ja) | 2016-08-18 |
| US9088267B2 (en) | 2015-07-21 |
| US9478397B2 (en) | 2016-10-25 |
| WO2012094416A1 (en) | 2012-07-12 |
| JP6141478B2 (ja) | 2017-06-07 |
| JP5946227B2 (ja) | 2016-07-05 |
| JP2017188464A (ja) | 2017-10-12 |
| JP6425765B2 (ja) | 2018-11-21 |
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