KR101669510B1 - Apparatus for Investigating Objects with X-ray Having Structure of Carrier Fixation - Google Patents

Abstract

The present invention relates to an X-ray inspection apparatus for a grip structure. Specifically, a carrier or an object to be inspected is fixed by a grip unit so that a plurality of inspection targets form one inspection unit, And an X-ray inspection apparatus of a grip structure for allowing inspection to proceed. The grip structure x-ray inspection apparatus includes grip units (11a, 11b) for fixing at least one subject (B) to be inspected moved along a transfer path (102) to a predetermined position; X-ray tubes (12a, 12b) arranged at different positions in the transport path (102); Detectors 13a and 13b provided at positions corresponding to the x-ray tubes 12a and 12b; And a robot arm (14) for adjusting the positions of the grip units (11a, 11b), wherein the grip units (11a, 11b) comprise a pair of adjustment units (111, 112) facing each other, The tubes 12a and 12b irradiate x-rays to the side of the subject B to be inspected.

Description

[0001] Apparatus for Investigating Objects with X-ray Having Structure of Carrier Fixation [

The present invention relates to an X-ray inspection apparatus for a grip structure. Specifically, a carrier or an object to be inspected is fixed by a grip unit so that a plurality of inspection targets form one inspection unit, And an X-ray inspection apparatus of a grip structure for allowing inspection to proceed.

X-ray inspection is applied to various industrial fields including medical field, and various types of inspection devices according to product types are known in each application field. For example, an x-ray inspection apparatus may be applied to various batteries, defect inspection of a printed circuit board, defect inspection of a mobile device, defect inspection of a food container, or foreign matter detection of food. Generally, in an X-ray inspection apparatus, objects to be inspected can be supplied continuously by a conveying means such as a conveyor or individually loaded on a tray. Then, an image can be obtained by irradiating the object to be inspected with the X-ray in the vertical direction with respect to the conveyor or the tray. However, depending on the structure of the object to be inspected, it may be difficult to obtain a necessary inspection image when the X-rays are vertically irradiated. Also, it is advantageous for the inspection efficiency that a plurality of objects to be inspected are simultaneously inspected.

Prior art relating to x-ray inspection is Patent No. 0978054, a battery x-ray inspection device. The prior art aims to provide an X-ray inspection apparatus capable of rotating an object to be inspected, including an XYZ-axis, at various angles. For this purpose, the prior art includes a fixed table having a sliding door formed on a front surface of the case, a sensor provided on a side surface of the sliding door, a guide between the x-ray tube and the detector to be rotatable by a motor, A Y-axis moving table having a guide rotatable by a motor is disposed at an upper portion thereof, a guide is provided at an upper portion of the Y-axis moving table so as to be rotatable by a motor, An X-axis moving table for moving the X-axis moving table in the Y-axis direction, a coupling opening for moving the Y-axis horizontally along the X-axis moving table, a seating unit formed on both sides of the upper portion, Ray inspection apparatus having a table on which a tray having a plurality of trays is disposed.

Another prior art related to x-ray inspection apparatus is patent registration number 1133048 battery inspection apparatus. The prior art includes a partition wall for shielding a second stage for inspecting a battery from a first stage for loading and unloading the battery so that the x-ray is interrupted during the inspection of the battery, and an outer wall for shielding the second stage from the outside A chamber; A loading unit for transferring the battery to the first stage, an unloading unit for transferring the battery to the outside of the chamber in the first stage, and an unloading unit for transferring the battery received from the loading unit, And a transfer unit for transferring the battery to the first stage and the transfer unit for transferring the battery to the first stage and the second stage for transferring the battery to the unloading unit when the inspection of the battery is completed, A transfer path portion for forming a path for inspecting the battery between the first and second stages via the first and second stages and the battery may be set respectively, A first stage arranged in a direction from the first stage toward the second stage, And a second conveying jig.

The prior art does not disclose an inspection apparatus that can be simultaneously inspected while a plurality of objects to be inspected are continuously transferred. For example, a product such as a battery, an electronic component or a printed circuit board can be assembled in large quantities and can be continuously conveyed through a conveying means such as a conveyor. Advantageously, the inspection of these products in the transfer process or in the defined process is carried out continuously. At the same time, it is advantageous that a plurality of products become a unit and are sequentially inspected in a sequential order. Also, depending on the structure of the object to be inspected, a fixed unit capable of fixing the object to be inspected may be required, and the irradiation direction of the X-ray needs to be appropriately set. The prior art does not disclose such an X-ray inspection structure.

The present invention has been made to solve the problems of the prior art and has the following purpose.

Prior Art Document 1: Registered Patent No. 10-0978054 (published by Jarvis Co., Ltd., 25th May, 2010) Battery x-ray inspection device Prior Art 2: Registered Patent No. 10-1133048 (Inonomet Co., Ltd., April 04, 2012) Battery Inspection Device

An object of the present invention is to provide an apparatus for inspecting an X-ray of a grip structure in which a plurality of carriers to which an object to be inspected is fixed by a grip unit to form a single inspection unit for a plurality of inspection objects to perform X- .

According to a preferred embodiment of the present invention, the x-ray inspection apparatus of the grip structure comprises a grip unit for fixing at least one object to be inspected moved along a conveyance path at a predetermined position; An X-ray tube disposed at different positions in the transport path; A detector installed at a position corresponding to the X-ray tube; And a robot arm for adjusting the position of the grip unit, wherein the grip unit comprises a pair of adjustment units facing each other, and the X-ray tube irradiates the X-ray to the side of the subject to be inspected.

According to another preferred embodiment of the present invention, the pair of adjustment units opposed to each other is adjusted in the moving position according to the size of the subject to be inspected.

According to another preferred embodiment of the present invention, the x-ray tube is arranged at a first position and a second position and irradiates x-rays at different heights, respectively.

According to another preferred embodiment of the present invention, the x-ray tube and the detector are fixed to the same positioning substrate.

According to another preferred embodiment of the present invention, each of the pair of adjustment units includes one grip arm for fixing one part of the subject to be inspected and two grip arms for fixing one part and two parts corresponding to other parts .

According to another preferred embodiment of the present invention, the object to be inspected is accommodated in a carrier for fixing a position of an object to be inspected, and the grip unit sets and aligns a plurality of carriers in one transfer unit.

According to another preferred embodiment of the present invention, the conveyance path 102 forms a circulation path as a whole, and a branch path for discharging and inputting is formed in at least one of the circulation paths.

According to another preferred embodiment of the present invention, the grip unit for aligning and fixing an object to be inspected in the x-ray inspection apparatus includes: a grip arm for aligning and fixing the carrier (P) for transferring the object to be inspected; And a second grip arm for fixing the object to be inspected, and the second grip arm has a structure capable of fixing objects to be inspected having different sizes by the elastic moving means.

According to another preferred embodiment of the present invention, the second grip arm separates the object to be inspected from the carrier (P) during the inspection process of the object to be inspected, do.

The inspection apparatus according to the present invention increases the inspection efficiency by fixing a plurality of carriers by a single grip unit and forming a single inspection unit for a plurality of inspection targets and sequentially inspecting the inspection units in a sequential order. The inspection apparatus according to the present invention makes it possible to inspect objects to be inspected having different sizes. The inspection apparatus according to the present invention makes it possible to inspect continuous products by applying a carrier structure.

1A and 1B are a block diagram and a structural view of a testing apparatus according to the present invention, respectively.
FIGS. 2A and 2B illustrate an embodiment of an X-ray tube and a detector applied to an inspection apparatus according to the present invention.
FIG. 3 shows an embodiment of a robot arm applied to an inspection apparatus according to the present invention.
4A and 4B illustrate an embodiment of a grip unit according to the present invention.
FIG. 5 shows an embodiment of a process of inspecting a battery in an inspecting apparatus according to the present invention.
6 shows an embodiment of a conveyance path applied to an inspection apparatus according to the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail with reference to the embodiments shown in the accompanying drawings, but the present invention is not limited thereto. In the following description, components having the same reference numerals in different drawings have similar functions, so that they will not be described repeatedly unless necessary for an understanding of the invention, and the known components will be briefly described or omitted. However, It should not be understood as being excluded from the embodiment of Fig.

In the following, the cylindrical battery is presented as an object to be inspected, but the present invention is not limited thereto.

1A and 1B are a block diagram and a structural view of an inspection apparatus 10 according to the present invention, respectively.

1A and 1B, an inspection apparatus 10 according to the present invention includes grip units 11a and 11b for fixing at least one object B to be inspected moved along a transfer path 102 to predetermined positions, ; X-ray tubes (12a, 12b) arranged at different positions in the transport path (102); Detectors 13a and 13b provided at positions corresponding to the x-ray tubes 12a and 12b; And a robot arm (14) for adjusting the positions of the grip units (11a, 11b), wherein the grip units (11a, 11b) comprise a pair of adjustment units (111, 112) facing each other, The tubes 12a and 12b irradiate x-rays to the side of the subject B to be inspected.

The inspection apparatus 10 according to the present invention can be applied, for example, to defect inspection of a battery. The battery can be made in the form of a jelly roll, a laminate structure, or a cylindrical shape. When the battery is made in a cylindrical shape, it is difficult to inspect the internal defect if the x-ray is irradiated perpendicularly to the battery. Therefore, the x-rays need to be irradiated to the side rather than to the vertical, for example. Also, in the case of a cylindrical battery, it is difficult to independently fix the battery in a predetermined position in a device such as a conveying conveyor. Therefore, a means for securing the battery is required.

The subject B to be inspected such as a battery can be aligned and fixed by the grip units 11a and 11b at predetermined positions in the process of being conveyed along the conveying path 102. [ Specifically, the subject to be inspected is fixed to the carrier, and the carrier can be aligned and fixed by the grip units 11a and 11b. A plurality of carriers can be fixed and aligned by one grip unit 11a, 11b. For example, four, six, eight, ten or more carriers can be fixed and aligned in one grip unit 11a, 11b and aligned by one grip unit 11a, 11b The carriers may be one transport unit and one inspection unit.

The grip units 11a and 11b may be disposed in the conveying path 102 and may be disposed at different positions of the conveying path 102 in the inspection area 100, for example, the first and second positions . The conveying path 102 may be an appropriate conveyor device capable of conveying the inspection carrier. The object B to be inspected may be previously accommodated in the carrier and moved to the conveying path 102 by a device such as the conveying robot 101. [ And may be loaded into the conveying path 102 in a predetermined conveying unit or inspection unit, for example, eight. And a predetermined number of carriers can be moved along the transport path 102 to the inspection area 100. [

The inspection area 100 can be an appropriate enclosed space and can detect x-rays irradiated from at least one of the x-ray tubes 12a and 12b and the respective x-ray tubes 11a and 11b, The detectors 13a and 13b may be arranged in the inspection area 100 to form the inspection areas 100a and 100b. It is necessary that the carriers fixing the respective objects B to be inspected need to be aligned before they are inspected in the inspection area 100. [ The grip units 11a and 11b can be made up of a pair of adjustment units 111 and 112 facing each other and the carrier is aligned and fixed by a pair of adjustment units 111 and 112, The movement of the pair of adjustment units 111 and 112 is adjusted to align the subject B to be inspected. Specifically, the pair of adjustment units 111 and 112 can be installed so as to be vertically movable with respect to the conveying direction of the subject B to be inspected, and the moving distance can be adjusted according to the size of the subject B to be inspected . Then, the adjustment units 111 and 112 are moved in directions opposite to each other to fix the subject B to be inspected. For example, when the subject B to be inspected is a cylindrical battery, the diameter of the carrier accommodating the subject B to be inspected may vary depending on the diameter of the battery. The movement distance of the adjustment units 111 and 112 in the opposite directions is adjusted according to the diameter of the carrier, so that the carrier can be fixed.

When the carrier is fixed by the adjustment units 111 and 112, the grip units 11a and 11b can move the carrier or the object to be inspected to the inspection position by the robot arm 14. The grip units 11a and 11b can be connected to the robot arm 14 by the connector 15 and the robot arm 14 moves the grip units 11a and 11b in the first direction or the first direction, It is possible to align the inspection object B at a predetermined position. When the subject B to be inspected is aligned in the inspection area 100 in this manner, it can be inspected by the X-ray tubes 12a and 12b and the detectors 13a and 13b.

The x-ray tubes 12a and 12b may be at least one, for example, the x-ray tubes 12a and 12b may be installed at a first position and a second position different from the first position. The X-ray tubes 12a and 12b are provided on one side of the conveying path 102 and can irradiate the X-rays perpendicularly to the conveying direction and the detectors 13a and 13b are arranged on the X- , 12b are installed. In this arrangement, the X-rays irradiated from the X-ray tubes 12a and 12b can be detected by the detectors 13a and 13b through the side of the subject B to be inspected.

The X-ray tubes 12a and 12b installed at the first position and the second position can irradiate X-rays based on different heights of the subject B to be inspected. For example, the first x-ray tube 12a irradiates the lower part of the object B to be inspected with the x-rays, and the second x-ray tube 12b irradiates the upper part of the object B with the x-rays . Each of the x-ray tubes 12a and 12b irradiates the entirety of the object B to be inspected fixed to the grip units 11a and 11b with a plurality of X-ray tubes 12a and 12b fixed to one grip unit 11a and 11b The object to be inspected can be a unit of inspection. The object to be inspected B inspected by the X-ray tube 12a and 12b and the detectors 13a and 13b can be judged to be defective and can be discharged from the inspection region 100. Then, the inspected object B having been inspected along the conveying path 102 can be conveyed to a place determined by the conveying robot, for example.

1B, the conveying path 102 may have a rail structure and may have, for example, a circulating rail structure, and may include an input path 102a, a first output path 102b connected to the outside, And a second discharge path 102c connected to the second discharge path 102c. The object B to be inspected to be conveyed through the second discharge path 102c is determined to be primarily defective and can be returned to the inspection area 100 for re-inspection. If it is judged again to be defective in the secondary inspection, it may be classified as a defective product and discharged at the middle of the conveying path 102 (not shown). The first discharge path 102b is for transferring the product determined to be normal.

Each of the devices disposed in the transfer path 102 and the inspection area 100 can be installed above the frame F and the inspection area 100 can have a suitable sealing structure as described above. Each of the x-ray tubes 12a and 12b disposed at different positions in the transfer path 102 can be arranged to be movable by the movement unit 17. [ Each of the x-ray tubes 12a and 12b can be moved together with the corresponding detectors 13a and 13b. The movement of the x-ray tubes 12a and 12b is intended to correspond to a change in the shape or inspection position of the subject B to be inspected and will be described below again.

The robot arm 14 may include a first moving unit 141 and a second moving unit 142 and may move the grip units 11a and 11b in different directions. Then, the grip units 11a and 11b are moved by the first moving unit 141 and the second moving unit 142 so that the carriers can be aligned at predetermined positions. When the carrier is aligned at a predetermined position, the object B to be inspected can be inspected by the X-ray tubes 12a and 12b and the detectors 13a and 13b. The x-ray tubes 12a and 12b and the detents 13a and 13b need to be disposed at appropriate positions according to the size of the object B to be inspected.

The movement structure of the x-ray tubes 12a and 12b will be described below.

2A and 2B show an embodiment of an X-ray tube 12 and a detector 13 applied to an inspection apparatus according to the present invention.

Referring to FIGS. 2A and 2B, the X-ray tube 12 and the detector 13 may be fixed to the same position adjusting substrate 25 by fixing brackets 251 and 252. The directions of the x-ray tube 12 and the detector 13 by the fixing brackets 251 and 252 on the position adjusting substrate 25 can be appropriately fixed. The x-ray tube 12 and the detector 13 may be fixed such that the irradiation hole 121 of the x-ray tube 121 of the x-ray tube 12 coincides with the height and direction of the sensor of the detector 13, for example . The positions of the x-ray tube 12 and the detector 13 are adjusted in unison by adjusting the position of the position adjusting substrate 25 while fixing the height and direction of the x-ray tube 12 and the detector 13 relatively .

The movable bracket 231 may be provided on the side of the position adjusting board 25 and the position adjusting board 25 may be moved along the moving bracket 231 in the first direction or the second direction. A moving plate 24 may be provided below the moving bracket 231 for movement along the first direction and the moving plate 24 may be moved along the first guide plate 241 by the operation of the first driving device 21, In the first direction. The guide block 233 can be installed for movement along the second direction and the second guide block 232 installed on the movement bracket 231 can be moved along the guide block 233 by the second drive device 22 Can be moved. The relative distance of the X-ray tube 12 and the detector 13 in the position adjusting substrate 25 can be adjusted by moving the fixing brackets 251 and 252 along the linear guide 253.

The X-ray tube 12 and the detector 13 disposed at different positions may have different moving structures. For example, the first x-ray tube 12 and the detector 13 can inspect the upper part of the object to be inspected and the second x-ray tube 12 and the detector 13 can inspect the lower part of the object to be inspected. In this case, the second X-ray tube 12 and the detector 13 need not be moved in the vertical direction.

Referring to FIG. 2B, the position adjusting substrate 25 may have a structure for moving in the first direction by the operation of the driving device 26, and a structure for moving the position adjusting substrate 25 in the up and down direction is not provided. The X-ray tube 12 and the detector 13 may have a suitable moving structure depending on the placement position and the examination area, and the present invention is not limited to the illustrated embodiments.

The proposed arrangement of the X-ray tube 12 and the detector 13 allows the X-ray tube 12 and the detector 13 to move vertically and horizontally integrally with each other while at the same time allowing relative movement between the X-ray tube 12 and the detector 13 Adjust the distance. This makes it possible to easily adjust the focus for the object B to be inspected having different sizes.

The object to be inspected must be aligned for inspection by the X-ray tube 12 and the detector 13.

Fig. 3 shows an embodiment of a robot arm 14 applied to the inspection apparatus according to the present invention.

3, the grip unit 11 may be composed of a pair of opposed adjustment units 111 and 112 for fixing the carrier, and the pair of adjustment units 111 and 112 may be moved in the opposite direction .

The pair of adjustment units 111 and 112 may be provided with the connection members 341 and 342 and the adjustment members 343 and 344 may be connected to the respective connection members 341 and 342. The adjustment members 343 and 344 may be plate-shaped, for example, and the connector 15 may be coupled to one adjustment member 344. [ The connector 15 can be moved in the direction for adjusting the distance between the adjustment units 111 and 112 and at the same time can be moved up and down and left and right. The first moving unit 141 may be installed to move the connector 13 left and right and the second moving unit 142 may be installed to move the connector 15 up and down. The first moving unit 141 may include a first direction guide block 312 having an induction path formed therein and the connector 15 may be movably coupled to the first direction guide block 312 by the induction bracket 311. [ . The connector 15 can be fixed to the guide bracket 311 so as to be movable up and down along the second direction movement axis 32 extending in the second direction.

When the position of the grip unit 11 in the first direction and the second direction is determined by the robot arm 14, the carrier can be fixed to the predetermined position by the adjustment units 111 and 112. Thereafter, the subject to be inspected fixed to the carrier by the X-ray tube and the detector can be inspected.

In the inspection apparatus according to the present invention, the object to be inspected may be moved through the carrier or the object to be inspected may be transferred according to the structure of the transfer path. The grip unit 11 can fix at least one carrier or fix the object to be inspected.

4A and 4B illustrate an embodiment of the grip unit 11 according to the present invention.

Referring to the embodiment shown in FIG. A pair of adjustment units 111, 112 correspond to the grip arms 41, 42.

4A and 4B, the grip unit 11 can be composed of one grip arm 41 for fixing the carrier P and two grip arms 42 for fixing the subject B to be inspected, The arm 41 and the two grip arms 42 may be arranged vertically. The one grip arm 41 can fix one portion of the subject to be inspected and the two grip arms 42 can fix two portions of the subject to be inspected. 4B, when the subject B to be inspected such as a battery is fixedly transported to a carrier P such as a puck, one gripping arm 41 fixes the carrier P, The grip arm 42 can fix the subject B to be inspected. Only one grip arm 41 or 42 is provided depending on the structure of the subject B to be inspected so that the subject B can be fixed and the present invention is not limited by the number of the grip arms 41 and 42 Do not.

As shown in Fig. 4B, the grip unit 11 may have a symmetrical structure, and Fig. 4A shows a structure of one portion of the grip unit 11. Fig.

Referring to FIG. 4A, one gripping arm 41 and two gripping arms 42 may be coupled to each other so as to have different height differences in the extending fixing member 414 extending along the feeding direction. 1 The grip arm 41 may include one grip block 411 having one end coupled to the extension fixing member 414 and the plurality of fixed arms 412 formed at the other end. The fixed arm 412 may have a shape corresponding to a part of the peripheral surface of the carrier P and may have, for example, an arc shape, a V shape, or a U shape, but is not limited thereto. A straddle plate 413 may be formed at a lower portion of the fixed arm 412. The holding plate 413 has a function of preventing the object B to be inspected, which is not fixed by the two grip arms 42, from falling downward.

2 grip arm 42 includes a support block 421 disposed above one grip block 411 while extending in the direction of the extension fixation member 414 and at least one fixing tip 423 coupled to the support block 421, May be formed. The fixing tip 423 may have a shape corresponding to the peripheral surface of the object B to be inspected and may have, for example, an arc shape, a V shape, or a U shape, but is not limited thereto.

The subject B to be inspected can have various sizes and if the diameter of the subject B to be inspected is changed, the fixing tip 423 having a fixed position structure is fixed to the subject B having different diameters It is difficult to do. In order to solve such a problem, the extension fixing member 414 and the support block 421 may be combined so as to be relatively movable. A guide pin 427 is disposed in the support block 421 and a guide hole 414a corresponding to the guide pin 427 can be disposed in the extension fixing member 414. [ And the guide pin 427 can be coupled to the guide hole 414a via an elastic moving means 426 such as a spring. Due to such a structure, the subject B to be inspected having different diameters or sizes can be fixed by the two grip arms 42. [

The connecting member 341 may be coupled to the adjusting member 343 by the fixing tab 44 and the adjusting member 344 may be coupled to the extending member 414, Can be controlled by the adjustment control unit (48). And the adjustment control unit 48 may be connected to the connector 15 (see Fig. 3).

Referring to FIG. A plurality of carriers P can be moved in one inspection unit and the object B to be inspected can be fixed to each carrier P. [ For example, when eight carriers P are transported as one unit between the grip units 11, an adjustment control unit 48 such as a cylinder may be operated to move the adjustment member 343. Each carrier P is aligned and the carrier P and the object B to be inspected can be fixed by the one gripping arm 41 and the two gripping arms 42. [ When the subject B to be inspected is fixed, the lower and upper portions of the subject B can be individually inspected by the X-ray tubes arranged at different heights. Each of the carriers P and the object B to be inspected can be moved by the robot arm described above in a state of being fixed by the grip arms 41 and 42 and the inspection for each object B to be inspected The grip arms 41 and 42 unfasten the carrier P and the object B to be inspected and move to the original position again by the robot arm. It is difficult to obtain a clear image of the subject B to be inspected when the X-ray is irradiated while the carrier P is fixed by the one grip arm 41 in the inspection process. In order to solve such a problem, the object to be inspected B is fixed by the two grip arms 42 and the carrier P can be moved to a predetermined position along the conveying path in the aligned state. The two grip arms 42 are then moved so that each inspected object B can be inspected by an X-ray tube and a detector located at different heights. The object 2 to be inspected may fall downward because the two grip arms 42 can not accurately catch the object B to be inspected during the inspection process. In this case, the latching plate 413 may be formed on the one grip arm 41 to prevent the leakage of the subject B to be inspected. The grip arms 41 and 42 are moved to a predetermined position where the carrier P is positioned when the grip arms 41 and 42 are moved along the transfer path and the inspection of each inspected object B is completed. The first grip arm 41 first fixes the transferred carrier P and the second grip arm 42 releases the fastening to the subject B to be inspected, As shown in FIG.

In the illustrated embodiment, for example, eight inspection units are arranged and fixed by the grip unit 11, but the grip units 11 are provided with the grip arms 11, 41, 42). The subject B may not be transported by the carrier P depending on the transport path or the structure of the subject B to be inspected. In this case, the object to be inspected B can be fixed by one grip arm 42.

The grip unit 11 may have various structures and the present invention is not limited to the embodiments shown. The object B to be inspected can be inspected in the inspection apparatus by various methods.

FIG. 5 shows an embodiment of a process of inspecting a battery in an inspecting apparatus according to the present invention.

Referring to FIG. 5, in order to inspect an object to be inspected, the inspection unit must first be determined (P51). The determination of the inspection unit includes determining the transfer unit. As described above, the subject to be inspected can be transported by the carrier, and the number of objects to be inspected to be aligned and inspected in one inspection process by the grip unit can be determined as 6, 8, or 10. Once the inspection unit is determined, it can be transferred according to the inspection unit (P52) and fixed and aligned by the grip unit at the first position in the inspection unit (P53). When the subject to be inspected is fixed and aligned in the inspection unit by the grip unit in the inspection area, the first part can be inspected (P54). The first portion may be, for example, below the subject to be inspected, and the x-ray tube and the detector may be aligned at predetermined positions. When the first site inspection is completed, the inspection result is stored, and the inspection target can be transferred to the second location again in the inspection unit. And fixed and aligned by the grip unit at the second position (P55) and the second portion may be inspected (P56). For example, the second portion may be above the subject to be inspected. Finally, it can be judged whether it is normal or not (P57). If it is determined to be normal (YES), the subject to be inspected may be discharged along a predetermined path (P48). If it is judged to be defective, it can be transferred to the inspection area again (P52). If the secondary inspection is judged to be defective again, the subject to be inspected may be discharged through the path separately.

The transport path can be formed in various ways.

6 shows an embodiment of a conveyance path applied to an inspection apparatus according to the present invention.

Referring to FIG. 6, the conveying path forms a circulating path as a whole, and a branch path P3 or P5 for discharging and inputting is formed in at least one of the circulating paths.

The conveyance path through which the object to be inspected or the carrier is conveyed can form a circulation path. The circulation path generally refers to a closed curve shaped path, and the transport path can be connected to another path of the production line. A conveying means such as a belt may be disposed in the circulation path, and the conveying means may be rotated by a driving device such as a motor. Or a rail structure, and the conveying method of the object to be inspected or the carrier on the rail can be performed by various methods.

The carrier or puck can be rotated along the circulation path and the object to be inspected can be loaded on the carrier at the loading position Pl, for example a grip unit, a robot arm or manually. A carrier having a subject to be inspected can be inserted into the conveying path at the loading position Pl as necessary. The carrier is moved along the conveying path, and the object to be inspected at the aligning and fixing position P21 can be separated from the carrier by the grip unit. Then, the carrier can be moved along the conveying path to the binding position P22 independently of the subject to be inspected. The subject to be inspected separated from the carrier can be inspected by the x-ray tube and fixed to the carrier again at the binding position P22. Then, the carrier may be discharged from the inspection region and reach the branch path P3. The carrier having the inspected object determined to be defective in the separation path P3 is moved along the retest path L3 and the carrier having the normal object determined to be inspected can be moved along the discharge path L1. At the discharge position P4, the object to be inspected can be discharged by the grip unit. The empty carrier may then be moved along the loading path L3. Then, the object to be inspected can be loaded on the carrier at the loading position P1 again.

A carrier having a defective object to be inspected moved along the re-inspection path L3 may be inserted again into the inspection area along the re-injection path L31. A carrier having an object to be inspected to be newly inspected along the injection path L32 can be moved to the inspection area. Each object to be inspected can have a unique ID, and each unique ID can be stored in the control unit so that the transfer along the transfer path can be controlled.

The inspection method by the inspection apparatus according to the present invention can be performed in various forms, and the present invention is not limited to the embodiments shown.

The inspection apparatus according to the present invention allows a plurality of carriers to be fixed by a single grip unit, and a plurality of objects to be inspected are simultaneously inspected, thereby enhancing inspection efficiency. The inspection apparatus according to the present invention makes it possible to inspect objects to be inspected having different sizes. The inspection apparatus according to the present invention makes it possible to inspect continuous products by applying a carrier structure.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention . The invention is not limited by these variations and modifications, but is limited only by the claims appended hereto.

10: Inspection device 11, 11a, 11b: Grip unit
12, 12a, 12b: X-ray tube 13, 13a, 13b: Detector
14: Robot arm 15: Connector
17: mobile unit 21, 22: drive unit
24: moving plate 25: regulating substrate
26: drive device 41, 42: grip arm
44: fixing tab 414:
48: Regulation control unit
111, 112: Adjusting unit 121: Irradiation hole
141: first mobile unit 142: second mobile unit
231: moving bracket 232: second guide block
233: guide block 241: guide plate
251, 252: Fixing bracket 253: Linear guide
311: guide bracket 312: guide block
341, 342: connecting member 343, 344:
412: Fixing arm 413: Holding plate
421: Support block 423: Fixing tip
414a: Guide hole 426: Elastic moving means
427: Guide pin 102: Feed path
100: inspection area 101: transfer robot
102a: input path 102b, 102c: exhaust path
B: subject to be inspected P: carrier

Claims (9)

A pair of grip units (11a, 11b) arranged to face each other so as to fix a plurality of objects to be inspected (B) moved along the transfer path (102) at a predetermined position;
X-ray tubes (12a, 12b) arranged at different positions in the transfer path (102);
Detectors 13a and 13b provided at positions corresponding to the x-ray tubes 12a and 12b; And
And a robot arm (14) for moving the grip units (11a, 11b) to align a plurality of objects to be inspected (B) at predetermined positions,
Each of the pair of grip units 11a and 11b includes a grip arm 41 having a plurality of fixed arms 412 for fixing a plurality of carriers P, (42) having a plurality of fixing tips (423) for fixing the subject (B) to be inspected and being arranged vertically with one gripping arm (41); 2 grip arm 42 is disposed so as to be movable with respect to one grip arm 41 by an elastic moving means 426 so that the subject B to be inspected having different sizes is fixed by the fixing tip 423 And the X-ray detector of the grip structure.  The grip grip according to claim 1, wherein the two grip arms (42) are formed by separating the object to be inspected from the carrier (P) in the inspection process of the object to be inspected (B) And a latching plate (413) for preventing the leakage of the subject (B) to be inspected is provided below the one gripping arm (41) Inspection device.  The x-ray examination apparatus according to claim 1, wherein the x-ray tubes (12a, 12b) are arranged at a first position and a second position and irradiate X-rays at different heights. The apparatus according to claim 1, wherein the X-ray tubes (12a, 12b) and the detectors (13a, 13b) are fixed to the same position adjusting substrate (25). delete delete 2. The apparatus according to claim 1, wherein the conveying path (102) forms a circulating path as a whole, and a branching path (P3 or P5) for discharging and inputting is formed in at least one part of the circulating path. .







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