KR101579640B1 - 인쇄된 전자소자의 비접촉 테스팅 - Google Patents

인쇄된 전자소자의 비접촉 테스팅 Download PDF

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Publication number
KR101579640B1
KR101579640B1 KR1020117029382A KR20117029382A KR101579640B1 KR 101579640 B1 KR101579640 B1 KR 101579640B1 KR 1020117029382 A KR1020117029382 A KR 1020117029382A KR 20117029382 A KR20117029382 A KR 20117029382A KR 101579640 B1 KR101579640 B1 KR 101579640B1
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KR
South Korea
Prior art keywords
printed
test circuit
substrate
printing
energy
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Expired - Fee Related
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KR1020117029382A
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English (en)
Korean (ko)
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KR20120027319A (ko
Inventor
로버트 에이 부드로
더글라스 이 브랙클리
케빈 티 가하간
게리 이 메르즈
레온 알. Ⅲ 조엘러
Original Assignee
코닝 인코포레이티드
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Publication of KR20120027319A publication Critical patent/KR20120027319A/ko
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Publication of KR101579640B1 publication Critical patent/KR101579640B1/ko
Expired - Fee Related legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/304—Contactless testing of printed or hybrid circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Toxicology (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Electroluminescent Light Sources (AREA)
  • Accessory Devices And Overall Control Thereof (AREA)
KR1020117029382A 2009-05-08 2010-05-05 인쇄된 전자소자의 비접촉 테스팅 Expired - Fee Related KR101579640B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/437,779 2009-05-08
US12/437,779 US8378702B2 (en) 2009-05-08 2009-05-08 Non-contact testing of printed electronics

Publications (2)

Publication Number Publication Date
KR20120027319A KR20120027319A (ko) 2012-03-21
KR101579640B1 true KR101579640B1 (ko) 2015-12-22

Family

ID=43050834

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020117029382A Expired - Fee Related KR101579640B1 (ko) 2009-05-08 2010-05-05 인쇄된 전자소자의 비접촉 테스팅

Country Status (6)

Country Link
US (2) US8378702B2 (enExample)
JP (1) JP5374639B2 (enExample)
KR (1) KR101579640B1 (enExample)
CN (1) CN102422172B (enExample)
TW (1) TWI428619B (enExample)
WO (1) WO2010129627A2 (enExample)

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AT507322B1 (de) * 2008-10-07 2011-07-15 Nanoident Technologies Ag Schaltvorrichtung zur elektrischen kontaktprüfung
US8742782B2 (en) * 2011-07-27 2014-06-03 International Business Machines Corporation Noncontact electrical testing with optical techniques
EP3174723A4 (en) 2014-07-31 2018-05-16 Hewlett-Packard Development Company, L.P. Ion writing calibration
US9523735B2 (en) * 2014-10-08 2016-12-20 Eastman Kodak Company Electrical test system with vision-guided alignment
TWM534337U (en) * 2015-11-18 2016-12-21 Oriental Inst Technology Electrical test equipment for flexible material
US9806828B2 (en) 2016-02-24 2017-10-31 Frontier Engineering, Llc Radio frequency generator automated test system
CN109375085A (zh) * 2018-09-03 2019-02-22 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） 非接触式板级电路中功率器件健康监测及预警系统与方法
CN111337079A (zh) * 2020-03-20 2020-06-26 深圳市同创鑫电子有限公司 一种印刷电路板生产用测试检查方法
CN115683571B (zh) * 2022-10-31 2024-10-22 苏州工业园区精泰达自动化有限公司 智能手表亮屏出厂检测工装

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US3956698A (en) * 1974-02-12 1976-05-11 Westinghouse Electric Corporation Contactless test method for integrated circuits
US4820916A (en) * 1987-05-05 1989-04-11 Simmonds Precision Products Optically powered sensor system
JP2588565B2 (ja) * 1988-02-16 1997-03-05 富士通株式会社 印刷配線板の導通検査装置
JPH02262071A (ja) * 1989-03-31 1990-10-24 Sekisui Chem Co Ltd 導通検査方法
US6156450A (en) * 1997-07-24 2000-12-05 Eveready Battery Company, Inc. Battery tester having printed electronic components
KR20010072835A (ko) * 1998-08-21 2001-07-31 추후제출 전기 회로 및 구성요소의 프린팅
US6300785B1 (en) * 1998-10-20 2001-10-09 International Business Machines Corporation Contact-less probe of semiconductor wafers
US6448802B1 (en) * 1998-12-21 2002-09-10 Intel Corporation Photosensors for testing an integrated circuit
US6147662A (en) * 1999-09-10 2000-11-14 Moore North America, Inc. Radio frequency identification tags and labels
CA2296143A1 (fr) * 2000-01-18 2001-07-18 9071 9410 Quebec Inc. Systeme d'inspection optique
TW501293B (en) * 2001-01-06 2002-09-01 Acer Inc Method and device to raise the battery efficiency of portable electronic device
US6603302B2 (en) * 2001-08-01 2003-08-05 Frank Joseph Prineppi Circuit testers
US6859031B2 (en) * 2002-02-01 2005-02-22 Credence Systems Corporation Apparatus and method for dynamic diagnostic testing of integrated circuits
JP2004341216A (ja) * 2003-05-15 2004-12-02 Seiko Epson Corp 電気光学装置用基板及びその製造方法、並びに該電気光学装置用基板を備えた電気光学装置及び電子機器
US6815973B1 (en) * 2003-06-13 2004-11-09 Xilinx, Inc. Optical testing port and wafer level testing without probe cards
US7057409B2 (en) * 2003-12-16 2006-06-06 Texas Instruments Incorporated Method and apparatus for non-invasively testing integrated circuits
US7215133B2 (en) * 2004-01-30 2007-05-08 International Business Machines Corporation Contactless circuit testing for adaptive wafer processing
JP5178192B2 (ja) * 2004-07-06 2013-04-10 マリミルズ オサケ ユキチュア 電界検出用センサ製品
US20060139041A1 (en) * 2004-12-23 2006-06-29 Nystrom Michael J System and method of testing and utilizing a fluid stream
US7301458B2 (en) * 2005-05-11 2007-11-27 Alien Technology Corporation Method and apparatus for testing RFID devices
US7202691B2 (en) * 2005-05-31 2007-04-10 Semiconductor Diagnostics, Inc. Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers
US20060279297A1 (en) * 2005-06-10 2006-12-14 Nystrom Michael J Contactless area testing apparatus and method utilizing device switching
US7410815B2 (en) * 2005-08-25 2008-08-12 Nanometrics Incorporated Apparatus and method for non-contact assessment of a constituent in semiconductor substrates
US20070130490A1 (en) * 2005-12-02 2007-06-07 Shmuel Silverman Information protection using properties of a printed electronic circuit
US20070234918A1 (en) * 2006-03-31 2007-10-11 Edward Hirahara System and method for making printed electronic circuits using electrophotography
DE102006033713A1 (de) * 2006-05-30 2007-12-06 Osram Opto Semiconductors Gmbh Organisches lichtemittierendes Bauelement, Vorrichtung mit einem organischen lichtemittierenden Bauelement und Beleuchtungseinrichtung sowie Verfahren zur Herstellung eines organischen lichtemittierenden Bauelements
KR100844861B1 (ko) * 2006-08-03 2008-07-09 (주) 파루 전자잉크 제조용 조성물 및 그 제조방법
JP2008052168A (ja) * 2006-08-28 2008-03-06 Toppan Printing Co Ltd 液晶表示装置の製造方法
US20080084678A1 (en) * 2006-10-10 2008-04-10 Motorola, Inc. Printed circuit board and a method for imbedding a battery in a printed circuit board
JP2008149311A (ja) * 2006-11-21 2008-07-03 Ricoh Co Ltd 電子部品製造装置、パターン配線シート、電子デバイスシートおよびシート
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Also Published As

Publication number Publication date
US20100283499A1 (en) 2010-11-11
CN102422172B (zh) 2015-11-25
TWI428619B (zh) 2014-03-01
CN102422172A (zh) 2012-04-18
WO2010129627A2 (en) 2010-11-11
KR20120027319A (ko) 2012-03-21
JP2012526284A (ja) 2012-10-25
US9360519B2 (en) 2016-06-07
WO2010129627A3 (en) 2011-02-24
JP5374639B2 (ja) 2013-12-25
US20130127487A1 (en) 2013-05-23
TW201042274A (en) 2010-12-01
US8378702B2 (en) 2013-02-19

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