KR101532995B1 - 몰리브덴 알릴 착체 및 박막 증착에서의 이의 용도 - Google Patents
몰리브덴 알릴 착체 및 박막 증착에서의 이의 용도 Download PDFInfo
- Publication number
- KR101532995B1 KR101532995B1 KR1020147023665A KR20147023665A KR101532995B1 KR 101532995 B1 KR101532995 B1 KR 101532995B1 KR 1020147023665 A KR1020147023665 A KR 1020147023665A KR 20147023665 A KR20147023665 A KR 20147023665A KR 101532995 B1 KR101532995 B1 KR 101532995B1
- Authority
- KR
- South Korea
- Prior art keywords
- alkyl
- independently
- formula
- ald
- molybdenum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 0 *CCC1=CCCC1 Chemical compound *CCC1=CCCC1 0.000 description 1
- VIQRCOQXIHFJND-UHFFFAOYSA-N C(C1)C2C=CC1CC2 Chemical compound C(C1)C2C=CC1CC2 VIQRCOQXIHFJND-UHFFFAOYSA-N 0.000 description 1
- GCCSCAGHFICSQM-UHFFFAOYSA-N CC(CC1)=C2C=C1C=C2 Chemical compound CC(CC1)=C2C=C1C=C2 GCCSCAGHFICSQM-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F11/00—Compounds containing elements of Groups 6 or 16 of the Periodic Table
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/18—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metallo-organic compounds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45553—Atomic layer deposition [ALD] characterized by the use of precursors specially adapted for ALD
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201261591002P | 2012-01-26 | 2012-01-26 | |
| US61/591,002 | 2012-01-26 | ||
| US201261711770P | 2012-10-10 | 2012-10-10 | |
| US61/711,770 | 2012-10-10 | ||
| PCT/US2013/022260 WO2013112383A1 (en) | 2012-01-26 | 2013-01-18 | Molybdenum allyl complexes and use thereof in thin film deposition |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20140116223A KR20140116223A (ko) | 2014-10-01 |
| KR101532995B1 true KR101532995B1 (ko) | 2015-07-01 |
Family
ID=47722546
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020147023665A Active KR101532995B1 (ko) | 2012-01-26 | 2013-01-18 | 몰리브덴 알릴 착체 및 박막 증착에서의 이의 용도 |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US9175023B2 (enExample) |
| EP (1) | EP2807174B1 (enExample) |
| JP (1) | JP6209168B2 (enExample) |
| KR (1) | KR101532995B1 (enExample) |
| CN (1) | CN104136448B (enExample) |
| IL (1) | IL233786A (enExample) |
| SG (1) | SG11201404375PA (enExample) |
| TW (1) | TWI563112B (enExample) |
| WO (1) | WO2013112383A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10361118B2 (en) | 2016-10-07 | 2019-07-23 | Samsung Electronics Co., Ltd. | Organometallic precursors, methods of forming a layer using the same and methods of manufacturing semiconductor devices using the same |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2644741B1 (en) | 2007-09-14 | 2015-03-04 | Sigma-Aldrich Co. LLC | Methods of preparing titanium containing thin films by atomic layer deposition using monocyclopentadienyl titanium-based precursors |
| EP2462148A1 (en) | 2009-08-07 | 2012-06-13 | Sigma-Aldrich Co. LLC | High molecular weight alkyl-allyl cobalttricarbonyl complexes and use thereof for preparing dielectric thin films |
| CN103097394B (zh) | 2010-08-27 | 2016-03-02 | 辛格玛艾瑞契有限责任公司 | 钼(iv)酰胺前驱物和其在原子层沉积中的用途 |
| US8927748B2 (en) | 2011-08-12 | 2015-01-06 | Sigma-Aldrich Co. Llc | Alkyl-substituted allyl carbonyl metal complexes and use thereof for preparing dielectric thin films |
| JP6209168B2 (ja) | 2012-01-26 | 2017-10-04 | シグマ−アルドリッチ・カンパニー、エルエルシー | モリブデンアリル錯体及び薄膜堆積におけるその使用 |
| WO2015138390A1 (en) | 2014-03-13 | 2015-09-17 | Sigma-Aldrich Co. Llc | Molybdenum silylcyclopentadienyl and silylallyl complexes and use thereof in thin film deposition |
| JP6346115B2 (ja) * | 2015-03-24 | 2018-06-20 | 東芝メモリ株式会社 | パターン形成方法 |
| JP2019510877A (ja) * | 2016-02-19 | 2019-04-18 | メルク パテント ゲゼルシャフト ミット ベシュレンクテル ハフツングMerck Patent Gesellschaft mit beschraenkter Haftung | モリブデンカルボニル前駆体を使用したモリブデン薄膜の蒸着 |
| US10573522B2 (en) | 2016-08-16 | 2020-02-25 | Lam Research Corporation | Method for preventing line bending during metal fill process |
| JP2022031988A (ja) * | 2018-11-08 | 2022-02-24 | 株式会社Adeka | 原子層堆積法による金属ルテニウム薄膜の製造方法 |
| KR102355507B1 (ko) * | 2018-11-14 | 2022-01-27 | (주)디엔에프 | 몰리브덴 함유 박막의 제조방법 및 이로부터 제조된 몰리브덴함유 박막 |
| CN113169056A (zh) | 2018-11-19 | 2021-07-23 | 朗姆研究公司 | 用于钨的钼模板 |
| CN116970925A (zh) | 2019-01-28 | 2023-10-31 | 朗姆研究公司 | 金属膜的沉积 |
| WO2020185618A1 (en) | 2019-03-11 | 2020-09-17 | Lam Research Corporation | Precursors for deposition of molybdenum-containing films |
| EP4018471A4 (en) | 2019-08-22 | 2024-01-17 | Lam Research Corporation | Substantially carbon-free molybdenum-containing and tungsten-containing films in semiconductor device manufacturing |
| US12334351B2 (en) | 2019-09-03 | 2025-06-17 | Lam Research Corporation | Molybdenum deposition |
| US12327762B2 (en) | 2019-10-15 | 2025-06-10 | Lam Research Corporation | Molybdenum fill |
| JP7117336B2 (ja) | 2020-01-30 | 2022-08-12 | 株式会社Kokusai Electric | 半導体装置の製造方法、プログラム及び基板処理装置 |
| KR102793252B1 (ko) | 2020-03-25 | 2025-04-08 | 삼성전자주식회사 | 몰리브덴 화합물과 이를 이용한 집적회로 소자의 제조 방법 |
| JP7433132B2 (ja) * | 2020-05-19 | 2024-02-19 | 東京エレクトロン株式会社 | 成膜方法及び成膜装置 |
| US11434254B2 (en) | 2021-01-12 | 2022-09-06 | Applied Materials, Inc. | Dinuclear molybdenum precursors for deposition of molybdenum-containing films |
| US11390638B1 (en) | 2021-01-12 | 2022-07-19 | Applied Materials, Inc. | Molybdenum(VI) precursors for deposition of molybdenum films |
| US11584768B2 (en) * | 2021-01-12 | 2023-02-21 | Applied Materials, Inc. | Arene molybdenum (0) precursors for deposition of molybdenum films |
| US11459347B2 (en) | 2021-01-12 | 2022-10-04 | Applied Materials, Inc. | Molybdenum(IV) and molybdenum(III) precursors for deposition of molybdenum films |
| JP7686761B2 (ja) | 2021-02-23 | 2025-06-02 | ラム リサーチ コーポレーション | 3d-nand用の酸化物表面上へのモリブデン膜の堆積 |
| JP2024514605A (ja) | 2021-04-14 | 2024-04-02 | ラム リサーチ コーポレーション | モリブデンの堆積 |
| US11760768B2 (en) | 2021-04-21 | 2023-09-19 | Applied Materials, Inc. | Molybdenum(0) precursors for deposition of molybdenum films |
| KR20240008230A (ko) | 2021-05-14 | 2024-01-18 | 램 리써치 코포레이션 | 고 선택도 도핑된 하드마스크 막들 |
| JP7880961B2 (ja) * | 2021-11-10 | 2026-06-26 | インテグリス・インコーポレーテッド | モリブデン前駆体化合物 |
| KR102731418B1 (ko) * | 2021-12-13 | 2024-11-19 | (주)디엔에프 | 몰리브데넘 화합물, 이의 제조방법 및 이를 포함하는 박막의 제조방법 |
| US12595556B2 (en) | 2023-03-02 | 2026-04-07 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Molybdenum imido alkyl/allyl complexes for deposition of molybdenum-containing films |
| JP2025031687A (ja) * | 2023-08-24 | 2025-03-07 | ダイキン工業株式会社 | 金属錯体 |
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| US5089536A (en) * | 1982-11-22 | 1992-02-18 | Minnesota Mining And Manufacturing Company | Energy polmerizable compositions containing organometallic initiators |
| JPH07107190B2 (ja) | 1984-03-30 | 1995-11-15 | キヤノン株式会社 | 光化学気相成長方法 |
| US5064686A (en) * | 1990-10-29 | 1991-11-12 | Olin Corporation | Sub-valent molybdenum, tungsten, and chromium amides as sources for thermal chemical vapor deposition of metal-containing films |
| GB9929279D0 (en) | 1999-12-11 | 2000-02-02 | Epichem Ltd | An improved method of and apparatus for the delivery of precursors in the vapour phase to a plurality of epitaxial reactor sites |
| GB0017968D0 (en) | 2000-07-22 | 2000-09-13 | Epichem Ltd | An improved process and apparatus for the isolation of pure,or substantially pure,organometallic compounds |
| JP4472338B2 (ja) | 2001-10-26 | 2010-06-02 | シグマ−アルドリッチ・カンパニー | 化学気相成長のための改良された前駆体 |
| KR20110118735A (ko) | 2003-03-17 | 2011-10-31 | 시그마-알드리치컴퍼니 | 금속 옥사이드층 또는 금속 옥사이드 필름 증착용 전구체 |
| CA2560212A1 (en) * | 2004-03-18 | 2005-09-22 | Ibet-Instituto De Biologia Experimental E Tecnologica | Compositions comprising organometallic molybdenum compounds for treating cancer |
| GB0412790D0 (en) | 2004-06-08 | 2004-07-14 | Epichem Ltd | Precursors for deposition of silicon nitride,silicon oxynitride and metal silicon oxynitrides |
| GB2432363B (en) | 2005-11-16 | 2010-06-23 | Epichem Ltd | Hafnocene and zirconocene precursors, and use thereof in atomic layer deposition |
| DE102006000823A1 (de) * | 2006-01-05 | 2007-07-12 | H. C. Starck Gmbh & Co. Kg | Wolfram- und Molybdän-Verbindungen und ihre Verwendung für die Chemical Vapour Deposition (CVD) |
| JP5108319B2 (ja) * | 2007-02-01 | 2012-12-26 | 昭和シェル石油株式会社 | 有機モリブデン化合物よりなる摩擦調整剤およびそれを含む潤滑組成物 |
| JP5108318B2 (ja) * | 2007-02-01 | 2012-12-26 | 昭和シェル石油株式会社 | 新規な有機モリブデン化合物 |
| TWI425110B (zh) | 2007-07-24 | 2014-02-01 | 辛格瑪艾瑞契公司 | 以化學相沉積法製造含金屬薄膜之方法 |
| TWI382987B (zh) | 2007-07-24 | 2013-01-21 | Sigma Aldrich Co | 應用於化學相沉積製程的有機金屬前驅物 |
| EP2644741B1 (en) | 2007-09-14 | 2015-03-04 | Sigma-Aldrich Co. LLC | Methods of preparing titanium containing thin films by atomic layer deposition using monocyclopentadienyl titanium-based precursors |
| EP2191034B1 (en) | 2007-09-14 | 2013-03-13 | Sigma-Aldrich Co. LLC | Methods of preparing thin films by atomic layer deposition using monocyclopentadienyl triamino zirconium precursors |
| TW200944535A (en) | 2008-03-20 | 2009-11-01 | Sigma Aldrich Co | Purification and preparation of phosphorus-containing compounds |
| WO2009143452A1 (en) | 2008-05-23 | 2009-11-26 | Sigma-Aldrich Co. | High-k dielectric films and methods of producing using cerium-based precursors |
| TW200949939A (en) | 2008-05-23 | 2009-12-01 | Sigma Aldrich Co | High-k dielectric films and methods of producing using titanium-based β -diketonate precursors |
| TW200949006A (en) | 2008-05-23 | 2009-12-01 | Sigma Aldrich Co | High-k dielectric films and methods of producing using titanium-based precursors |
| TWI467045B (zh) | 2008-05-23 | 2015-01-01 | Sigma Aldrich Co | 高介電常數電介質薄膜與使用鈰基前驅物製造高介電常數電介質薄膜之方法 |
| TW200951241A (en) | 2008-05-30 | 2009-12-16 | Sigma Aldrich Co | Methods of forming ruthenium-containing films by atomic layer deposition |
| TW201014924A (en) | 2008-06-20 | 2010-04-16 | Sigma Aldrich Co | Hafnium and zirconium pyrrolyl-based organometallic precursors and use thereof for preparing dielectric thin films |
| JP2012533909A (ja) | 2009-07-21 | 2012-12-27 | シグマ−アルドリッチ・カンパニー、エルエルシー | チタン含有組成物およびこの組成物のチタン含有薄膜形成のための使用方法 |
| EP2462148A1 (en) | 2009-08-07 | 2012-06-13 | Sigma-Aldrich Co. LLC | High molecular weight alkyl-allyl cobalttricarbonyl complexes and use thereof for preparing dielectric thin films |
| WO2011115878A1 (en) | 2010-03-19 | 2011-09-22 | Sigma-Aldrich Co. | Methods for preparing thin fillms by atomic layer deposition using hydrazines |
| CN103097394B (zh) | 2010-08-27 | 2016-03-02 | 辛格玛艾瑞契有限责任公司 | 钼(iv)酰胺前驱物和其在原子层沉积中的用途 |
| US8927748B2 (en) | 2011-08-12 | 2015-01-06 | Sigma-Aldrich Co. Llc | Alkyl-substituted allyl carbonyl metal complexes and use thereof for preparing dielectric thin films |
| JP6209168B2 (ja) | 2012-01-26 | 2017-10-04 | シグマ−アルドリッチ・カンパニー、エルエルシー | モリブデンアリル錯体及び薄膜堆積におけるその使用 |
-
2013
- 2013-01-18 JP JP2014554752A patent/JP6209168B2/ja active Active
- 2013-01-18 WO PCT/US2013/022260 patent/WO2013112383A1/en not_active Ceased
- 2013-01-18 EP EP13704845.0A patent/EP2807174B1/en not_active Not-in-force
- 2013-01-18 US US14/374,289 patent/US9175023B2/en active Active
- 2013-01-18 SG SG11201404375PA patent/SG11201404375PA/en unknown
- 2013-01-18 KR KR1020147023665A patent/KR101532995B1/ko active Active
- 2013-01-18 CN CN201380010800.5A patent/CN104136448B/zh active Active
- 2013-01-24 TW TW102102711A patent/TWI563112B/zh active
-
2014
- 2014-07-24 IL IL233786A patent/IL233786A/en active IP Right Grant
Non-Patent Citations (2)
| Title |
|---|
| J. Mater. Sci. 2012, 47, 2057-2071 * |
| Science of Synthesis, 2003, 229-281 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10361118B2 (en) | 2016-10-07 | 2019-07-23 | Samsung Electronics Co., Ltd. | Organometallic precursors, methods of forming a layer using the same and methods of manufacturing semiconductor devices using the same |
| US11062940B2 (en) | 2016-10-07 | 2021-07-13 | Samsung Electronics Co., Ltd. | Organometallic precursors, methods of forming a layer using the same and methods of manufacturing semiconductor devices using the same |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2015510502A (ja) | 2015-04-09 |
| TW201335415A (zh) | 2013-09-01 |
| SG11201404375PA (en) | 2014-10-30 |
| CN104136448B (zh) | 2015-12-02 |
| CN104136448A (zh) | 2014-11-05 |
| JP6209168B2 (ja) | 2017-10-04 |
| WO2013112383A1 (en) | 2013-08-01 |
| KR20140116223A (ko) | 2014-10-01 |
| US20140370192A1 (en) | 2014-12-18 |
| EP2807174A1 (en) | 2014-12-03 |
| IL233786A0 (en) | 2014-09-30 |
| IL233786A (en) | 2017-02-28 |
| US9175023B2 (en) | 2015-11-03 |
| TWI563112B (en) | 2016-12-21 |
| EP2807174B1 (en) | 2016-03-30 |
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