KR101078651B1 - 곡면 부재 계측 시스템 및 방법 - Google Patents

곡면 부재 계측 시스템 및 방법 Download PDF

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Publication number
KR101078651B1
KR101078651B1 KR1020080087411A KR20080087411A KR101078651B1 KR 101078651 B1 KR101078651 B1 KR 101078651B1 KR 1020080087411 A KR1020080087411 A KR 1020080087411A KR 20080087411 A KR20080087411 A KR 20080087411A KR 101078651 B1 KR101078651 B1 KR 101078651B1
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KR
South Korea
Prior art keywords
boundary
laser beam
measurement
curved member
internal
Prior art date
Application number
KR1020080087411A
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English (en)
Korean (ko)
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KR20100028391A (ko
Inventor
김성진
권기연
노동기
이시열
Original Assignee
삼성중공업 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 삼성중공업 주식회사 filed Critical 삼성중공업 주식회사
Priority to KR1020080087411A priority Critical patent/KR101078651B1/ko
Priority to JP2009144001A priority patent/JP5001330B2/ja
Priority to CN2009101523119A priority patent/CN101666629B/zh
Publication of KR20100028391A publication Critical patent/KR20100028391A/ko
Application granted granted Critical
Publication of KR101078651B1 publication Critical patent/KR101078651B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
KR1020080087411A 2008-09-04 2008-09-04 곡면 부재 계측 시스템 및 방법 KR101078651B1 (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1020080087411A KR101078651B1 (ko) 2008-09-04 2008-09-04 곡면 부재 계측 시스템 및 방법
JP2009144001A JP5001330B2 (ja) 2008-09-04 2009-06-17 曲面部材計測システム及び方法
CN2009101523119A CN101666629B (zh) 2008-09-04 2009-06-24 测量曲面的系统和方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020080087411A KR101078651B1 (ko) 2008-09-04 2008-09-04 곡면 부재 계측 시스템 및 방법

Publications (2)

Publication Number Publication Date
KR20100028391A KR20100028391A (ko) 2010-03-12
KR101078651B1 true KR101078651B1 (ko) 2011-11-01

Family

ID=41803353

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020080087411A KR101078651B1 (ko) 2008-09-04 2008-09-04 곡면 부재 계측 시스템 및 방법

Country Status (3)

Country Link
JP (1) JP5001330B2 (ja)
KR (1) KR101078651B1 (ja)
CN (1) CN101666629B (ja)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101236930B1 (ko) * 2010-08-31 2013-02-25 삼성중공업 주식회사 곡면 부재 계측 방법
CN102072717B (zh) * 2010-11-12 2012-11-07 北京信息科技大学 螺旋曲面的边界获取方法及装置
CN102435150B (zh) 2011-09-15 2013-07-24 湘潭电机股份有限公司 碟式抛物面反射镜面曲面精度的检测方法和装置
CN103090820A (zh) * 2013-02-05 2013-05-08 中核(天津)科技发展有限公司 宝石轴承曲率半径的检测装置
CN103234905B (zh) * 2013-04-10 2014-12-17 浙江大学 用于球状水果无冗余图像信息获取的方法和装置
KR101540179B1 (ko) * 2014-05-02 2015-07-28 주식회사 에이치비테크놀러지 경로 알고리즘을 이용한 리뷰(Review) 측정방법
CN109870126A (zh) * 2017-12-05 2019-06-11 宁波盈芯信息科技有限公司 一种面积计算方法以及一种能够进行面积计算的手机
CN114719792B (zh) * 2022-03-25 2022-12-13 北京城建设计发展集团股份有限公司 预制构件拼装面智能扫描和误差自动标识系统及方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100292610B1 (ko) 1998-06-01 2002-01-12 추호석 카메라와레이저변위센서를혼합한비접촉식선박용곡판부재계측장치

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0712534A (ja) * 1993-04-26 1995-01-17 Koyo Seiko Co Ltd ３次元形状測定装置
JP3162983B2 (ja) * 1995-12-01 2001-05-08 日本鋼管株式会社 船体外板の自動加熱曲げ加工方法
EP2224204B1 (de) * 2004-12-16 2021-05-26 Werth Messtechnik GmbH Verfahren zum Messen von Werkstückgeometrien mit einem Koordinatenmessgerät
CA2600926C (en) * 2005-03-11 2009-06-09 Creaform Inc. Auto-referenced system and apparatus for three-dimensional scanning

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100292610B1 (ko) 1998-06-01 2002-01-12 추호석 카메라와레이저변위센서를혼합한비접촉식선박용곡판부재계측장치

Also Published As

Publication number Publication date
JP5001330B2 (ja) 2012-08-15
CN101666629A (zh) 2010-03-10
KR20100028391A (ko) 2010-03-12
JP2010060556A (ja) 2010-03-18
CN101666629B (zh) 2011-07-13

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