KR101034753B1 - 동시에 발생하며 근접한 투과 및 후방 산란 영상화를 이용한 엑스레이 검사 - Google Patents
동시에 발생하며 근접한 투과 및 후방 산란 영상화를 이용한 엑스레이 검사 Download PDFInfo
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- KR101034753B1 KR101034753B1 KR1020097002704A KR20097002704A KR101034753B1 KR 101034753 B1 KR101034753 B1 KR 101034753B1 KR 1020097002704 A KR1020097002704 A KR 1020097002704A KR 20097002704 A KR20097002704 A KR 20097002704A KR 101034753 B1 KR101034753 B1 KR 101034753B1
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- 230000005540 biological transmission Effects 0.000 title claims abstract description 56
- 238000007689 inspection Methods 0.000 title claims abstract description 13
- 238000003384 imaging method Methods 0.000 title abstract description 43
- 230000005855 radiation Effects 0.000 claims abstract description 47
- 238000000034 method Methods 0.000 claims description 25
- 230000000149 penetrating effect Effects 0.000 claims description 19
- 239000012634 fragment Substances 0.000 claims description 11
- 238000001514 detection method Methods 0.000 claims description 6
- 239000000126 substance Substances 0.000 claims description 2
- 238000005259 measurement Methods 0.000 claims 12
- 230000003213 activating effect Effects 0.000 claims 1
- 238000003491 array Methods 0.000 abstract description 3
- 238000012545 processing Methods 0.000 abstract description 3
- 238000013461 design Methods 0.000 abstract description 2
- 230000009977 dual effect Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000004888 barrier function Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 208000032366 Oversensing Diseases 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000000593 degrading effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005251 gamma ray Effects 0.000 description 1
- 230000005541 medical transmission Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000005416 organic matter Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- High Energy & Nuclear Physics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geophysics (AREA)
- Theoretical Computer Science (AREA)
- Radiology & Medical Imaging (AREA)
- Pulmonology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US82216206P | 2006-08-11 | 2006-08-11 | |
| US60/822,162 | 2006-08-11 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020107004752A Division KR101263067B1 (ko) | 2006-08-11 | 2007-08-07 | 물체 검사용 시스템 및 물체 검사 방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20090046827A KR20090046827A (ko) | 2009-05-11 |
| KR101034753B1 true KR101034753B1 (ko) | 2011-05-17 |
Family
ID=38920709
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020097002704A Active KR101034753B1 (ko) | 2006-08-11 | 2007-08-07 | 동시에 발생하며 근접한 투과 및 후방 산란 영상화를 이용한 엑스레이 검사 |
| KR1020107004752A Active KR101263067B1 (ko) | 2006-08-11 | 2007-08-07 | 물체 검사용 시스템 및 물체 검사 방법 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020107004752A Active KR101263067B1 (ko) | 2006-08-11 | 2007-08-07 | 물체 검사용 시스템 및 물체 검사 방법 |
Country Status (13)
| Country | Link |
|---|---|
| US (2) | US7555099B2 (enExample) |
| EP (1) | EP2049888B1 (enExample) |
| JP (2) | JP4688955B2 (enExample) |
| KR (2) | KR101034753B1 (enExample) |
| CN (1) | CN101501477B (enExample) |
| ES (1) | ES2474200T3 (enExample) |
| IL (2) | IL196967A (enExample) |
| MX (1) | MX2009001529A (enExample) |
| MY (2) | MY142674A (enExample) |
| PL (1) | PL2049888T3 (enExample) |
| RU (2) | RU2448342C2 (enExample) |
| SG (1) | SG165402A1 (enExample) |
| WO (1) | WO2008021807A2 (enExample) |
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Also Published As
| Publication number | Publication date |
|---|---|
| KR20090046827A (ko) | 2009-05-11 |
| CN101501477A (zh) | 2009-08-05 |
| RU2009108663A (ru) | 2010-09-20 |
| JP4688955B2 (ja) | 2011-05-25 |
| MY146301A (en) | 2012-07-31 |
| IL196967A0 (en) | 2009-11-18 |
| RU2011148960A (ru) | 2013-06-10 |
| RU2499251C2 (ru) | 2013-11-20 |
| JP5303508B2 (ja) | 2013-10-02 |
| WO2008021807A2 (en) | 2008-02-21 |
| US20090268871A1 (en) | 2009-10-29 |
| US7555099B2 (en) | 2009-06-30 |
| US7995707B2 (en) | 2011-08-09 |
| EP2049888B1 (en) | 2014-05-14 |
| KR20100044242A (ko) | 2010-04-29 |
| MY142674A (en) | 2010-12-15 |
| EP2049888A2 (en) | 2009-04-22 |
| JP2010500576A (ja) | 2010-01-07 |
| IL196967A (en) | 2012-10-31 |
| IL221892A (en) | 2015-04-30 |
| JP2010181424A (ja) | 2010-08-19 |
| SG165402A1 (en) | 2010-10-28 |
| KR101263067B1 (ko) | 2013-05-09 |
| PL2049888T3 (pl) | 2014-08-29 |
| ES2474200T3 (es) | 2014-07-08 |
| RU2448342C2 (ru) | 2012-04-20 |
| WO2008021807A3 (en) | 2008-04-17 |
| MX2009001529A (es) | 2009-02-18 |
| US20080037707A1 (en) | 2008-02-14 |
| CN101501477B (zh) | 2014-07-02 |
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