KR101034753B1 - 동시에 발생하며 근접한 투과 및 후방 산란 영상화를 이용한 엑스레이 검사 - Google Patents

동시에 발생하며 근접한 투과 및 후방 산란 영상화를 이용한 엑스레이 검사 Download PDF

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KR101034753B1
KR101034753B1 KR1020097002704A KR20097002704A KR101034753B1 KR 101034753 B1 KR101034753 B1 KR 101034753B1 KR 1020097002704 A KR1020097002704 A KR 1020097002704A KR 20097002704 A KR20097002704 A KR 20097002704A KR 101034753 B1 KR101034753 B1 KR 101034753B1
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fan beam
radiation
detector
scattering
light source
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KR20090046827A (ko
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피터 제이. 로스차일드
제프리 알. 슈버트
아론 디. 페일즈
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아메리칸 사이언스 앤 엔지니어링, 인크.
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph

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  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
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  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
KR1020097002704A 2006-08-11 2007-08-07 동시에 발생하며 근접한 투과 및 후방 산란 영상화를 이용한 엑스레이 검사 Active KR101034753B1 (ko)

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US82216206P 2006-08-11 2006-08-11
US60/822,162 2006-08-11

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KR1020107004752A Active KR101263067B1 (ko) 2006-08-11 2007-08-07 물체 검사용 시스템 및 물체 검사 방법

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US (2) US7555099B2 (enExample)
EP (1) EP2049888B1 (enExample)
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KR (2) KR101034753B1 (enExample)
CN (1) CN101501477B (enExample)
ES (1) ES2474200T3 (enExample)
IL (2) IL196967A (enExample)
MX (1) MX2009001529A (enExample)
MY (2) MY146301A (enExample)
PL (1) PL2049888T3 (enExample)
RU (2) RU2499251C2 (enExample)
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12626484B2 (en) 2023-09-19 2026-05-12 Electronics And Telecommunications Research Institute Apparatus and method for identifying and displaying material types using multi-energy X-ray backscattering

Families Citing this family (120)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8503605B2 (en) 2002-07-23 2013-08-06 Rapiscan Systems, Inc. Four sided imaging system and method for detection of contraband
US9958569B2 (en) 2002-07-23 2018-05-01 Rapiscan Systems, Inc. Mobile imaging system and method for detection of contraband
US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
US8275091B2 (en) 2002-07-23 2012-09-25 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US8243876B2 (en) 2003-04-25 2012-08-14 Rapiscan Systems, Inc. X-ray scanners
GB0525593D0 (en) 2005-12-16 2006-01-25 Cxr Ltd X-ray tomography inspection systems
US8223919B2 (en) 2003-04-25 2012-07-17 Rapiscan Systems, Inc. X-ray tomographic inspection systems for the identification of specific target items
US6928141B2 (en) 2003-06-20 2005-08-09 Rapiscan, Inc. Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers
US7856081B2 (en) 2003-09-15 2010-12-21 Rapiscan Systems, Inc. Methods and systems for rapid detection of concealed objects using fluorescence
US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
US7526064B2 (en) 2006-05-05 2009-04-28 Rapiscan Security Products, Inc. Multiple pass cargo inspection system
US7499523B2 (en) * 2006-08-02 2009-03-03 General Electric Company Systems and methods for identifying a substance
PL2049888T3 (pl) * 2006-08-11 2014-08-29 American Science & Eng Inc Badanie z wykorzystaniem promieniowania rentgenowskiego z równoczesną i proksymalną transmisją i obrazowanie rozpraszania wstecznego
US8552858B2 (en) * 2007-02-27 2013-10-08 Koninklijke Philips N.V. Simulation and visualization of scattered radiation
US7742568B2 (en) 2007-06-09 2010-06-22 Spectrum San Diego, Inc. Automobile scanning system
US8532259B2 (en) 2008-04-17 2013-09-10 University Of Florida Research Foundation, Inc. Method and apparatus for computed imaging backscatter radiography
GB0809110D0 (en) 2008-05-20 2008-06-25 Rapiscan Security Products Inc Gantry scanner systems
US8530849B2 (en) * 2008-09-22 2013-09-10 Telesecurity Sciences, Inc. Electron beam scanner
US8625738B2 (en) * 2008-09-22 2014-01-07 Telesecurity Sciences, Inc. Radiation therapy and scanning system
US7835495B2 (en) * 2008-10-31 2010-11-16 Morpho Detection, Inc. System and method for X-ray diffraction imaging
US9310323B2 (en) 2009-05-16 2016-04-12 Rapiscan Systems, Inc. Systems and methods for high-Z threat alarm resolution
US8633823B2 (en) * 2009-05-16 2014-01-21 Rapiscan Systems, Inc. Systems and methods for automated, rapid detection of high-atomic-number materials
GB2483830C (en) * 2009-07-13 2017-04-26 Rapiscan Systems Inc Four-sided imaging system and method for detecting of contraband
US8314394B1 (en) 2009-11-04 2012-11-20 Science Applications International Corporation System and method for three-dimensional imaging using scattering from annihilation coincidence photons
US8705694B2 (en) * 2009-11-11 2014-04-22 Physical Optics Corporation X-ray imaging system and method
WO2011059545A2 (en) * 2009-11-11 2011-05-19 Physical Optics Corporation X-ray imaging system and method
KR100956797B1 (ko) * 2009-11-19 2010-05-07 (주)자비스 판상패드용 엑스레이검사장치
US10393915B2 (en) 2010-02-25 2019-08-27 Rapiscan Systems, Inc. Integrated primary and special nuclear material alarm resolution
CN102884422B (zh) * 2010-02-25 2016-09-28 拉皮斯坎系统股份有限公司 用以确定物质的原子序数的、高能量x射线的基于光谱学的检查系统和方法
US8766764B2 (en) 2010-09-23 2014-07-01 Rapiscan Systems, Inc. Automated personnel screening system and method
US9055886B1 (en) 2011-01-05 2015-06-16 Sandia Corporation Automatic tool alignment in a backscatter x-ray scanning system
ES2729705T3 (es) 2011-01-07 2019-11-05 Huron Valley Steel Corp Sistema de clasificación de chatarra
US8908831B2 (en) 2011-02-08 2014-12-09 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
EP2673660B1 (en) 2011-02-08 2017-08-30 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
MX2013009142A (es) 2011-02-08 2013-10-01 American Science & Eng Inc Analisis de energia de retrodispersion para la clasificacion de materiales basado en no conmutatividad posicional.
MX2013011843A (es) * 2011-04-15 2013-11-01 American Science & Eng Inc Metodos para realizar inspecciones de retrodispersion de objetivos en espacios confinados.
CN102183533B (zh) * 2011-05-24 2013-04-24 深圳市鑫源通电子有限公司 一种通道式x射线安全检查方法及装置
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
EP2742779B1 (en) 2011-06-09 2017-04-26 Rapiscan Systems, Inc. System and method for x-ray source weight reduction
CA3069211C (en) 2011-09-07 2022-06-21 Rapiscan Systems, Inc. X-ray inspection system that integrates manifest data with imaging/detection processing
EP2773929B1 (en) * 2011-11-04 2023-12-13 IMEC vzw Spectral camera with mosaic of filters for each image pixel
IN2014CN02916A (enExample) * 2011-11-04 2015-07-03 Imec
PL3242315T3 (pl) 2012-02-03 2024-02-19 Rapiscan Systems, Inc. Rentgenowski układ inspekcyjny do skanowania obiektu
CA3080221A1 (en) 2012-02-14 2013-08-22 American Science And Engineering, Inc. X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors
US10670740B2 (en) 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
US9709514B2 (en) * 2012-04-02 2017-07-18 The Boeing Company X-ray backscatter system and method for detecting discrepancies in items
CN102707324B (zh) * 2012-05-21 2015-01-21 貊梁 一种x射线反散射和透射的组合式安全检测仪
KR101378757B1 (ko) 2012-08-30 2014-03-27 한국원자력연구원 물질 원소 정보 획득 및 영상 차원의 선택이 가능한 방사선 영상화 장치
US8983234B2 (en) 2012-09-28 2015-03-17 Varian Medical Systems, Inc. Method and apparatus pertaining to using imaging information to identify a spectrum
FR3000211B1 (fr) 2012-12-20 2015-12-11 Commissariat Energie Atomique Dispositif d'eclairage par balayage , dispositif d'imagerie le comportant et procede de mise en oeurvre
US9823383B2 (en) 2013-01-07 2017-11-21 Rapiscan Systems, Inc. X-ray scanner with partial energy discriminating detector array
CA2898654C (en) 2013-01-31 2020-02-25 Rapiscan Systems, Inc. Portable security inspection system
WO2015020710A2 (en) * 2013-05-09 2015-02-12 Rapiscan Systems, Inc. Integrated primary and special nuclear material alarm resolution
BR112016001572A2 (pt) 2013-07-23 2020-08-25 Rapiscan Systems, Inc. Métodos para melhorar a velocidade de processamento para a inspeção de objeto
US10261212B2 (en) * 2013-07-25 2019-04-16 Analogic Corporation Generation of diffraction signature of item within object
CN103728324B (zh) * 2013-12-18 2016-08-17 中国原子能科学研究院 一种核燃料组件高能x射线无损检测装置
CN104374783B (zh) * 2013-12-26 2017-06-16 清华大学 Ct系统及其方法
US9557427B2 (en) 2014-01-08 2017-01-31 Rapiscan Systems, Inc. Thin gap chamber neutron detectors
US11280898B2 (en) 2014-03-07 2022-03-22 Rapiscan Systems, Inc. Radar-based baggage and parcel inspection systems
US9851312B2 (en) * 2014-05-07 2017-12-26 The Boeing Company Backscatter inspection systems, and related methods
WO2015175751A1 (en) 2014-05-16 2015-11-19 American Science And Engineering, Inc. Source for intra-pulse multi-energy x-ray cargo inspection
US11266006B2 (en) 2014-05-16 2022-03-01 American Science And Engineering, Inc. Method and system for timing the injections of electron beams in a multi-energy x-ray cargo inspection system
US10228487B2 (en) 2014-06-30 2019-03-12 American Science And Engineering, Inc. Rapidly relocatable modular cargo container scanner
CN105445808B (zh) * 2014-08-19 2018-10-02 清华大学 对移动目标进行检查的设备及方法
WO2016026442A1 (zh) 2014-08-19 2016-02-25 清华大学 对移动目标进行检查的设备及方法
CN105374654B (zh) 2014-08-25 2018-11-06 同方威视技术股份有限公司 电子源、x射线源、使用了该x射线源的设备
CN105372269B (zh) * 2014-09-02 2019-01-15 同方威视技术股份有限公司 X射线产品质量自动检测装置
CN105445290A (zh) * 2014-09-02 2016-03-30 同方威视技术股份有限公司 X射线产品质量在线检测装置
EP3221722B1 (en) 2014-11-20 2026-07-15 Viken Detection Corporation X-ray scanning system and method
AU2015353439A1 (en) 2014-11-25 2017-06-29 Rapiscan Systems, Inc. Intelligent security management system
CN104535594A (zh) * 2015-01-08 2015-04-22 安徽中福光电科技有限公司 基于x射线+dr+cbs的箱包安检方法和智能化x光机
US9739727B2 (en) * 2015-01-21 2017-08-22 The Boeing Company Systems and methods for aligning an aperture
WO2016154044A1 (en) 2015-03-20 2016-09-29 Rapiscan Systems, Inc. Hand-held portable backscatter inspection system
US10955367B2 (en) 2015-09-08 2021-03-23 American Science And Engineering, Inc. Backscatter imaging for precision agriculture
US11536672B2 (en) 2015-09-08 2022-12-27 American Science And Engineering, Inc. Systems and methods for using backscatter imaging in precision agriculture
HK1257878A1 (zh) 2015-09-10 2019-11-01 American Science And Engineering, Inc. 使用行间自适应电磁x射线扫描的反向散射表徵
US10345479B2 (en) 2015-09-16 2019-07-09 Rapiscan Systems, Inc. Portable X-ray scanner
PL3764280T3 (pl) 2016-02-22 2025-03-17 Rapiscan Systems, Inc. Sposoby weryfikacji typów kontenerów
US10185052B2 (en) 2016-12-19 2019-01-22 Baker Hughes, A Ge Company, Llc Constrained backscatter gamma ray casing and cement inspection tool
CN110199373B (zh) 2017-01-31 2021-09-28 拉皮斯坎系统股份有限公司 大功率x射线源与操作方法
US10770195B2 (en) * 2017-04-05 2020-09-08 Viken Detection Corporation X-ray chopper wheel assembly
EP3612096A4 (en) 2017-04-17 2020-12-23 Rapiscan Systems, Inc. X-RAY TOMOGRAPHIC INSPECTION SYSTEMS AND METHODS
CN107991327B (zh) 2018-01-05 2021-02-09 同方威视技术股份有限公司 安检系统和方法
JP6629372B2 (ja) * 2018-03-15 2020-01-15 日本信号株式会社 放射線検査装置及び手荷物検査装置
CN112424644A (zh) 2018-06-20 2021-02-26 美国科学及工程股份有限公司 波长偏移片耦合的闪烁检测器
CN110907481B (zh) * 2018-09-18 2025-03-21 同方威视技术股份有限公司 一种x射线的检测系统和检测方法
CN109142404B (zh) * 2018-11-01 2024-06-11 同方威视技术股份有限公司 背散射成像系统、扫描检查系统和背散射图像成像方法
CA3149539A1 (en) 2019-09-16 2021-03-25 Voti Inc. Probabilistic image analysis
US11594001B2 (en) 2020-01-20 2023-02-28 Rapiscan Systems, Inc. Methods and systems for generating three-dimensional images that enable improved visualization and interaction with objects in the three-dimensional images
US11212902B2 (en) 2020-02-25 2021-12-28 Rapiscan Systems, Inc. Multiplexed drive systems and methods for a multi-emitter X-ray source
US11193898B1 (en) 2020-06-01 2021-12-07 American Science And Engineering, Inc. Systems and methods for controlling image contrast in an X-ray system
CN115697202B (zh) 2020-06-01 2025-08-08 美国科学及工程股份有限公司 用于在x射线系统中控制图像对比度的系统和方法
CN115698774A (zh) 2020-06-02 2023-02-03 维肯检测公司 X射线成像设备和方法
US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
US12442779B2 (en) 2020-07-06 2025-10-14 Smiths Detection, Inc. Systems and methods for inspection portals
CN113970567B (zh) * 2020-07-22 2023-01-31 同方威视技术股份有限公司 背散射成像装置、控制方法及检查系统
US11340361B1 (en) 2020-11-23 2022-05-24 American Science And Engineering, Inc. Wireless transmission detector panel for an X-ray scanner
EP4298433A4 (en) 2021-02-23 2025-01-08 Rapiscan Systems, Inc. SYSTEMS AND METHODS FOR ELIMINATING CROSSTALK SIGNALS IN SCANNING SYSTEMS HAVING MULTIPLE X-RAY SOURCES
US12450719B2 (en) 2021-07-13 2025-10-21 Rapiscan Systems, Inc. Image inspection systems and methods for integrating third party artificial intelligence platforms
US12019035B2 (en) 2021-07-16 2024-06-25 Rapiscan Holdings, Inc. Material detection in x-ray security screening
GB2624336B (en) 2021-09-07 2026-03-04 Rapiscan Systems Inc Methods and systems for accurate visual layer separation in the displays of scanning systems
GB2624599B (en) 2021-10-01 2026-08-05 Rapiscan Holdings Inc Methods and systems for the concurrent generation of multiple substantially similar X-ray beams
US12259341B2 (en) 2021-11-04 2025-03-25 Rapiscan Holdings, Inc. Targeted collimation of detectors using rear collimators
KR102736270B1 (ko) * 2021-12-17 2024-11-29 한국해양과학기술원 컨테이너 위험화물 정밀검색용 후방산란 방사선 영상시스템 및 그의 제어 방법
CN118785948A (zh) 2022-02-03 2024-10-15 拉皮斯坎控股公司 用于x射线线性加速器的实时能量和剂量监测的系统和方法
CN114563426B (zh) * 2022-02-24 2025-08-19 杭州睿影科技有限公司 基于透射成像的检测方法和检测装置以及检测系统
CN114624785B (zh) * 2022-05-16 2022-08-19 天津速通科技有限公司 适用于新型双源混检式通道式安检系统的同光源设置方法
US12474282B2 (en) 2022-05-20 2025-11-18 Rapiscan Holdings, Inc. Systems and a method of improved material classification using energy-integrated backscatter detectors
EP4551976A2 (en) 2022-07-07 2025-05-14 Viken Detection Corporation Rotating hoop chopper wheel for x-ray imagers
WO2024026152A1 (en) 2022-07-26 2024-02-01 Rapiscan Holdings, Inc. Methods and systems for performing on-the-fly automatic calibration adjustments of x-ray inspection systems
CN119948336A (zh) * 2022-08-01 2025-05-06 艾迪康姆有限责任公司 用于确定被检物体的空间轮廓的方法
GB2635466A (en) * 2022-08-01 2025-05-14 Rapiscan Holdings Inc Data and algorithm quality checker for scanning systems
WO2024050199A1 (en) 2022-09-01 2024-03-07 Rapiscan Holdings, Inc. Systems and methods for classification of radiation energy spectra
KR20240079010A (ko) 2022-11-28 2024-06-04 한국해양과학기술원 산란엑스선 영상과 방사선 동시측정용 복합 검색시스템
US12467882B2 (en) 2023-03-17 2025-11-11 Rapiscan Holdings, Inc. Systems and methods for monitoring output energy of a high-energy x-ray source
US12625095B1 (en) 2023-04-11 2026-05-12 Viken Detection Corporation X-ray scanner with blanking
WO2025054551A1 (en) 2023-09-06 2025-03-13 Viken Detection Corporation Multi-view inspection portal with interweaved x-ray beams
KR102657570B1 (ko) 2023-12-27 2024-04-15 한국해양과학기술원 엑스선 영상 획득 및 방사성 물질 검출의 동시 수행을 위한 교차 검색 시스템
CN119575495A (zh) * 2024-12-26 2025-03-07 同方威视技术股份有限公司 辐射检查系统
CN121068658A (zh) * 2025-10-22 2025-12-05 同方威视技术股份有限公司 射线扫描成像系统

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6192104B1 (en) 1998-11-30 2001-02-20 American Science And Engineering, Inc. Fan and pencil beams from a common source for x-ray inspection
US6687326B1 (en) * 2001-04-11 2004-02-03 Analogic Corporation Method of and system for correcting scatter in a computed tomography scanner
US20050185757A1 (en) 2004-02-20 2005-08-25 Kresse David E. Apparatus and method for nonintrusively inspecting an object
US20060151381A1 (en) * 2003-07-01 2006-07-13 Johan Wennerstrom Water filtering device

Family Cites Families (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DK131955C (da) 1973-10-09 1976-02-23 I Leunbach Fremgangsmade og anleg til bestemmelse af elektrontetheden i et delvolumen af et legeme
US4047029A (en) 1976-07-02 1977-09-06 Allport John J Self-compensating X-ray or γ-ray thickness gauge
DE2939146A1 (de) 1979-09-27 1981-04-16 Philips Patentverwaltung Gmbh, 2000 Hamburg Verfahren zur untersuchung eines koerpers mit durchdringender strahlung
US4525854A (en) 1983-03-22 1985-06-25 Troxler Electronic Laboratories, Inc. Radiation scatter apparatus and method
US4768214A (en) 1985-01-16 1988-08-30 American Science And Engineering, Inc. Imaging
DE3764315D1 (de) 1986-05-28 1990-09-20 Heimann Gmbh Roentgenscanner.
US4799247A (en) 1986-06-20 1989-01-17 American Science And Engineering, Inc. X-ray imaging particularly adapted for low Z materials
US4864142A (en) 1988-01-11 1989-09-05 Penetron, Inc. Method and apparatus for the noninvasive interrogation of objects
US5127030A (en) * 1989-02-28 1992-06-30 American Science And Engineering, Inc. Tomographic imaging with improved collimator
US5016173A (en) * 1989-04-13 1991-05-14 Vanguard Imaging Ltd. Apparatus and method for monitoring visually accessible surfaces of the body
DE58906047D1 (de) 1989-08-09 1993-12-02 Heimann Systems Gmbh & Co Vorrichtung zum Durchstrahlen von Gegenständen mittels fächerförmiger Strahlung.
JPH04364454A (ja) * 1991-06-11 1992-12-16 Toshiba Corp 散乱ｘ線測定装置
US5253283A (en) 1991-12-23 1993-10-12 American Science And Engineering, Inc. Inspection method and apparatus with single color pixel imaging
US5430787A (en) 1992-12-03 1995-07-04 The United States Of America As Represented By The Secretary Of Commerce Compton scattering tomography
US5600303A (en) 1993-01-15 1997-02-04 Technology International Incorporated Detection of concealed explosives and contraband
DE4311174C2 (de) 1993-04-05 1996-02-15 Heimann Systems Gmbh & Co Röntgenprüfanlage für Container und Lastkraftwagen
US5428657A (en) 1994-03-22 1995-06-27 Georgia Tech Research Corporation X-ray monitoring system
US5600700A (en) 1995-09-25 1997-02-04 Vivid Technologies, Inc. Detecting explosives or other contraband by employing transmitted and scattered X-rays
US5642393A (en) 1995-09-26 1997-06-24 Vivid Technologies, Inc. Detecting contraband by employing interactive multiprobe tomography
US5764683B1 (en) 1996-02-12 2000-11-21 American Science & Eng Inc Mobile x-ray inspection system for large objects
US5638420A (en) 1996-07-03 1997-06-10 Advanced Research And Applications Corporation Straddle inspection system
WO1998003889A1 (en) 1996-07-22 1998-01-29 American Science And Engineering, Inc. System for rapid x-ray inspection of enclosures
US5763886A (en) 1996-08-07 1998-06-09 Northrop Grumman Corporation Two-dimensional imaging backscatter probe
US5974111A (en) 1996-09-24 1999-10-26 Vivid Technologies, Inc. Identifying explosives or other contraband by employing transmitted or scattered X-rays
US5940468A (en) 1996-11-08 1999-08-17 American Science And Engineering, Inc. Coded aperture X-ray imaging system
JP3878259B2 (ja) * 1996-11-13 2007-02-07 東芝医用システムエンジニアリング株式会社 医用画像処理装置
RU2119660C1 (ru) * 1997-04-08 1998-09-27 Закрытое акционерное общество "Кванта Инвест" Устройство для определения состава и структуры неоднородного объекта (варианты)
US5912460A (en) 1997-03-06 1999-06-15 Schlumberger Technology Corporation Method for determining formation density and formation photo-electric factor with a multi-detector-gamma-ray tool
US5917880A (en) 1997-05-29 1999-06-29 Eg&G Astrophysics X-ray inspection apparatus
WO1999039189A2 (en) * 1998-01-28 1999-08-05 American Science And Engineering, Inc. Gated transmission and scatter detection for x-ray imaging
US6320933B1 (en) 1998-11-30 2001-11-20 American Science And Engineering, Inc. Multiple scatter system for threat identification
US6421420B1 (en) 1998-12-01 2002-07-16 American Science & Engineering, Inc. Method and apparatus for generating sequential beams of penetrating radiation
US6249567B1 (en) 1998-12-01 2001-06-19 American Science & Engineering, Inc. X-ray back scatter imaging system for undercarriage inspection
US6282260B1 (en) 1998-12-14 2001-08-28 American Science & Engineering, Inc. Unilateral hand-held x-ray inspection apparatus
US6459764B1 (en) 1999-01-27 2002-10-01 American Science And Engineering, Inc. Drive-through vehicle inspection system
US6546072B1 (en) 1999-07-30 2003-04-08 American Science And Engineering, Inc. Transmission enhanced scatter imaging
DE19954662B4 (de) * 1999-11-13 2004-06-03 Smiths Heimann Gmbh Vorrichtung und Verfahren zum Detektieren von unzulässigen Reisegepäckgegenständen
US6661867B2 (en) 2001-10-19 2003-12-09 Control Screening, Llc Tomographic scanning X-ray inspection system using transmitted and compton scattered radiation
US7072440B2 (en) 2001-10-19 2006-07-04 Control Screening, Llc Tomographic scanning X-ray inspection system using transmitted and Compton scattered radiation
US7099434B2 (en) * 2002-11-06 2006-08-29 American Science And Engineering, Inc. X-ray backscatter mobile inspection van
US6872001B1 (en) * 2003-05-05 2005-03-29 Peco Controls Corp. X-ray shielding structure for food inspection station
US7092485B2 (en) 2003-05-27 2006-08-15 Control Screening, Llc X-ray inspection system for detecting explosives and other contraband
RU2256169C1 (ru) * 2004-02-13 2005-07-10 Общестов с ограниченной ответственностью "Институт рентгеновской оптики" Способ и устройство для исследования объекта в рассеянном и/или прошедшем излучении
US7400701B1 (en) * 2004-04-09 2008-07-15 American Science And Engineering, Inc. Backscatter inspection portal
US7092481B2 (en) * 2004-05-19 2006-08-15 General Electric Company Direct conversion energy discriminating CT detector
US7190757B2 (en) * 2004-05-21 2007-03-13 Analogic Corporation Method of and system for computing effective atomic number images in multi-energy computed tomography
PL2049888T3 (pl) * 2006-08-11 2014-08-29 American Science & Eng Inc Badanie z wykorzystaniem promieniowania rentgenowskiego z równoczesną i proksymalną transmisją i obrazowanie rozpraszania wstecznego

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6192104B1 (en) 1998-11-30 2001-02-20 American Science And Engineering, Inc. Fan and pencil beams from a common source for x-ray inspection
US6687326B1 (en) * 2001-04-11 2004-02-03 Analogic Corporation Method of and system for correcting scatter in a computed tomography scanner
US20060151381A1 (en) * 2003-07-01 2006-07-13 Johan Wennerstrom Water filtering device
US20050185757A1 (en) 2004-02-20 2005-08-25 Kresse David E. Apparatus and method for nonintrusively inspecting an object

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12626484B2 (en) 2023-09-19 2026-05-12 Electronics And Telecommunications Research Institute Apparatus and method for identifying and displaying material types using multi-energy X-ray backscattering

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US20090268871A1 (en) 2009-10-29
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