KR101002939B1 - 히터의 다중 온도 제어시스템 - Google Patents
히터의 다중 온도 제어시스템 Download PDFInfo
- Publication number
- KR101002939B1 KR101002939B1 KR1020030054256A KR20030054256A KR101002939B1 KR 101002939 B1 KR101002939 B1 KR 101002939B1 KR 1020030054256 A KR1020030054256 A KR 1020030054256A KR 20030054256 A KR20030054256 A KR 20030054256A KR 101002939 B1 KR101002939 B1 KR 101002939B1
- Authority
- KR
- South Korea
- Prior art keywords
- heater
- temperature
- wafer
- thermocouple
- susceptor
- Prior art date
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67248—Temperature monitoring
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
Claims (4)
- 서셉터의 상단에 위치하는 웨이퍼를 가열하기 위해, 상기 서셉터의 중앙부와 대응되고 외주연을 가지는 제1히터와 상기 제1히터와 대응되는 홀이 형성되고 내주연을 가지는 제2히터를 포함하고, 상기 제1히터의 외주연과 상기 제2히터의 내주연이 서로 중첩되는 히터와;상기 제1히터 및 상기 제2히터 각각에 외부전원을 인가하는 파워라인과;상기 제1히터 및 상기 제2히터 각각의 하부에 온도를 감시하는 열전쌍을 포함하고, 상기 열전쌍에서 감지되는 온도에 따라 상기 외부전원을 조절하는 다중 온도 제어시스템.
- 삭제
- 제1항에 있어서,상기 제1히터의 직경은 상기 홀의 직경보다 크고, 상기 제1히터의 하부에 상기 제2히터가 위치하는 다중 온도 제어시스템.
- 제1항에 있어서,상기 제1히터의 직경은 상기 홀의 직경보다 크고, 상기 제1히터의 상부에 상기 제2히터가 위치하는 다중 온도 제어시스템.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020030054256A KR101002939B1 (ko) | 2003-08-06 | 2003-08-06 | 히터의 다중 온도 제어시스템 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020030054256A KR101002939B1 (ko) | 2003-08-06 | 2003-08-06 | 히터의 다중 온도 제어시스템 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20050015443A KR20050015443A (ko) | 2005-02-21 |
KR101002939B1 true KR101002939B1 (ko) | 2010-12-21 |
Family
ID=37226231
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020030054256A KR101002939B1 (ko) | 2003-08-06 | 2003-08-06 | 히터의 다중 온도 제어시스템 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR101002939B1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101655210B1 (ko) * | 2015-03-09 | 2016-09-08 | (주)위지트 | 기판의 온도 균일성이 향상된 서셉터 |
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2003
- 2003-08-06 KR KR1020030054256A patent/KR101002939B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
KR20050015443A (ko) | 2005-02-21 |
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