KR100997844B1 - 광검출 센서 - Google Patents
광검출 센서 Download PDFInfo
- Publication number
- KR100997844B1 KR100997844B1 KR1020047016546A KR20047016546A KR100997844B1 KR 100997844 B1 KR100997844 B1 KR 100997844B1 KR 1020047016546 A KR1020047016546 A KR 1020047016546A KR 20047016546 A KR20047016546 A KR 20047016546A KR 100997844 B1 KR100997844 B1 KR 100997844B1
- Authority
- KR
- South Korea
- Prior art keywords
- cathode
- anode
- period
- portions
- substrate
- Prior art date
Links
- 239000000758 substrate Substances 0.000 claims abstract description 32
- 238000000034 method Methods 0.000 claims description 8
- 238000010292 electrical insulation Methods 0.000 claims description 6
- 229910002601 GaN Inorganic materials 0.000 claims description 3
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 3
- ORUIBWPALBXDOA-UHFFFAOYSA-L magnesium fluoride Chemical compound [F-].[F-].[Mg+2] ORUIBWPALBXDOA-UHFFFAOYSA-L 0.000 claims description 3
- 229910001635 magnesium fluoride Inorganic materials 0.000 claims description 3
- 229910052715 tantalum Inorganic materials 0.000 claims description 3
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 3
- IRPGOXJVTQTAAN-UHFFFAOYSA-N 2,2,3,3,3-pentafluoropropanal Chemical compound FC(F)(F)C(F)(F)C=O IRPGOXJVTQTAAN-UHFFFAOYSA-N 0.000 claims description 2
- KLZUFWVZNOTSEM-UHFFFAOYSA-K Aluminum fluoride Inorganic materials F[Al](F)F KLZUFWVZNOTSEM-UHFFFAOYSA-K 0.000 claims description 2
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 claims description 2
- 229910001634 calcium fluoride Inorganic materials 0.000 claims description 2
- 239000013078 crystal Substances 0.000 claims description 2
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 claims description 2
- 239000010453 quartz Substances 0.000 claims description 2
- 229910052710 silicon Inorganic materials 0.000 claims description 2
- 239000010703 silicon Substances 0.000 claims description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 2
- 230000005693 optoelectronics Effects 0.000 abstract 1
- 230000004048 modification Effects 0.000 description 22
- 238000012986 modification Methods 0.000 description 22
- 238000010586 diagram Methods 0.000 description 12
- 239000000463 material Substances 0.000 description 8
- 238000005259 measurement Methods 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 244000126211 Hericium coralloides Species 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 230000035945 sensitivity Effects 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 3
- 230000004927 fusion Effects 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- 229910003460 diamond Inorganic materials 0.000 description 2
- 239000010432 diamond Substances 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000003749 cleanliness Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910052754 neon Inorganic materials 0.000 description 1
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- 229910001120 nichrome Inorganic materials 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000010301 surface-oxidation reaction Methods 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0204—Compact construction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0271—Housings; Attachments or accessories for photometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/429—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to measurement of ultraviolet light
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J40/00—Photoelectric discharge tubes not involving the ionisation of a gas
- H01J40/02—Details
- H01J40/04—Electrodes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Electron Tubes For Measurement (AREA)
- Light Receiving Elements (AREA)
- Measurement Of Radiation (AREA)
Abstract
Description
Claims (6)
- 전기 절연성을 가지는 기판; 빛의 입사에 의해 광전자를 방출하는 음극; 상기 음극으로부터 방출된 광전자를 수집하는 양극; 및 상기 기판, 상기 음극 및 상기 양극을 수용하며 진공으로 되어 있는 공간을 가지는 케이싱을 구비하며,상기 기판은, 질화알루미늄, 질화갈륨, 불화칼슘, 불화마그네슘, 불화알루미늄, 수정, 니오브산리튬, 니오브산탄탈로 이루어진 군으로부터 선택된 단결정 혹은 다결정이거나, 실리콘이나 알루미늄의 표면에 전기 절연화 처리를 가한 것이고,상기 음극 및 상기 양극은, 상기 기판의 동일면 상에 설치되어 있으며,상기 음극은, 방사상으로 뻗도록 설치된 복수의 기간 음극 부분 및 상기 기간 음극 부분마다에 해당 기간 음극 부분과 교차하도록 설치된 분기 음극 부분을 포함하고,상기 양극은, 인접하는 상기 기간 음극 부분 사이에 방사상으로 뻗도록 설치된 복수의 기간 양극 부분 및 상기 기간 양극 부분마다에 해당 기간 양극 부분과 교차하도록 설치된 분기 양극 부분을 포함하며,상기 분기 음극 부분 및 상기 분기 양극 부분은, 상기 방사상 방향으로 보아 서로 겹치도록 배치되어 있는 것을 특징으로 하는 광검출 센서.
- 삭제
- 제 1 항에 있어서,상기 양극은, 복수개 설치되어 있는 것을 특징으로 하는 광검출 센서.
- 제 1 항에 있어서,상기 음극은, 자외선의 입사에 의해 광전자를 방출하는 것을 특징으로 하는 광검출 센서.
- 제 1 항에 있어서,상기 음극의 폭은, 상기 양극의 폭보다 크게 설정되어 있는 것을 특징으로 하는 광검출 센서.
- 삭제
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2002-00115040 | 2002-04-17 | ||
JP2002115040 | 2002-04-17 | ||
PCT/JP2003/004638 WO2003087739A1 (en) | 2002-04-17 | 2003-04-11 | Photosensor |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20040111522A KR20040111522A (ko) | 2004-12-31 |
KR100997844B1 true KR100997844B1 (ko) | 2010-12-01 |
Family
ID=29243412
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020047016546A KR100997844B1 (ko) | 2002-04-17 | 2003-04-11 | 광검출 센서 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7166830B2 (ko) |
EP (1) | EP1498706A4 (ko) |
JP (1) | JPWO2003087739A1 (ko) |
KR (1) | KR100997844B1 (ko) |
CN (1) | CN100554897C (ko) |
AU (1) | AU2003236112A1 (ko) |
WO (1) | WO2003087739A1 (ko) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7456412B2 (en) * | 2007-04-11 | 2008-11-25 | Honeywell International Inc. | Insulator for tube having conductive case |
US7750284B2 (en) * | 2008-07-25 | 2010-07-06 | Honeywell International Inc. | Mesotube with header insulator |
TWI420716B (zh) * | 2009-08-19 | 2013-12-21 | Univ Nat Sun Yat Sen | 使用表面聲波元件之光感測器 |
US8653618B2 (en) * | 2011-09-02 | 2014-02-18 | Hoon Kim | Unit pixel of color image sensor and photo detector thereof |
USD743914S1 (en) * | 2014-03-13 | 2015-11-24 | Cree, Inc. | Photocontrol receptacle for lighting fixture |
US9324747B2 (en) | 2014-03-13 | 2016-04-26 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device |
CN105417833B (zh) * | 2015-12-25 | 2018-03-16 | 福州品行科技发展有限公司 | 一种带净水和光提醒功能的便携式富氢水杯及其使用方法 |
ES2979258T3 (es) * | 2017-05-30 | 2024-09-25 | Carrier Corp | Detector de luz de fototubo y película de semiconductor |
KR102079659B1 (ko) * | 2018-04-05 | 2020-02-20 | 해성디에스 주식회사 | 광 센서 소자 및 이를 포함하는 광 센서 패키지 |
JP7382338B2 (ja) * | 2018-10-16 | 2023-11-16 | 浜松ホトニクス株式会社 | 増幅回路用真空管及びそれを用いた増幅回路 |
DK3863038T3 (da) | 2020-02-07 | 2022-04-11 | Hamamatsu Photonics Kk | Elektronrør, billeddannelsesindretning og elektromagnetisk bølgedetektionsindretning |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63190935U (ko) * | 1987-05-29 | 1988-12-08 | ||
JPH10172503A (ja) * | 1996-12-17 | 1998-06-26 | Hamamatsu Photonics Kk | 光電子増倍管 |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3394280A (en) * | 1966-08-01 | 1968-07-23 | Terry M. Trumble | Ultraviolet detector tube having photoemissive cathode and gas filling |
US3983437A (en) * | 1968-03-12 | 1976-09-28 | The United States Of America As Represented By The United States Energy Research And Development Administration | Electromagnetic radiation detector |
US3732452A (en) * | 1971-11-24 | 1973-05-08 | Honeywell Inc | Ultraviolet radiation detector with 360{20 {0 angular sensitivity |
US4077017A (en) * | 1975-07-30 | 1978-02-28 | The United States Government As Represented By The U. S. Department Of Energy | Ultraviolet radiation induced discharge laser |
US4094703A (en) * | 1976-12-30 | 1978-06-13 | Cornell Research Foundation | Solar energy converter |
US4616248A (en) * | 1985-05-20 | 1986-10-07 | Honeywell Inc. | UV photocathode using negative electron affinity effect in Alx Ga1 N |
JPS63190935A (ja) | 1987-02-04 | 1988-08-08 | Ogura Clutch Co Ltd | 正逆転クラツチ |
JP2871007B2 (ja) | 1990-06-29 | 1999-03-17 | 株式会社島津製作所 | ファジィ推論を用いた画像診断装置 |
JPH0461852U (ko) * | 1990-10-04 | 1992-05-27 | ||
DE4125638C2 (de) * | 1991-08-02 | 1994-06-30 | Gte Licht Gmbh | Photozelle, insbesondere zur Feststellung von UV-Strahlung |
US5349194A (en) * | 1993-02-01 | 1994-09-20 | The United States Of America As Represented By The United States Department Of Energy | Microgap ultra-violet detector |
JP2651352B2 (ja) | 1993-06-02 | 1997-09-10 | 浜松ホトニクス株式会社 | 光電陰極、光電管および光検出装置 |
FI953240A0 (fi) * | 1995-06-30 | 1995-06-30 | Rados Technology Oy | Ljusdetektor |
EP0990254A1 (en) * | 1996-02-12 | 2000-04-05 | The University of Akron | Multimedia detectors for medical imaging |
CN1089187C (zh) * | 1996-09-26 | 2002-08-14 | 浜松光子学株式会社 | 紫外线检测器 |
JPH1145680A (ja) | 1997-07-29 | 1999-02-16 | Toshiba Corp | ガス電子増幅素子およびガス電子増幅検出器 |
JPH11102657A (ja) * | 1997-09-25 | 1999-04-13 | Hamamatsu Photonics Kk | 光検出管 |
JP2000075037A (ja) | 1998-08-31 | 2000-03-14 | Toshiba Corp | 放射線検出器 |
JP2000088645A (ja) * | 1998-09-16 | 2000-03-31 | Hamamatsu Photonics Kk | 積分型光検出装置 |
JP4229500B2 (ja) * | 1998-11-09 | 2009-02-25 | 株式会社神戸製鋼所 | 反射型光電陰極 |
-
2003
- 2003-04-11 EP EP03746462A patent/EP1498706A4/en not_active Withdrawn
- 2003-04-11 KR KR1020047016546A patent/KR100997844B1/ko not_active IP Right Cessation
- 2003-04-11 AU AU2003236112A patent/AU2003236112A1/en not_active Abandoned
- 2003-04-11 US US10/511,086 patent/US7166830B2/en not_active Expired - Fee Related
- 2003-04-11 CN CNB038083817A patent/CN100554897C/zh not_active Expired - Fee Related
- 2003-04-11 JP JP2003584639A patent/JPWO2003087739A1/ja active Pending
- 2003-04-11 WO PCT/JP2003/004638 patent/WO2003087739A1/ja active Application Filing
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63190935U (ko) * | 1987-05-29 | 1988-12-08 | ||
JPH10172503A (ja) * | 1996-12-17 | 1998-06-26 | Hamamatsu Photonics Kk | 光電子増倍管 |
Also Published As
Publication number | Publication date |
---|---|
US7166830B2 (en) | 2007-01-23 |
US20050140293A1 (en) | 2005-06-30 |
EP1498706A4 (en) | 2009-04-29 |
AU2003236112A1 (en) | 2003-10-27 |
JPWO2003087739A1 (ja) | 2005-08-18 |
WO2003087739A1 (en) | 2003-10-23 |
EP1498706A1 (en) | 2005-01-19 |
KR20040111522A (ko) | 2004-12-31 |
CN1646888A (zh) | 2005-07-27 |
CN100554897C (zh) | 2009-10-28 |
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