KR100952254B1 - 삼차원 대상의 형태를 검파하는 방법 및 장치 - Google Patents

삼차원 대상의 형태를 검파하는 방법 및 장치 Download PDF

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Publication number
KR100952254B1
KR100952254B1 KR1020047007955A KR20047007955A KR100952254B1 KR 100952254 B1 KR100952254 B1 KR 100952254B1 KR 1020047007955 A KR1020047007955 A KR 1020047007955A KR 20047007955 A KR20047007955 A KR 20047007955A KR 100952254 B1 KR100952254 B1 KR 100952254B1
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KR
South Korea
Prior art keywords
illuminance
light
measured
measurement
dye
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KR1020047007955A
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English (en)
Korean (ko)
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KR20040076251A (ko
Inventor
멘첼랄프
Original Assignee
칼리더스 프리시즌스 시스템즈 게엠바하
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Publication of KR20040076251A publication Critical patent/KR20040076251A/ko
Application granted granted Critical
Publication of KR100952254B1 publication Critical patent/KR100952254B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
KR1020047007955A 2001-11-27 2002-11-26 삼차원 대상의 형태를 검파하는 방법 및 장치 KR100952254B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE10157810.5 2001-11-27
DE10157810A DE10157810A1 (de) 2001-11-27 2001-11-27 Dreidimensionale optische Formerfassung durch Intensitätskodierung der Pulslaufzeit
PCT/EP2002/013483 WO2003046472A2 (de) 2001-11-27 2002-11-26 Verfahren und vorrichtung zur erfassung der gestalt eines dreidimensionalen gegenstandes

Publications (2)

Publication Number Publication Date
KR20040076251A KR20040076251A (ko) 2004-08-31
KR100952254B1 true KR100952254B1 (ko) 2010-04-09

Family

ID=7706932

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020047007955A KR100952254B1 (ko) 2001-11-27 2002-11-26 삼차원 대상의 형태를 검파하는 방법 및 장치

Country Status (7)

Country Link
EP (1) EP1451526A2 (de)
JP (2) JP2005510697A (de)
KR (1) KR100952254B1 (de)
CN (1) CN100549616C (de)
AU (1) AU2002358562A1 (de)
DE (1) DE10157810A1 (de)
WO (1) WO2003046472A2 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10157810A1 (de) * 2001-11-27 2003-06-05 Up Transfer Ges Fuer Wissens U Dreidimensionale optische Formerfassung durch Intensitätskodierung der Pulslaufzeit
US7643025B2 (en) 2003-09-30 2010-01-05 Eric Belk Lange Method and apparatus for applying stereoscopic imagery to three-dimensionally defined substrates
JP4673674B2 (ja) * 2005-06-06 2011-04-20 株式会社リコー 形状測定装置
JP2008190883A (ja) * 2007-02-01 2008-08-21 Nikon Corp 計測装置
US8471895B2 (en) * 2008-11-25 2013-06-25 Paul S. Banks Systems and methods of high resolution three-dimensional imaging
CN101566465B (zh) * 2009-05-18 2011-04-06 西安交通大学 一种物体变形的实时测量方法
KR102496479B1 (ko) * 2015-10-22 2023-02-06 삼성전자주식회사 3차원 카메라와 투과도 측정방법

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040076251A (ko) * 2001-11-27 2004-08-31 칼리더스 프리시즌스 시스템즈 게엠바하 삼차원 대상의 형태를 검파하는 방법 및 장치
KR20060011163A (ko) * 2004-07-29 2006-02-03 엘지전자 주식회사 광학 모듈을 이용한 검사 장치

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3503231A1 (de) * 1985-01-31 1986-08-07 Helmut A. 6720 Speyer Kappner Verfahren und einrichtung zur 3-d-erfassung von szenen mittels optischem 2-d-sensor
JPH04244904A (ja) * 1991-01-31 1992-09-01 Olympus Optical Co Ltd 干渉測定装置
DE4426515A1 (de) * 1994-07-27 1996-02-01 Erwin Dr Rer Nat Rojewski Intensitätscodiertes 3D-Bilderkennungsverfahren
JPH11337988A (ja) * 1998-05-25 1999-12-10 Asahi Glass Co Ltd 光スイッチ
JP3711808B2 (ja) * 1999-10-07 2005-11-02 富士ゼロックス株式会社 形状計測装置および形状計測方法
JP2001280927A (ja) * 2000-03-30 2001-10-10 Fuji Xerox Co Ltd ３次元形状計測方法および装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040076251A (ko) * 2001-11-27 2004-08-31 칼리더스 프리시즌스 시스템즈 게엠바하 삼차원 대상의 형태를 검파하는 방법 및 장치
KR20060011163A (ko) * 2004-07-29 2006-02-03 엘지전자 주식회사 광학 모듈을 이용한 검사 장치

Also Published As

Publication number Publication date
AU2002358562A1 (en) 2003-06-10
DE10157810A1 (de) 2003-06-05
WO2003046472A2 (de) 2003-06-05
EP1451526A2 (de) 2004-09-01
CN100549616C (zh) 2009-10-14
CN1613001A (zh) 2005-05-04
WO2003046472A3 (de) 2003-12-31
JP2005510697A (ja) 2005-04-21
KR20040076251A (ko) 2004-08-31
AU2002358562A8 (en) 2003-06-10
JP2010175550A (ja) 2010-08-12

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