KR100930423B1 - 로그라인 단선시험이 가능한 tft 어레이 패널구조 - Google Patents
로그라인 단선시험이 가능한 tft 어레이 패널구조 Download PDFInfo
- Publication number
- KR100930423B1 KR100930423B1 KR1020020087688A KR20020087688A KR100930423B1 KR 100930423 B1 KR100930423 B1 KR 100930423B1 KR 1020020087688 A KR1020020087688 A KR 1020020087688A KR 20020087688 A KR20020087688 A KR 20020087688A KR 100930423 B1 KR100930423 B1 KR 100930423B1
- Authority
- KR
- South Korea
- Prior art keywords
- line
- test
- gate
- log
- array panel
- Prior art date
Links
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136286—Wiring, e.g. gate line, drain line
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136259—Repairing; Defects
- G02F1/136263—Line defects
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2203/00—Function characteristic
- G02F2203/69—Arrangements or methods for testing or calibrating a device
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mathematical Physics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
Claims (4)
- 어레이 패널 제작완료후, 신호배선의 PDI 테스트를 사용하고 있는 2G2D 방식에서 1G2D 방식으로 변경시에 로그(LOG : Line On Glass)라인의 단락(Short) 테스트가 가능하도록 한 패널 구조에 있어서,정전기 등에 의해 발생한 게이트 라인간의 GGS(Gate Gate Short)검출이 가능하도록 PDI 공통 패드의 신호배선의 연장선이 게이트 라인의 팬 아웃(Fan out)의 라인 사이사이에 형성되어 공통라인(Common Line)이 형성되는 것을 특징으로 하는 로그라인 단선시험이 가능한 TFT 어레이 패널구조.
- 삭제
- 삭제
- 삭제
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020020087688A KR100930423B1 (ko) | 2002-12-31 | 2002-12-31 | 로그라인 단선시험이 가능한 tft 어레이 패널구조 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020020087688A KR100930423B1 (ko) | 2002-12-31 | 2002-12-31 | 로그라인 단선시험이 가능한 tft 어레이 패널구조 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20040061424A KR20040061424A (ko) | 2004-07-07 |
KR100930423B1 true KR100930423B1 (ko) | 2009-12-08 |
Family
ID=37352967
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020020087688A KR100930423B1 (ko) | 2002-12-31 | 2002-12-31 | 로그라인 단선시험이 가능한 tft 어레이 패널구조 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100930423B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110673410A (zh) * | 2019-09-24 | 2020-01-10 | 深圳市华星光电半导体显示技术有限公司 | 液晶显示器边框的走线结构 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107561798A (zh) * | 2017-10-26 | 2018-01-09 | 惠科股份有限公司 | 扇出线结构及其制造方法 |
US10707288B2 (en) | 2018-03-12 | 2020-07-07 | Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. | TFT array substrate and OLED display panel |
CN108400101A (zh) * | 2018-03-12 | 2018-08-14 | 武汉华星光电半导体显示技术有限公司 | 一种阵列基板及oled显示面板 |
CN208999733U (zh) * | 2018-11-22 | 2019-06-18 | 惠科股份有限公司 | 基板、显示面板和显示装置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002098998A (ja) | 2000-09-26 | 2002-04-05 | Matsushita Electric Ind Co Ltd | 液晶画像表示装置とその検査方法及びその製造方法 |
KR20020046018A (ko) * | 2000-12-12 | 2002-06-20 | 주식회사 현대 디스플레이 테크놀로지 | 액정표시소자의 단락위치검출방법 |
JP2002303845A (ja) | 2000-12-30 | 2002-10-18 | Hyundai Display Technology Inc | パネル内配線の欠陥をテストするための液晶表示装置 |
-
2002
- 2002-12-31 KR KR1020020087688A patent/KR100930423B1/ko active IP Right Grant
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002098998A (ja) | 2000-09-26 | 2002-04-05 | Matsushita Electric Ind Co Ltd | 液晶画像表示装置とその検査方法及びその製造方法 |
KR20020046018A (ko) * | 2000-12-12 | 2002-06-20 | 주식회사 현대 디스플레이 테크놀로지 | 액정표시소자의 단락위치검출방법 |
JP2002303845A (ja) | 2000-12-30 | 2002-10-18 | Hyundai Display Technology Inc | パネル内配線の欠陥をテストするための液晶表示装置 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110673410A (zh) * | 2019-09-24 | 2020-01-10 | 深圳市华星光电半导体显示技术有限公司 | 液晶显示器边框的走线结构 |
Also Published As
Publication number | Publication date |
---|---|
KR20040061424A (ko) | 2004-07-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100281058B1 (ko) | 액정표시장치 | |
KR101137863B1 (ko) | 박막트랜지스터 어레이 기판 | |
KR20030054937A (ko) | 액정표시장치 | |
CN103137049A (zh) | 显示装置的显示面板和检测显示装置的信号线的缺陷的方法 | |
KR20020059071A (ko) | 액정표시장치의 패널내 배선의 결함 테스트 방법 | |
CN105096781A (zh) | 一种面板检测电路及检测方法 | |
CN109187645B (zh) | 显示面板和显示面板的检测方法 | |
KR100930423B1 (ko) | 로그라인 단선시험이 가능한 tft 어레이 패널구조 | |
KR101469481B1 (ko) | 표시장치용 표시패널 및 표시장치용 신호라인의 불량 검출방법 | |
KR100576629B1 (ko) | 액정표시장치의 tft어레이 기판 및 그 검사방법 | |
CN109102768A (zh) | 一种阵列基板母板及其检测方法 | |
CN110718176A (zh) | 一种显示面板及其检测方法 | |
KR100303207B1 (ko) | 검사회로를가지는박막트랜지스터매트릭스기판 | |
KR100646777B1 (ko) | 정전기 보호 회로를 가지는 액정 표시 장치 및 정전기 보호 회로를 이용한 표시검사 방법 | |
CN113112940B (zh) | 一种显示面板 | |
KR20160084963A (ko) | 액정 표시 장치 | |
KR101274922B1 (ko) | 액정패널용 멀티 어레이 기판 | |
CN113889013A (zh) | 面板裂纹检测电路、方法、显示模组及装置 | |
CN110827729B (zh) | 检测结构、显示面板及制作方法、检测方法 | |
KR100471782B1 (ko) | 액정표시장치의불량검출방법 | |
KR100671513B1 (ko) | 액정표시소자의 단락위치검출방법 | |
KR20020088450A (ko) | 액정표시장치 어레이 기판 | |
CN216671168U (zh) | 显示面板及其检测装置 | |
JPH07199220A (ja) | アレイ基板 | |
KR100666448B1 (ko) | 액정표시장치의 어레이 기판 테스트 방법 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
N231 | Notification of change of applicant | ||
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20121008 Year of fee payment: 4 |
|
FPAY | Annual fee payment |
Payment date: 20131017 Year of fee payment: 5 |
|
FPAY | Annual fee payment |
Payment date: 20141017 Year of fee payment: 6 |
|
FPAY | Annual fee payment |
Payment date: 20151019 Year of fee payment: 7 |
|
FPAY | Annual fee payment |
Payment date: 20161020 Year of fee payment: 8 |
|
FPAY | Annual fee payment |
Payment date: 20171023 Year of fee payment: 9 |