KR100784216B1 - 처리 장치 - Google Patents
처리 장치 Download PDFInfo
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- KR100784216B1 KR100784216B1 KR1020060023953A KR20060023953A KR100784216B1 KR 100784216 B1 KR100784216 B1 KR 100784216B1 KR 1020060023953 A KR1020060023953 A KR 1020060023953A KR 20060023953 A KR20060023953 A KR 20060023953A KR 100784216 B1 KR100784216 B1 KR 100784216B1
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- 238000010438 heat treatment Methods 0.000 claims description 67
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 239000007789 gas Substances 0.000 description 231
- 239000000919 ceramic Substances 0.000 description 38
- 238000000034 method Methods 0.000 description 38
- 239000000758 substrate Substances 0.000 description 30
- 239000000843 powder Substances 0.000 description 22
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 16
- 238000003754 machining Methods 0.000 description 9
- 239000000463 material Substances 0.000 description 8
- 230000000052 comparative effect Effects 0.000 description 7
- 238000005304 joining Methods 0.000 description 7
- 239000002994 raw material Substances 0.000 description 7
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- 229910001873 dinitrogen Inorganic materials 0.000 description 6
- 238000010304 firing Methods 0.000 description 6
- 238000002844 melting Methods 0.000 description 6
- 230000008018 melting Effects 0.000 description 6
- 238000005336 cracking Methods 0.000 description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 239000002002 slurry Substances 0.000 description 4
- 239000011230 binding agent Substances 0.000 description 3
- 239000007767 bonding agent Substances 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000000465 moulding Methods 0.000 description 3
- 238000007639 printing Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 239000007921 spray Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 239000002270 dispersing agent Substances 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 239000011888 foil Substances 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 238000012856 packing Methods 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 238000004080 punching Methods 0.000 description 2
- 239000012495 reaction gas Substances 0.000 description 2
- 238000007650 screen-printing Methods 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 238000005245 sintering Methods 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- UONOETXJSWQNOL-UHFFFAOYSA-N tungsten carbide Chemical compound [W+]#[C-] UONOETXJSWQNOL-UHFFFAOYSA-N 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- QIJNJJZPYXGIQM-UHFFFAOYSA-N 1lambda4,2lambda4-dimolybdacyclopropa-1,2,3-triene Chemical compound [Mo]=C=[Mo] QIJNJJZPYXGIQM-UHFFFAOYSA-N 0.000 description 1
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 239000001856 Ethyl cellulose Substances 0.000 description 1
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 1
- 229910001182 Mo alloy Inorganic materials 0.000 description 1
- 229910039444 MoC Inorganic materials 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 229920001249 ethyl cellulose Polymers 0.000 description 1
- 235000019325 ethyl cellulose Nutrition 0.000 description 1
- 238000005469 granulation Methods 0.000 description 1
- 230000003179 granulation Effects 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- MGRWKWACZDFZJT-UHFFFAOYSA-N molybdenum tungsten Chemical compound [Mo].[W] MGRWKWACZDFZJT-UHFFFAOYSA-N 0.000 description 1
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000009832 plasma treatment Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68792—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the construction of the shaft
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/10—Heating elements characterised by the composition or nature of the materials or by the arrangement of the conductor
- H05B3/12—Heating elements characterised by the composition or nature of the materials or by the arrangement of the conductor characterised by the composition or nature of the conductive material
- H05B3/14—Heating elements characterised by the composition or nature of the materials or by the arrangement of the conductor characterised by the composition or nature of the conductive material the material being non-metallic
- H05B3/141—Conductive ceramics, e.g. metal oxides, metal carbides, barium titanate, ferrites, zirconia, vitrous compounds
- H05B3/143—Conductive ceramics, e.g. metal oxides, metal carbides, barium titanate, ferrites, zirconia, vitrous compounds applied to semiconductors, e.g. wafers heating
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Resistance Heating (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
- Air Bags (AREA)
Abstract
Description
가스 공급로 | 가스 유량[sccm] | 균열성 | ||||||||
구분 | 단면 형상 | 수 | 단면 치수 | 형성방법 | 가 스 공급로 31a | 31b | 31c | 31d | 기체표면 온도의 최대치와 최소치의 차 ΔT[℃] | 가스공급로에 대응하는 부분의 표면에 있어서 온도 저하 |
본발명 의 예 | 원형 | 4 | Φ4mm | 기계가공 | 9.7 | 9.2 | 9.3 | 9.6 | 5.3 | 없음 |
비교예 | 직사 각형 | 4 | 6x2mm | 플레이트 접합 | 7.3 | 8.8 | 6.8 | 9.4 | 12.3 | 있음 |
Claims (7)
- 처리 대상물을 유지하는 기체(基體)를 포함하고,상기 기체에는 그 기체의 외주부에 가스를 공급하며 단면이 원형상인 가스 공급로가 형성되어 있고,상기 기체는 저항 발열체를 포함하며,상기 가스 공급로는 상기 기체의 내부에 형성되어 있고,상기 가스 공급로는 상기 저항 발열체보다도 처리 대상물의 유지면과는 반대측의 면에 근접하여 배치되어 있는 것을 특징으로 하는 처리 장치.
- 제1항에 있어서, 상기 가스 공급로는 복수 개 형성되어 있는 것을 특징으로 하는 처리 장치.
- 제2항에 있어서, 상기 기체에 접합되며, 상기 가스 공급로에 가스를 도입하는 가스 도입로를 가지는 관상 부재를 포함하며,상기 기체에는 상기 가스 공급로와 상기 가스 도입로를 연통시키는 연결로가 형성되어 있는 것을 특징으로 하는 처리 장치.
- 제3항에 있어서, 상기 기체에는 상기 복수의 가스 공급로를 연결하는 연결로가 형성되어 있는 것을 특징으로 하는 처리 장치.
- 제1항에 있어서, 상기 기체에 접합되며, 상기 가스 공급로에 가스를 도입하는 가스 도입로를 가지는 관상 부재를 포함하며,상기 기체에는 상기 가스 공급로와 상기 가스 도입로를 연통시키는 연결로가 형성되어 있는 것을 특징으로 하는 처리 장치.
- 삭제
- 삭제
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US66220705P | 2005-03-16 | 2005-03-16 | |
US60/662,207 | 2005-03-16 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20060100262A KR20060100262A (ko) | 2006-09-20 |
KR100784216B1 true KR100784216B1 (ko) | 2007-12-11 |
Family
ID=36190768
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020060023953A KR100784216B1 (ko) | 2005-03-16 | 2006-03-15 | 처리 장치 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8394199B2 (ko) |
EP (1) | EP1703546B1 (ko) |
JP (1) | JP4590364B2 (ko) |
KR (1) | KR100784216B1 (ko) |
TW (1) | TWI297908B (ko) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100867191B1 (ko) * | 2006-11-02 | 2008-11-06 | 주식회사 유진테크 | 기판처리장치 및 기판처리방법 |
WO2010124268A2 (en) * | 2009-04-24 | 2010-10-28 | Applied Materials, Inc. | Substrate support having side gas outlets and methods |
JP5401230B2 (ja) * | 2009-09-17 | 2014-01-29 | 株式会社ニューフレアテクノロジー | 成膜装置および成膜方法 |
US9633889B2 (en) * | 2013-03-06 | 2017-04-25 | Applied Materials, Inc. | Substrate support with integrated vacuum and edge purge conduits |
US9738975B2 (en) | 2015-05-12 | 2017-08-22 | Lam Research Corporation | Substrate pedestal module including backside gas delivery tube and method of making |
US10157755B2 (en) * | 2015-10-01 | 2018-12-18 | Lam Research Corporation | Purge and pumping structures arranged beneath substrate plane to reduce defects |
WO2019088203A1 (ja) * | 2017-11-02 | 2019-05-09 | 日本碍子株式会社 | 半導体製造装置用部材、その製法及び成形型 |
DE102018105220A1 (de) * | 2018-03-07 | 2019-09-12 | Hauni Maschinenbau Gmbh | Verfahren zur Fertigung eines elektrisch betreibbaren Heizkörpers für einen Inhalator |
WO2019187785A1 (ja) * | 2018-03-26 | 2019-10-03 | 日本碍子株式会社 | 静電チャックヒータ |
JP6959201B2 (ja) * | 2018-08-29 | 2021-11-02 | 日本碍子株式会社 | セラミックヒータ |
JP6873178B2 (ja) * | 2019-03-26 | 2021-05-19 | 日本碍子株式会社 | 半導体製造装置用部材、その製法及び成形型 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100256995B1 (ko) | 1995-09-06 | 2000-05-15 | 시바타 마사하루 | 정전 척 |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
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DE69126724T2 (de) * | 1990-03-19 | 1998-01-15 | Toshiba Kawasaki Kk | Vorrichtung zur Dampfphasenabscheidung |
JPH06151332A (ja) | 1992-11-12 | 1994-05-31 | Ngk Insulators Ltd | セラミックスヒーター |
US5800618A (en) * | 1992-11-12 | 1998-09-01 | Ngk Insulators, Ltd. | Plasma-generating electrode device, an electrode-embedded article, and a method of manufacturing thereof |
US5343938A (en) * | 1992-12-24 | 1994-09-06 | Vlsi Technology, Inc. | Method and apparatus for thermally insulating a wafer support |
DE69427722T2 (de) * | 1993-05-21 | 2002-05-08 | Toshiba Kawasaki Kk | Sinterkörper aus Aluminiumnitriol und Verfahren zu seiner Herstellung |
JPH07172921A (ja) | 1993-12-20 | 1995-07-11 | Toshiba Corp | 窒化アルミニウム焼結体およびその製造方法 |
US5888304A (en) * | 1996-04-02 | 1999-03-30 | Applied Materials, Inc. | Heater with shadow ring and purge above wafer surface |
US5551983A (en) * | 1994-11-01 | 1996-09-03 | Celestech, Inc. | Method and apparatus for depositing a substance with temperature control |
JP3599204B2 (ja) * | 1995-06-08 | 2004-12-08 | アネルバ株式会社 | Cvd装置 |
US5781400A (en) * | 1995-09-20 | 1998-07-14 | Hitachi, Ltd. | Electrostatically attracting electrode and a method of manufacture thereof |
JPH09256153A (ja) * | 1996-03-15 | 1997-09-30 | Anelva Corp | 基板処理装置 |
US5748435A (en) * | 1996-12-30 | 1998-05-05 | Applied Materials, Inc. | Apparatus for controlling backside gas pressure beneath a semiconductor wafer |
JP2001522142A (ja) * | 1997-11-03 | 2001-11-13 | エーエスエム アメリカ インコーポレイテッド | 改良された低質量ウェハ支持システム |
US6126382A (en) * | 1997-11-26 | 2000-10-03 | Novellus Systems, Inc. | Apparatus for aligning substrate to chuck in processing chamber |
US6179924B1 (en) * | 1998-04-28 | 2001-01-30 | Applied Materials, Inc. | Heater for use in substrate processing apparatus to deposit tungsten |
US6280584B1 (en) * | 1998-07-29 | 2001-08-28 | Applied Materials, Inc. | Compliant bond structure for joining ceramic to metal |
US6494955B1 (en) | 2000-02-15 | 2002-12-17 | Applied Materials, Inc. | Ceramic substrate support |
US6223447B1 (en) * | 2000-02-15 | 2001-05-01 | Applied Materials, Inc. | Fastening device for a purge ring |
WO2002047129A1 (fr) * | 2000-12-05 | 2002-06-13 | Ibiden Co., Ltd. | Substrat ceramique pour dispositifs de production et de controle de semi-conducteurs et procede de production dudit substrat ceramique |
TWI272689B (en) * | 2001-02-16 | 2007-02-01 | Tokyo Electron Ltd | Method and apparatus for transferring heat from a substrate to a chuck |
US6702900B2 (en) * | 2001-03-22 | 2004-03-09 | Taiwan Semiconductor Manufacturing Co., Ltd. | Wafer chuck for producing an inert gas blanket and method for using |
JP4386606B2 (ja) * | 2001-11-08 | 2009-12-16 | 日本碍子株式会社 | 支持装置の製造方法 |
US6730175B2 (en) * | 2002-01-22 | 2004-05-04 | Applied Materials, Inc. | Ceramic substrate support |
JP2006517740A (ja) * | 2003-01-17 | 2006-07-27 | ゼネラル・エレクトリック・カンパニイ | ウェーハ加工装置及びその製造方法 |
-
2006
- 2006-03-14 JP JP2006069156A patent/JP4590364B2/ja active Active
- 2006-03-14 TW TW095108551A patent/TWI297908B/zh active
- 2006-03-15 KR KR1020060023953A patent/KR100784216B1/ko active IP Right Grant
- 2006-03-15 US US11/375,815 patent/US8394199B2/en active Active
- 2006-03-16 EP EP06251414.6A patent/EP1703546B1/en not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100256995B1 (ko) | 1995-09-06 | 2000-05-15 | 시바타 마사하루 | 정전 척 |
Also Published As
Publication number | Publication date |
---|---|
EP1703546B1 (en) | 2017-03-22 |
EP1703546A2 (en) | 2006-09-20 |
KR20060100262A (ko) | 2006-09-20 |
JP4590364B2 (ja) | 2010-12-01 |
TW200705514A (en) | 2007-02-01 |
US20060219176A1 (en) | 2006-10-05 |
TWI297908B (en) | 2008-06-11 |
EP1703546A3 (en) | 2008-09-03 |
JP2006261670A (ja) | 2006-09-28 |
US8394199B2 (en) | 2013-03-12 |
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