KR100742858B1 - 접착성이 우수한 실리콘 산화피막의 연소화학 기상증착방법 - Google Patents
접착성이 우수한 실리콘 산화피막의 연소화학 기상증착방법 Download PDFInfo
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- KR100742858B1 KR100742858B1 KR1020050130080A KR20050130080A KR100742858B1 KR 100742858 B1 KR100742858 B1 KR 100742858B1 KR 1020050130080 A KR1020050130080 A KR 1020050130080A KR 20050130080 A KR20050130080 A KR 20050130080A KR 100742858 B1 KR100742858 B1 KR 100742858B1
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
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Abstract
Description
공기 (l/min) | 180 | 195 | 210 | 210 | 210 | 210 | 210 | 225 | 240 | 255 |
LPG (l/min) | 8.6 | 9.3 | 9.6 | 10 | 10.5 | 11.0 | 11.7 | 10.7 | 11.4 | 12.0 |
화염 형성능 | O | O | X | O | O | O | X | O | O | O |
연소가스 대 공기의 공급비율 | 10:210 | 10:210 | 10:220 | 10:210 | 10:200 | 10:190 | 10:180 | 10:210 | 10:210 | 10:210 |
구분 | 산화가스의 공급량 (l/min) | 전구체를 포함하는 캐리어가스의 공급량 (l/min) | 산화가스 대 전구체를 포함하는 캐리어가스의 공급비율 |
A1 | 210 | 0.8 | 210:0.8 |
A2 | 210 | 1.6 | 210:1.6 |
A3 | 210 | 3.2 | 210:3.2 |
No. | 처리횟수 | 기판 이송속도 (MPM) | P/C flow (l/min) | 버너로부터 기판까지의 거리 (mm) | 테이프 박리력 | 접착제 파괴 |
B1 | 0 | 0 | 0 | 0 | 0.23kg/25mm | 계면박리 |
B2 | 3 | 60 | 1.6 | 40 | 0.72kg/25mm | 9.4kg/25mm |
B3 | 6 | 60 | 1.6 | 40 | 0.99kg/25mm | 10.2kg/25mm |
B4 | 10 | 60 | 1.6 | 40 | 1.21kg/25mm | 9.9kg/25mmm |
B5 | 15 | 60 | 1.6 | 40 | 1.39kg/25mm | 10.7kg/25mm |
B6 | 17 | 60 | 1.6 | 40 | 1.22kg/25mm | 9.9kg/25mm |
B7 | 6 | 60 | 0.8 | 40 | 0.82kg/25mm | 9.7kg/25mm |
B8 | 6 | 60 | 3.2 | 40 | 0.91kg/25mm | 부분박리 |
B9 | 6 | 60 | 0.8 | 7 | 0.77kg/25mm | 부분박리 |
B10 | 6 | 60 | 1.6 | 7 | 0.92kg/25mm | 9.9kg/25mm |
B11 | 6 | 60 | 3.2 | 7 | 0.89kg/25mm | 부분박리 |
Claims (5)
- 전구체의 증기상을 캐리어 가스에 의해 버너로 이송하고 연소열의 화염에 의해 기판에 증착하는 연소화학 기상증착 방법에 있어서,상기 버너에서 연소열은 연소가스 대비 산화가스의 투입비를 10:190-10:210로 하여 확보하고,상기 전구체는 HMDSO(Hexamethyldisiloxane)이고, 상기 산화가스에 대한 전구체의 증기상을 포함하는 캐리어가스의 투입량은 210:0.8-210:3.2로 하여상기 화염의 다크 프레임 영역에서 기판에 증착하는 것을 포함하여 이루어지는 접착성이 우수한 실리콘 산화피막의 연소화학 기상증착방법.
- 제 1항에 있어서, 상기 기판의 증착은 버너에서 기판까지의 거리를 7-50mm로 하여 처리하는 것을 특징으로 하는 접착성이 우수한 실리콘 산화피막의 연소화학 기상증착방법.
- 제 1항에 있어서, 상기 실리콘 산화피막의 증착 처리는 3-15회 행하는 것을 특징으로 하는 접착성이 우수한 실리콘 산화피막의 연소화학 기상증착방법.
- 제 1항 에 있어서, 상기 캐리어 가스와 산화가스는 공기임을 특징으로 하는 접착성이 우수한 실리콘 산화피막의 연소화학 기상증착방법.
- 제 1항에 있어서, 상기 기판은 금속판임을 특징으로 하는 접착성이 우수한 실리콘 산화피막의 연소화학 기상증착방법.
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KR20070068216A KR20070068216A (ko) | 2007-06-29 |
KR100742858B1 true KR100742858B1 (ko) | 2007-07-26 |
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US8329251B2 (en) | 2008-02-29 | 2012-12-11 | University Of Southern California | Method for preparing metal oxide crystalline nanoparticle films for dye sensitized solar cell photoanodes |
US8197908B2 (en) * | 2008-03-14 | 2012-06-12 | Hestia Tec, Llc | Method for preparing electrically conducting materials |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5858465A (en) | 1993-03-24 | 1999-01-12 | Georgia Tech Research Corporation | Combustion chemical vapor deposition of phosphate films and coatings |
JP2000164460A (ja) | 1998-11-23 | 2000-06-16 | Microcoating Technologies Inc | 薄膜コンデンサの形成法 |
US6193911B1 (en) | 1998-04-29 | 2001-02-27 | Morton International Incorporated | Precursor solution compositions for electronic devices using CCVD |
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5858465A (en) | 1993-03-24 | 1999-01-12 | Georgia Tech Research Corporation | Combustion chemical vapor deposition of phosphate films and coatings |
US6193911B1 (en) | 1998-04-29 | 2001-02-27 | Morton International Incorporated | Precursor solution compositions for electronic devices using CCVD |
JP2000164460A (ja) | 1998-11-23 | 2000-06-16 | Microcoating Technologies Inc | 薄膜コンデンサの形成法 |
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