KR100618860B1 - 메모리 장치의 리프레쉬시 센싱 노이즈를 감소시킬 수있는 어드레스 코딩 방법 및 이를 구현한 어드레스 디코더 - Google Patents
메모리 장치의 리프레쉬시 센싱 노이즈를 감소시킬 수있는 어드레스 코딩 방법 및 이를 구현한 어드레스 디코더 Download PDFInfo
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- KR100618860B1 KR100618860B1 KR1020040072107A KR20040072107A KR100618860B1 KR 100618860 B1 KR100618860 B1 KR 100618860B1 KR 1020040072107 A KR1020040072107 A KR 1020040072107A KR 20040072107 A KR20040072107 A KR 20040072107A KR 100618860 B1 KR100618860 B1 KR 100618860B1
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
- G11C11/40618—Refresh operations over multiple banks or interleaving
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/408—Address circuits
- G11C11/4087—Address decoders, e.g. bit - or word line decoders; Multiple line decoders
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/10—Decoders
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2211/00—Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C2211/401—Indexing scheme relating to cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C2211/406—Refreshing of dynamic cells
- G11C2211/4065—Low level details of refresh operations
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Abstract
Description
Claims (6)
- 다수개의 뱅크들을 갖고, 상기 뱅크들이 적어도 둘 이상의 메모리 블락들에 공유되는 구조를 갖는 메모리 장치에 있어서,상기 메모리 장치의 리프레쉬 동작시, 상기 인접한 뱅크들이 상기 서로 다른 메모리 블락에서 활성화되는 단계; 및상기 메모리 장치의 노멀 동작시, 상기 인접한 뱅크들이 상기 같은 메모리 블락에서 활성화되는 단계를 구비하는 것을 특징으로 하는 어드레스 코딩 방법.
- 제1항에 있어서, 상기 메모리 블락들 각각은자신의 고유한 데이터 경로를 갖는 것을 특징으로 하는 어드레스 코딩 방법.
- 다수개의 뱅크들을 갖고, 상기 뱅크들이 상단부 및 하단부 메모리 블락들에 공유되는 구조를 갖는 메모리 장치에 있어서,상기 메모리 장치의 리프레쉬 동작시, 상기 뱅크들이 상기 상단부 또는 하단부 메모리 블락 어디에 속하는 지를 정하는 어드레스 신호를 상기 인접한 뱅크들끼리 서로 반대로 코딩하는 단계; 및상기 메모리 장치의 노멀 동작시, 상기 뱅크들이 상기 상단부 또는 하단부 메모리 블락 어디에 속하는 지를 정하는 상기 어드레스 신호를 상기 인접한 뱅크들 끼리 서로 동일하게 코딩하는 단계를 구비하는 것을 특징으로 하는 어드레스 코딩 방법.
- 다수개의 뱅크들이 상단부 및 하단부 메모리 블락들에 공유되는 구조를 갖는 메모리 장치의 어드레스 디코더에 있어서상기 뱅크들이 상기 상단부 또는 하단부 메모리 블락 어디에 속하는 지를 정하는 외부 어드레스 신호와 내부 어드레스 신호를 리프레쉬 신호에 응답하여 선택하는 먹스부들; 및상기 뱅크들 각각과 연결되고, 상기 메모리 장치로 입력되는 로우 어드레스 신호들과 함께 상기 먹스부들에서 출력되는 상기 외부 어드레스 신호 또는 상기 내부 어드레스 신호를 수신하고 디코딩하여 상기 해당 뱅크들 내 워드라인을 활성화시키는 뱅크 디코더들을 구비하고,상기 메모리 장치의 리프레쉬 동작시, 상기 먹스부들은 상기 내부 어드레스 신호와 상기 내부 어드레스 신호의 반전 신호가 교대로 인접한 상기 뱅크 디코더들로 제공되는 것을 특징으로 하는 메모리 장치의 어드레스 디코더.
- 삭제
- 제4항에 있어서, 상기 메모리 블락들 각각은자신의 고유한 데이터 경로를 갖는 것을 특징으로 하는 메모리 장치의 어드레스 디코더.
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KR1020040072107A KR100618860B1 (ko) | 2004-09-09 | 2004-09-09 | 메모리 장치의 리프레쉬시 센싱 노이즈를 감소시킬 수있는 어드레스 코딩 방법 및 이를 구현한 어드레스 디코더 |
US11/152,449 US7180816B2 (en) | 2004-09-09 | 2005-06-14 | Address coding method and address decoder for reducing sensing noise during refresh operation of memory device |
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KR1020040072107A KR100618860B1 (ko) | 2004-09-09 | 2004-09-09 | 메모리 장치의 리프레쉬시 센싱 노이즈를 감소시킬 수있는 어드레스 코딩 방법 및 이를 구현한 어드레스 디코더 |
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JP2007036425A (ja) * | 2005-07-25 | 2007-02-08 | Pentax Corp | アナログ機器駆動システムおよび撮像装置 |
KR20090075909A (ko) * | 2008-01-07 | 2009-07-13 | 삼성전자주식회사 | 반도체 메모리 장치에서의 멀티 워드라인 테스트를 위한어드레스 코딩방법 |
JP5923867B2 (ja) * | 2010-05-25 | 2016-05-25 | 株式会社リコー | 画像読み取り装置及び画像形成装置 |
US8634268B2 (en) * | 2010-10-27 | 2014-01-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | Memory circuit having decoding circuits and method of operating the same |
KR101212738B1 (ko) | 2010-10-29 | 2012-12-14 | 에스케이하이닉스 주식회사 | 리프레쉬 제어회로 및 이를 포함하는 반도체 메모리 장치 및 리프레쉬 제어방법 |
KR101197273B1 (ko) | 2011-01-27 | 2012-11-05 | 에스케이하이닉스 주식회사 | 리프레쉬회로 |
US8982649B2 (en) | 2011-08-12 | 2015-03-17 | Gsi Technology, Inc. | Systems and methods involving multi-bank, dual- or multi-pipe SRAMs |
US9727113B2 (en) | 2013-08-08 | 2017-08-08 | Linear Algebra Technologies Limited | Low power computational imaging |
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US11768689B2 (en) | 2013-08-08 | 2023-09-26 | Movidius Limited | Apparatus, systems, and methods for low power computational imaging |
US10001993B2 (en) | 2013-08-08 | 2018-06-19 | Linear Algebra Technologies Limited | Variable-length instruction buffer management |
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US10847212B1 (en) | 2016-12-06 | 2020-11-24 | Gsi Technology, Inc. | Read and write data processing circuits and methods associated with computational memory cells using two read multiplexers |
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JP3525123B2 (ja) | 2001-07-13 | 2004-05-10 | 日本アビオニクス株式会社 | Sdram記録装置のリフレッシュ方法 |
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