KR100574967B1 - Ｍｔｃｍｏｓ용 제어회로 - Google Patents

Ｍｔｃｍｏｓ용 제어회로 Download PDF

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Publication number
KR100574967B1
KR100574967B1 KR1020040005598A KR20040005598A KR100574967B1 KR 100574967 B1 KR100574967 B1 KR 100574967B1 KR 1020040005598 A KR1020040005598 A KR 1020040005598A KR 20040005598 A KR20040005598 A KR 20040005598A KR 100574967 B1 KR100574967 B1 KR 100574967B1
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KR
South Korea
Prior art keywords
mtcmos
signal
logic state
control signal
control
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KR1020040005598A
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English (en)
Korean (ko)
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KR20050077921A (ko
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원효식
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삼성전자주식회사
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Priority to KR1020040005598A priority Critical patent/KR100574967B1/ko
Priority to US10/996,084 priority patent/US7215155B2/en
Priority to JP2005017129A priority patent/JP5010104B2/ja
Publication of KR20050077921A publication Critical patent/KR20050077921A/ko
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    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16B—DEVICES FOR FASTENING OR SECURING CONSTRUCTIONAL ELEMENTS OR MACHINE PARTS TOGETHER, e.g. NAILS, BOLTS, CIRCLIPS, CLAMPS, CLIPS OR WEDGES; JOINTS OR JOINTING
    • F16B11/00—Connecting constructional elements or machine parts by sticking or pressing them together, e.g. cold pressure welding
    • F16B11/006—Connecting constructional elements or machine parts by sticking or pressing them together, e.g. cold pressure welding by gluing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
    • H03K19/08—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices
    • H03K19/094—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors
    • H03K19/096—Synchronous circuits, i.e. using clock signals
    • H03K19/0963—Synchronous circuits, i.e. using clock signals using transistors of complementary type
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16B—DEVICES FOR FASTENING OR SECURING CONSTRUCTIONAL ELEMENTS OR MACHINE PARTS TOGETHER, e.g. NAILS, BOLTS, CIRCLIPS, CLAMPS, CLIPS OR WEDGES; JOINTS OR JOINTING
    • F16B37/00—Nuts or like thread-engaging members
    • F16B37/04—Devices for fastening nuts to surfaces, e.g. sheets, plates
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0008—Arrangements for reducing power consumption
    • H03K19/0016—Arrangements for reducing power consumption by using a control or a clock signal, e.g. in order to apply power supply

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • Mathematical Physics (AREA)
  • Mechanical Engineering (AREA)
  • Power Engineering (AREA)
  • Logic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
KR1020040005598A 2004-01-29 2004-01-29 Ｍｔｃｍｏｓ용 제어회로 Expired - Fee Related KR100574967B1 (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1020040005598A KR100574967B1 (ko) 2004-01-29 2004-01-29 Ｍｔｃｍｏｓ용 제어회로
US10/996,084 US7215155B2 (en) 2004-01-29 2004-11-23 Control circuits and methods including delay times for multi-threshold CMOS devices
JP2005017129A JP5010104B2 (ja) 2004-01-29 2005-01-25 Ｍｔｃｍｏｓ装置及びその制御方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020040005598A KR100574967B1 (ko) 2004-01-29 2004-01-29 Ｍｔｃｍｏｓ용 제어회로

Publications (2)

Publication Number Publication Date
KR20050077921A KR20050077921A (ko) 2005-08-04
KR100574967B1 true KR100574967B1 (ko) 2006-04-28

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Family Applications (1)

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KR1020040005598A Expired - Fee Related KR100574967B1 (ko) 2004-01-29 2004-01-29 Ｍｔｃｍｏｓ용 제어회로

Country Status (3)

Country Link
US (1) US7215155B2 (enExample)
JP (1) JP5010104B2 (enExample)
KR (1) KR100574967B1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101045295B1 (ko) 2004-04-29 2011-06-29 삼성전자주식회사 Ｍｔｃｍｏｓ 플립-플롭, 그를 포함하는 ｍｔｃｍｏｓ회로, 및 그 생성 방법

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100564634B1 (ko) * 2004-10-08 2006-03-28 삼성전자주식회사 단락전류 방지회로를 구비한 ｍｔｃｍｏｓ 회로 시스템
JP2008522258A (ja) * 2004-11-30 2008-06-26 フリースケール セミコンダクター インコーポレイテッド 選択的なパワー・ゲーティングを用いて電力消費を低減する装置及び方法
US20060273391A1 (en) * 2005-06-01 2006-12-07 Diaz Carlos H CMOS devices for low power integrated circuits
US7391232B1 (en) * 2007-10-30 2008-06-24 International Business Machines Corporation Method and apparatus for extending lifetime reliability of digital logic devices through reversal of aging mechanisms
US7391233B1 (en) * 2007-10-30 2008-06-24 International Business Machines Corporation Method and apparatus for extending lifetime reliability of digital logic devices through removal of aging mechanisms
KR101477512B1 (ko) * 2008-03-18 2014-12-31 삼성전자주식회사 액티브 클럭 쉴딩 구조의 회로 및 이를 포함하는 반도체집적 회로
KR101003153B1 (ko) * 2009-05-15 2010-12-21 주식회사 하이닉스반도체 전압 안정화 회로 및 이를 이용한 반도체 메모리 장치
US8026741B2 (en) * 2009-07-31 2011-09-27 Apple Inc. CMOS circuitry with mixed transistor parameters
US7977972B2 (en) 2009-08-07 2011-07-12 The Board Of Trustees Of The University Of Arkansas Ultra-low power multi-threshold asynchronous circuit design
US8736332B2 (en) * 2009-12-17 2014-05-27 Lsi Corporation Leakage current reduction in a sequential circuit
US8390331B2 (en) * 2009-12-29 2013-03-05 Nxp B.V. Flexible CMOS library architecture for leakage power and variability reduction
US8738940B2 (en) 2011-09-06 2014-05-27 Lsi Corporation Power controller for SoC power gating applications
US8669800B2 (en) * 2012-02-24 2014-03-11 International Business Machines Corporation Implementing power saving self powering down latch structure
US9094013B2 (en) 2013-05-24 2015-07-28 The Board Of Trustees Of The University Of Arkansas Single component sleep-convention logic (SCL) modules
US9287858B1 (en) 2014-09-03 2016-03-15 Texas Instruments Incorporated Low leakage shadow latch-based multi-threshold CMOS sequential circuit
US10367514B2 (en) 2015-01-24 2019-07-30 Circuit Seed, Llc Passive phased injection locked circuit
EP3329598A4 (en) 2015-07-29 2019-07-31 Circuit Seed, LLC COMPLEMENTARY POWER FIELD EFFECT TRANSISTOR DEVICES AND AMPLIFIERS
WO2017019973A1 (en) * 2015-07-30 2017-02-02 Circuit Seed, Llc Multi-stage and feed forward compensated complementary current field effect transistor amplifiers
US10476457B2 (en) 2015-07-30 2019-11-12 Circuit Seed, Llc Low noise trans-impedance amplifiers based on complementary current field-effect transistor devices
CN108140614A (zh) 2015-07-30 2018-06-08 电路种子有限责任公司 基于互补电流场效应晶体管装置的参考产生器和电流源晶体管
US10283506B2 (en) 2015-12-14 2019-05-07 Circuit Seed, Llc Super-saturation current field effect transistor and trans-impedance MOS device
KR102420005B1 (ko) * 2017-12-21 2022-07-12 에스케이하이닉스 주식회사 파워 게이팅 제어 회로
US11271566B2 (en) * 2018-12-14 2022-03-08 Integrated Device Technology, Inc. Digital logic compatible inputs in compound semiconductor circuits

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW334532B (en) 1996-07-05 1998-06-21 Matsushita Electric Industrial Co Ltd The inspection system of semiconductor IC and the method of generation
TW365007B (en) 1996-12-27 1999-07-21 Matsushita Electric Industrial Co Ltd Driving method of semiconductor integrated circuit and the semiconductor integrated circuit
JP3856892B2 (ja) * 1997-03-03 2006-12-13 日本電信電話株式会社 自己同期型パイプラインデータパス回路および非同期信号制御回路
JPH10261946A (ja) * 1997-03-19 1998-09-29 Mitsubishi Electric Corp 半導体集積回路
JPH11112297A (ja) * 1997-10-06 1999-04-23 Nec Corp ラッチ回路及びこのラッチ回路を有する半導体集積回路
WO1999066640A1 (en) 1998-06-18 1999-12-23 Hitachi, Ltd. Semiconductor integrated circuit
JP3878431B2 (ja) * 2000-06-16 2007-02-07 株式会社ルネサステクノロジ 半導体集積回路装置
JP3727838B2 (ja) * 2000-09-27 2005-12-21 株式会社東芝 半導体集積回路
JP3864248B2 (ja) * 2001-12-17 2006-12-27 インターナショナル・ビジネス・マシーンズ・コーポレーション 半導体装置
JP3986393B2 (ja) * 2002-08-27 2007-10-03 富士通株式会社 不揮発性データ記憶回路を有する集積回路装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101045295B1 (ko) 2004-04-29 2011-06-29 삼성전자주식회사 Ｍｔｃｍｏｓ 플립-플롭, 그를 포함하는 ｍｔｃｍｏｓ회로, 및 그 생성 방법

Also Published As

Publication number Publication date
US20050168242A1 (en) 2005-08-04
JP5010104B2 (ja) 2012-08-29
KR20050077921A (ko) 2005-08-04
JP2005218099A (ja) 2005-08-11
US7215155B2 (en) 2007-05-08

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