KR100543444B1 - 고정 패턴 잡음을 감소시키기 위한 영상 소자 및 그 방법 - Google Patents

고정 패턴 잡음을 감소시키기 위한 영상 소자 및 그 방법 Download PDF

Info

Publication number
KR100543444B1
KR100543444B1 KR1020030009154A KR20030009154A KR100543444B1 KR 100543444 B1 KR100543444 B1 KR 100543444B1 KR 1020030009154 A KR1020030009154 A KR 1020030009154A KR 20030009154 A KR20030009154 A KR 20030009154A KR 100543444 B1 KR100543444 B1 KR 100543444B1
Authority
KR
South Korea
Prior art keywords
analog
sensor array
active pixel
pixel sensor
correlated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020030009154A
Other languages
English (en)
Korean (ko)
Other versions
KR20040065516A (ko
Inventor
남정현
Original Assignee
삼성전자주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자주식회사 filed Critical 삼성전자주식회사
Publication of KR20040065516A publication Critical patent/KR20040065516A/ko
Application granted granted Critical
Publication of KR100543444B1 publication Critical patent/KR100543444B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/672—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction between adjacent sensors or output registers for reading a single image
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Color Television Image Signal Generators (AREA)
  • Solid State Image Pick-Up Elements (AREA)
KR1020030009154A 2003-01-13 2003-02-13 고정 패턴 잡음을 감소시키기 위한 영상 소자 및 그 방법 Expired - Fee Related KR100543444B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/340,745 2003-01-13
US10/340,745 US7408443B2 (en) 2003-01-13 2003-01-13 Circuit and method for reducing fixed pattern noise

Publications (2)

Publication Number Publication Date
KR20040065516A KR20040065516A (ko) 2004-07-22
KR100543444B1 true KR100543444B1 (ko) 2006-01-23

Family

ID=32711380

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020030009154A Expired - Fee Related KR100543444B1 (ko) 2003-01-13 2003-02-13 고정 패턴 잡음을 감소시키기 위한 영상 소자 및 그 방법

Country Status (3)

Country Link
US (1) US7408443B2 (enExample)
JP (1) JP4962923B2 (enExample)
KR (1) KR100543444B1 (enExample)

Families Citing this family (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7420602B2 (en) 2001-05-29 2008-09-02 Samsung Semiconductor Israel R&D Center (Sirc) Cmos imager for cellular applications and methods of using such
US7738013B2 (en) * 2001-05-29 2010-06-15 Samsung Electronics Co., Ltd. Systems and methods for power conservation in a CMOS imager
US7068446B2 (en) * 2003-05-05 2006-06-27 Illumitech Inc. Compact non-imaging light collector
US7859581B2 (en) * 2003-07-15 2010-12-28 Eastman Kodak Company Image sensor with charge binning and dual channel readout
WO2005022459A2 (en) * 2003-08-28 2005-03-10 Transchip, Inc. Systems and methods for power conservation in a cmos imager
US20050062866A1 (en) * 2003-09-23 2005-03-24 Ang Lin Ping Multiplexed pixel column architecture for imagers
US7619669B2 (en) * 2003-12-29 2009-11-17 Micron Technologies, Inc. Power savings with multiple readout circuits
JP4107269B2 (ja) * 2004-02-23 2008-06-25 ソニー株式会社 固体撮像装置
JP2005312025A (ja) * 2004-04-21 2005-11-04 Magnachip Semiconductor Ltd 高速アナログ信号処理可能なｃｍｏｓイメージセンサ
JP2005318544A (ja) * 2004-04-26 2005-11-10 Magnachip Semiconductor Ltd 高速アナログ信号処理可能なｃｍｏｓイメージセンサ
JP4157083B2 (ja) * 2004-09-09 2008-09-24 マイクロン テクノロジー，インコーポレイテッド オンチップ半列並列パイプラインアナログ‐デジタル変換器を具えるイメージセンサ
US20060170788A1 (en) * 2005-02-03 2006-08-03 Transchip, Inc. Image sensor with balanced switching noise
US20060187329A1 (en) * 2005-02-24 2006-08-24 Micron Technology, Inc. Clamped capacitor readout noise rejection circuit for imagers
US7554066B2 (en) * 2005-04-13 2009-06-30 Aptina Imaging Corporation Method and apparatus employing dynamic element matching for reduction of column-wise fixed pattern noise in a solid state imaging sensor
JP4599258B2 (ja) * 2005-09-16 2010-12-15 富士フイルム株式会社 固体撮像素子
JP4984517B2 (ja) * 2005-12-15 2012-07-25 コニカミノルタホールディングス株式会社 撮像ユニット及び撮像装置
US7659925B2 (en) * 2005-10-04 2010-02-09 Alexander Krymski High speed CMOS image sensor circuits with memory readout
US8102442B2 (en) * 2006-05-23 2012-01-24 Thomson Licensing Image sensor circuit
KR100803229B1 (ko) * 2006-08-09 2008-02-14 (주) 픽셀플러스 리드 아웃 회로를 공유하는 이미지 센서 및 리드 아웃회로를 공유하는 방법
TWI345910B (en) * 2006-10-02 2011-07-21 Novatek Microelectronics Corp Cmos image sensor for high-speed operation
DE102007058973A1 (de) * 2007-12-07 2009-06-18 Arnold & Richter Cine Technik Gmbh & Co. Betriebs Kg Bildsensor
KR101448918B1 (ko) 2007-12-18 2014-10-15 삼성전자주식회사 픽셀 데이터의 고속 출력이 가능한 ｃｍｏｓ 이미지 센서
US8144226B2 (en) 2008-01-04 2012-03-27 AltaSens, Inc Two-by-two pixel structure in an imaging system-on-chip
TWI504256B (zh) * 2008-04-07 2015-10-11 Sony Corp 固態成像裝置，其訊號處理方法，及電子設備
US8174603B2 (en) * 2008-05-01 2012-05-08 Alexander Krymski Image sensors and methods with antiblooming channels and two side driving of control signals
US8077227B2 (en) * 2008-05-02 2011-12-13 Aptina Imaging Corporation Method and apparatus providing analog row noise correction and hot pixel filtering
US8081247B2 (en) * 2008-06-18 2011-12-20 Omnivision Technologies, Inc. Partial row readout for image sensor
US8059173B2 (en) * 2008-09-26 2011-11-15 On Semiconductor Trading Ltd. Correlated double sampling pixel and method
JP2010098516A (ja) * 2008-10-16 2010-04-30 Sony Corp 撮像素子およびその制御方法並びにカメラ
JP5365223B2 (ja) * 2009-01-29 2013-12-11 富士通セミコンダクター株式会社 撮像装置、撮像装置の信号処理方法およびイメージセンサチップ
JP2012049912A (ja) * 2010-08-27 2012-03-08 Canon Inc 光電変換装置および撮像システム
JP2012049911A (ja) * 2010-08-27 2012-03-08 Canon Inc 光電変換装置および撮像システム
KR101195389B1 (ko) * 2010-11-01 2012-10-30 에스케이하이닉스 주식회사 서브 샘플링 기능을 구비한 이미지 센서
US8723093B2 (en) 2011-01-10 2014-05-13 Alexander Krymski Image sensors and methods with shared control lines
JP5721518B2 (ja) * 2011-04-21 2015-05-20 キヤノン株式会社 撮像素子及び撮像装置
KR101822661B1 (ko) * 2011-10-27 2018-01-26 삼성전자주식회사 비전 인식 장치 및 방법
US9294703B2 (en) 2012-12-03 2016-03-22 Samsung Electronics Co., Ltd. Image sensor including data transmission circuit having split bus segments
KR101444014B1 (ko) * 2013-03-07 2014-09-23 주식회사 동부하이텍 이미지 센서의 구동 회로 및 구동 방법
US9369648B2 (en) 2013-06-18 2016-06-14 Alexander Krymski Image sensors, methods, and pixels with tri-level biased transfer gates
JP2015128253A (ja) * 2013-12-27 2015-07-09 キヤノン株式会社 固体撮像装置およびその駆動方法
US12401911B2 (en) 2014-11-07 2025-08-26 Duelight Llc Systems and methods for generating a high-dynamic range (HDR) pixel stream
US12401912B2 (en) 2014-11-17 2025-08-26 Duelight Llc System and method for generating a digital image
KR20160067251A (ko) * 2014-12-03 2016-06-14 삼성디스플레이 주식회사 유기 발광 표시 장치 및 이의 구동방법
KR102210513B1 (ko) 2014-12-11 2021-02-02 삼성전자주식회사 커플링-프리 읽기를 수행할 수 있는 이미지 센서와 이를 포함하는 장치
US12445736B2 (en) 2015-05-01 2025-10-14 Duelight Llc Systems and methods for generating a digital image
CN106686326B (zh) * 2016-12-27 2019-08-20 上海集成电路研发中心有限公司 一种全画幅图像传感器系统
CN106791514B (zh) * 2016-12-29 2020-01-10 上海集成电路研发中心有限公司 全画幅图像传感器

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2741703B2 (ja) * 1986-09-19 1998-04-22 キヤノン株式会社 光電変換装置
JPH0313192A (ja) * 1989-06-12 1991-01-22 Canon Inc 固体撮像装置
JPH09238286A (ja) * 1996-02-29 1997-09-09 Toshiba Corp デジタル光学センサ
US6885396B1 (en) * 1998-03-09 2005-04-26 Micron Technology, Inc. Readout circuit with gain and analog-to-digital a conversion for image sensor
JP2000012819A (ja) * 1998-06-17 2000-01-14 Nikon Corp 固体撮像素子
JP3854729B2 (ja) * 1998-09-02 2006-12-06 キヤノン株式会社 撮像装置およびそれを用いた撮像システム
JP3011209B1 (ja) * 1998-11-16 2000-02-21 日本電気株式会社 イメージセンサ
US6661457B1 (en) * 1999-03-22 2003-12-09 Biomorphic Vlsi, Inc. Pixel read-out architecture
JP3501682B2 (ja) * 1999-05-31 2004-03-02 キヤノン株式会社 カラー撮像装置及びそれを用いた撮像システム
JP2002165132A (ja) * 2000-11-22 2002-06-07 Innotech Corp 固体撮像装置及びその駆動方法
WO2003017648A2 (en) * 2001-08-17 2003-02-27 Micron Technology, Inc. Doubling of speed in cmos sensor with column-parallel adcs
US6838651B1 (en) * 2002-03-28 2005-01-04 Ess Technology, Inc. High sensitivity snap shot CMOS image sensor

Also Published As

Publication number Publication date
US20040135910A1 (en) 2004-07-15
KR20040065516A (ko) 2004-07-22
JP2004222286A (ja) 2004-08-05
US7408443B2 (en) 2008-08-05
JP4962923B2 (ja) 2012-06-27

Similar Documents

Publication Publication Date Title
KR100543444B1 (ko) 고정 패턴 잡음을 감소시키기 위한 영상 소자 및 그 방법
US9214491B2 (en) Solid-state imaging apparatus for causing an FD capacitor value to be variable without increasing a number of elements
US6914227B2 (en) Image sensing apparatus capable of outputting image by converting resolution by adding and reading out a plurality of pixels, its control method, and image sensing system
US7990448B2 (en) Solid-state image pickup apparatus and method for driving the same
US8049799B2 (en) Method of driving solid-state imaging apparatus
JP4611296B2 (ja) 電荷ビニング型イメージセンサ
USRE41664E1 (en) Solid-state imaging device, driving method therefor, and imaging apparatus
US7242427B2 (en) X-Y address type solid-state image pickup device with an image averaging circuit disposed in the noise cancel circuit
EP2037668B1 (en) Image sensor apparatus and method for improved dynamic range with multiple readout circuit paths
KR101177140B1 (ko) 고체 촬상 장치, 고체 촬상 장치의 구동 방법 및 촬상 장치
KR20060070470A (ko) 고체 촬상 장치 및 고체 촬상 장치의 구동 방법
US10425605B2 (en) Image sensor and image capturing apparatus
US8054375B2 (en) Physical quantity detecting device, method of driving the physical quantity detecting device and imaging apparatus
US8094220B2 (en) Solid-state imaging apparatus and driving method of solid-state imaging apparatus
JP5446717B2 (ja) 撮像装置
US8115850B2 (en) Solid-state imaging apparatus and driving method for the same
US8139132B2 (en) Solid-state imaging apparatus and driving method for solid-state imaging apparatus
JP5966357B2 (ja) 撮像素子および撮像装置
JP7160129B2 (ja) 撮像素子および撮像装置
KR20240159907A (ko) 촬상 소자 및 전자 기기
WO2025192176A1 (ja) 撮像素子および電子機器

Legal Events

Date Code Title Description
A201 Request for examination
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

R18-X000 Changes to party contact information recorded

St.27 status event code: A-3-3-R10-R18-oth-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

D13-X000 Search requested

St.27 status event code: A-1-2-D10-D13-srh-X000

D14-X000 Search report completed

St.27 status event code: A-1-2-D10-D14-srh-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PN2301 Change of applicant

St.27 status event code: A-3-3-R10-R13-asn-PN2301

St.27 status event code: A-3-3-R10-R11-asn-PN2301

PN2301 Change of applicant

St.27 status event code: A-3-3-R10-R13-asn-PN2301

St.27 status event code: A-3-3-R10-R11-asn-PN2301

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

FPAY Annual fee payment

Payment date: 20130102

Year of fee payment: 8

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

FPAY Annual fee payment

Payment date: 20140103

Year of fee payment: 9

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 9

FPAY Annual fee payment

Payment date: 20141231

Year of fee payment: 10

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 10

FPAY Annual fee payment

Payment date: 20160104

Year of fee payment: 11

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 11

FPAY Annual fee payment

Payment date: 20170102

Year of fee payment: 12

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 12

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 13

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 14

FPAY Annual fee payment

Payment date: 20191226

Year of fee payment: 15

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 15

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 16

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 17

PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20230110

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20230110