KR100302091B1 - 모트간에간격이없는정적랜덤억세스메모리셀및이의형성방법 - Google Patents

모트간에간격이없는정적랜덤억세스메모리셀및이의형성방법 Download PDF

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Publication number
KR100302091B1
KR100302091B1 KR1019920023584A KR920023584A KR100302091B1 KR 100302091 B1 KR100302091 B1 KR 100302091B1 KR 1019920023584 A KR1019920023584 A KR 1019920023584A KR 920023584 A KR920023584 A KR 920023584A KR 100302091 B1 KR100302091 B1 KR 100302091B1
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KR
South Korea
Prior art keywords
forming
region
gate
strap
conductive
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
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KR1019920023584A
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English (en)
Korean (ko)
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KR930014991A (ko
Inventor
마크에스.로더
Original Assignee
윌리엄 비. 켐플러
텍사스 인스트루먼츠 인코포레이티드
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Application filed by 윌리엄 비. 켐플러, 텍사스 인스트루먼츠 인코포레이티드 filed Critical 윌리엄 비. 켐플러
Publication of KR930014991A publication Critical patent/KR930014991A/ko
Application granted granted Critical
Publication of KR100302091B1 publication Critical patent/KR100302091B1/ko
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Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B10/00—Static random access memory [SRAM] devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • G11C11/417—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
    • G11C11/418—Address circuits
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01—Manufacture or treatment
    • H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
    • H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
    • H10D84/0149—Manufacturing their interconnections or electrodes, e.g. source or drain electrodes
    • H10W20/0698—

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Memories (AREA)
KR1019920023584A 1991-12-09 1992-12-08 모트간에간격이없는정적랜덤억세스메모리셀및이의형성방법 Expired - Lifetime KR100302091B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/805,393 US5264385A (en) 1991-12-09 1991-12-09 SRAM design with no moat-to-moat spacing
US805,393 1991-12-09

Publications (2)

Publication Number Publication Date
KR930014991A KR930014991A (ko) 1993-07-23
KR100302091B1 true KR100302091B1 (ko) 2001-10-22

Family

ID=25191448

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019920023584A Expired - Lifetime KR100302091B1 (ko) 1991-12-09 1992-12-08 모트간에간격이없는정적랜덤억세스메모리셀및이의형성방법

Country Status (6)

Country Link
US (1) US5264385A (enExample)
EP (1) EP0548675B1 (enExample)
JP (1) JPH05326887A (enExample)
KR (1) KR100302091B1 (enExample)
DE (1) DE69231030T2 (enExample)
TW (1) TW281768B (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5554874A (en) * 1995-06-05 1996-09-10 Quantum Effect Design, Inc. Six-transistor cell with wide bit-line pitch, double words lines, and bit-line contact shared among four cells
KR100214843B1 (ko) * 1996-03-29 1999-08-02 김주용 반도체 소자 및 그의 제조방법
KR100490648B1 (ko) * 2000-10-04 2005-05-24 주식회사 하이닉스반도체 에스램셀의 제조 방법
US6326257B1 (en) * 2001-02-13 2001-12-04 United Microelectronics Corp. Method of fabricating static random access memory with spacers
JP2003133417A (ja) * 2001-10-26 2003-05-09 Matsushita Electric Ind Co Ltd 半導体集積回路装置及びその設計方法
DE102004037087A1 (de) 2004-07-30 2006-03-23 Advanced Micro Devices, Inc., Sunnyvale Selbstvorspannende Transistorstruktur und SRAM-Zellen mit weniger als sechs Transistoren
DE102008007029B4 (de) 2008-01-31 2014-07-03 Globalfoundries Dresden Module One Limited Liability Company & Co. Kg Betrieb einer elektronischen Schaltung mit körpergesteuertem Doppelkanaltransistor und SRAM-Zelle mit körpergesteuertem Doppelkanaltransistor
KR102178732B1 (ko) * 2013-12-20 2020-11-13 삼성전자주식회사 반도체 소자

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02312271A (ja) * 1989-05-29 1990-12-27 Hitachi Ltd 半導体記憶装置およびその製造方法
JPH03218667A (ja) * 1989-11-01 1991-09-26 Hitachi Ltd 半導体記憶装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4416049A (en) * 1970-05-30 1983-11-22 Texas Instruments Incorporated Semiconductor integrated circuit with vertical implanted polycrystalline silicon resistor
US4408385A (en) * 1978-06-15 1983-10-11 Texas Instruments Incorporated Semiconductor integrated circuit with implanted resistor element in polycrystalline silicon layer
JPS5954260A (ja) * 1982-09-22 1984-03-29 Hitachi Ltd 半導体記憶装置およびその製造方法
US4804636A (en) * 1985-05-01 1989-02-14 Texas Instruments Incorporated Process for making integrated circuits having titanium nitride triple interconnect
US4774203A (en) * 1985-10-25 1988-09-27 Hitachi, Ltd. Method for making static random-access memory device
JP2547800B2 (ja) * 1987-11-30 1996-10-23 株式会社日立製作所 半導体集積回路装置及びその製造方法
DE69011038T2 (de) * 1989-11-02 1995-01-05 Seiko Epson Corp Integrierte Halbleiterschaltung.
JPH0831534B2 (ja) * 1989-11-24 1996-03-27 シャープ株式会社 半導体記憶装置及びその製造方法
US5124774A (en) * 1990-01-12 1992-06-23 Paradigm Technology, Inc. Compact SRAM cell layout
EP0469217B1 (en) * 1990-07-31 1996-04-10 International Business Machines Corporation Method of forming stacked self-aligned polysilicon PFET devices and structures resulting therefrom
US5114879A (en) * 1990-11-30 1992-05-19 Texas Instruments Incorporated Method of forming a microelectronic contact

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02312271A (ja) * 1989-05-29 1990-12-27 Hitachi Ltd 半導体記憶装置およびその製造方法
JPH03218667A (ja) * 1989-11-01 1991-09-26 Hitachi Ltd 半導体記憶装置

Also Published As

Publication number Publication date
TW281768B (enExample) 1996-07-21
EP0548675A2 (en) 1993-06-30
DE69231030T2 (de) 2000-11-02
KR930014991A (ko) 1993-07-23
DE69231030D1 (de) 2000-06-15
JPH05326887A (ja) 1993-12-10
EP0548675B1 (en) 2000-05-10
US5264385A (en) 1993-11-23
EP0548675A3 (en) 1995-09-20

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