KR100283851B1 - 모니터 장치 및 모니터 방법 - Google Patents

모니터 장치 및 모니터 방법 Download PDF

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Publication number
KR100283851B1
KR100283851B1 KR1019950020304A KR19950020304A KR100283851B1 KR 100283851 B1 KR100283851 B1 KR 100283851B1 KR 1019950020304 A KR1019950020304 A KR 1019950020304A KR 19950020304 A KR19950020304 A KR 19950020304A KR 100283851 B1 KR100283851 B1 KR 100283851B1
Authority
KR
South Korea
Prior art keywords
image
display
mode
monitor
processing apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1019950020304A
Other languages
English (en)
Korean (ko)
Other versions
KR960005926A (ko
Inventor
히데히토 요코모리
히로토 고이즈미
Original Assignee
기리야마 겐지
테루.엔지니아링구 가부시키가이샤
히가시 데쓰로
동경 엘렉트론주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP6158944A external-priority patent/JPH0831902A/ja
Priority claimed from JP15894394A external-priority patent/JP2945837B2/ja
Application filed by 기리야마 겐지, 테루.엔지니아링구 가부시키가이샤, 히가시 데쓰로, 동경 엘렉트론주식회사 filed Critical 기리야마 겐지
Publication of KR960005926A publication Critical patent/KR960005926A/ko
Application granted granted Critical
Publication of KR100283851B1 publication Critical patent/KR100283851B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1019950020304A 1994-07-11 1995-07-11 모니터 장치 및 모니터 방법 Expired - Fee Related KR100283851B1 (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP94-158944 1994-07-11
JP94-158943 1994-07-11
JP6158944A JPH0831902A (ja) 1994-07-11 1994-07-11 モニタ装置およびモニタ方法
JP15894394A JP2945837B2 (ja) 1994-07-11 1994-07-11 板状体の搬送機構および搬送方法

Publications (2)

Publication Number Publication Date
KR960005926A KR960005926A (ko) 1996-02-23
KR100283851B1 true KR100283851B1 (ko) 2001-04-02

Family

ID=27321442

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950020304A Expired - Fee Related KR100283851B1 (ko) 1994-07-11 1995-07-11 모니터 장치 및 모니터 방법

Country Status (3)

Country Link
US (1) US5801764A (enExample)
KR (1) KR100283851B1 (enExample)
TW (1) TW289139B (enExample)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08335622A (ja) * 1995-06-07 1996-12-17 Tokyo Electron Ltd 基板搬送装置
US6285200B1 (en) * 1998-03-02 2001-09-04 Agilent Technologies, Inc. Apparatus and method for testing integrated circuit devices
US6518996B1 (en) * 1999-02-22 2003-02-11 Optical Gaging Products, Inc. Compact video inspection apparatus with Y, Z, X compounded measurement axes
JP2001016622A (ja) * 1999-06-30 2001-01-19 Agilent Technologies Japan Ltd 撮像素子のデバッグ装置と試験方法
US6190110B1 (en) * 1999-09-28 2001-02-20 Systems & Electronics, Inc. Residual mail detection and container alignment verification and method
KR100817134B1 (ko) * 2002-03-25 2008-03-27 엘지.필립스 엘시디 주식회사 액정 패널의 제조장치 및 방법
US7129694B2 (en) * 2002-05-23 2006-10-31 Applied Materials, Inc. Large substrate test system
DE10227332A1 (de) * 2002-06-19 2004-01-15 Akt Electron Beam Technology Gmbh Ansteuervorrichtung mit verbesserten Testeneigenschaften
US20060038554A1 (en) * 2004-02-12 2006-02-23 Applied Materials, Inc. Electron beam test system stage
US7319335B2 (en) * 2004-02-12 2008-01-15 Applied Materials, Inc. Configurable prober for TFT LCD array testing
US7355418B2 (en) * 2004-02-12 2008-04-08 Applied Materials, Inc. Configurable prober for TFT LCD array test
US6833717B1 (en) * 2004-02-12 2004-12-21 Applied Materials, Inc. Electron beam test system with integrated substrate transfer module
US7075323B2 (en) * 2004-07-29 2006-07-11 Applied Materials, Inc. Large substrate test system
US7256606B2 (en) * 2004-08-03 2007-08-14 Applied Materials, Inc. Method for testing pixels for LCD TFT displays
CN101119782B (zh) 2004-09-21 2010-11-17 时间游戏Ip公司 多玩家游戏的系统
US20080214273A1 (en) * 2004-09-21 2008-09-04 Snoddy Jon H System, method and handheld controller for multi-player gaming
US7535238B2 (en) * 2005-04-29 2009-05-19 Applied Materials, Inc. In-line electron beam test system
CN102353890B (zh) * 2006-03-14 2014-09-24 应用材料公司 减小多个柱状电子束测试系统中的串扰的方法
US7602199B2 (en) 2006-05-31 2009-10-13 Applied Materials, Inc. Mini-prober for TFT-LCD testing
US7786742B2 (en) 2006-05-31 2010-08-31 Applied Materials, Inc. Prober for electronic device testing on large area substrates
JP4447631B2 (ja) * 2007-11-05 2010-04-07 東京エレクトロン株式会社 位置検出用治具
JP6046638B2 (ja) 2011-02-01 2016-12-21 タイムプレイ インク． 双方向体験システム及び方法と、そのためのコントローラ
CN105093574B (zh) * 2015-06-05 2018-06-08 京东方科技集团股份有限公司 显示面板检测台

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2861699A (en) * 1950-10-16 1958-11-25 Gen Mills Inc Method and apparatus for performing operations at a remote point
US4064534A (en) * 1976-04-20 1977-12-20 Leone International Sales Corporation System for monitoring the production of items which are initially difficult to physically inspect
DE3689406T2 (de) * 1985-10-11 1994-06-16 Hitachi Keiyo Eng Verfahren zur Plazierung eines oberflächenmontierten Teiles und eine Vorrichtung dazu.
CA2011517C (en) * 1989-05-15 1998-04-21 Gordon W. Arbeitman Flat touch screen workpad for a data processing system
US5129009A (en) * 1990-06-04 1992-07-07 Motorola, Inc. Method for automatic semiconductor wafer inspection
US5235407A (en) * 1990-08-27 1993-08-10 Sierra Research And Technology, Inc. System for placement and mounting of fine pitch integrated circuit devices
US5136948A (en) * 1990-10-31 1992-08-11 Kabushiki Kaisha Shinkawa Marking method and apparatus
US5432461A (en) * 1991-06-28 1995-07-11 Photon Dynamics, Inc. Method of testing active matrix liquid crystal display substrates
US5204739A (en) * 1992-02-07 1993-04-20 Karl Suss America, Inc. Proximity mask alignment using a stored video image
US5534892A (en) * 1992-05-20 1996-07-09 Sharp Kabushiki Kaisha Display-integrated type tablet device having and idle time in one display image frame to detect coordinates and having different electrode densities
US5543588A (en) * 1992-06-08 1996-08-06 Synaptics, Incorporated Touch pad driven handheld computing device
JP2963603B2 (ja) * 1993-05-31 1999-10-18 東京エレクトロン株式会社 プローブ装置のアライメント方法

Also Published As

Publication number Publication date
TW289139B (enExample) 1996-10-21
KR960005926A (ko) 1996-02-23
US5801764A (en) 1998-09-01

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