KR100257282B1 - 도포액 도포방법 - Google Patents
도포액 도포방법 Download PDFInfo
- Publication number
- KR100257282B1 KR100257282B1 KR1019970043599A KR19970043599A KR100257282B1 KR 100257282 B1 KR100257282 B1 KR 100257282B1 KR 1019970043599 A KR1019970043599 A KR 1019970043599A KR 19970043599 A KR19970043599 A KR 19970043599A KR 100257282 B1 KR100257282 B1 KR 100257282B1
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- coating liquid
- time
- supply
- coating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000576 coating method Methods 0.000 title claims abstract description 127
- 239000011248 coating agent Substances 0.000 title claims abstract description 112
- 238000000034 method Methods 0.000 title claims description 55
- 239000007788 liquid Substances 0.000 claims abstract description 200
- 239000000758 substrate Substances 0.000 claims abstract description 167
- 230000015572 biosynthetic process Effects 0.000 abstract description 7
- 229920002120 photoresistant polymer Polymers 0.000 description 120
- 239000010408 film Substances 0.000 description 97
- 239000002904 solvent Substances 0.000 description 8
- 239000004065 semiconductor Substances 0.000 description 7
- 230000003068 static effect Effects 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 6
- 239000010409 thin film Substances 0.000 description 6
- 230000002265 prevention Effects 0.000 description 5
- 238000004140 cleaning Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000001133 acceleration Effects 0.000 description 3
- 230000006399 behavior Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000002474 experimental method Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 238000000227 grinding Methods 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 238000001179 sorption measurement Methods 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 230000002349 favourable effect Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 238000010298 pulverizing process Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- GVGLGOZIDCSQPN-PVHGPHFFSA-N Heroin Chemical compound O([C@H]1[C@H](C=C[C@H]23)OC(C)=O)C4=C5[C@@]12CCN(C)[C@@H]3CC5=CC=C4OC(C)=O GVGLGOZIDCSQPN-PVHGPHFFSA-N 0.000 description 1
- 230000003466 anti-cipated effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000003595 mist Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/162—Coating on a rotating support, e.g. using a whirler or a spinner
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
- B05C11/02—Apparatus for spreading or distributing liquids or other fluent materials already applied to a surface ; Controlling means therefor; Control of the thickness of a coating by spreading or distributing liquids or other fluent materials already applied to the coated surface
- B05C11/08—Spreading liquid or other fluent material by manipulating the work, e.g. tilting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/002—Processes for applying liquids or other fluent materials the substrate being rotated
- B05D1/005—Spin coating
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
Abstract
Description
Claims (3)
- 기판에 도포액을 공급하여 소망 막두께의 도포피막을 형성하는 도포액 도포방법으로서 (a) 기판을 정지시킨 상태 혹은 공급회전수로 저속회전시킨 상태로 상기 기판의 표면중심 부근에 도포액의 공급을 개시하는 과정과, (b) 공급된 도포액이 공급 회전수에 의해서 넓어져 상기 기판의 표면전체를 덮기 전에, 상기 기판의 회전수를 공급 회전수보다도 높은 목표 회전수로 올려가는 과정과, (c) 상기 기판에의 도포액의 공급을 정지하는 과정과, (d) 상기 기판을 목표 회전수보다 낮은 피막형성 회전수로 회전시켜 도포피막을 형성하는 과정을 이 순서에 따라 설치하고, 기판을 목표 회전수로 고속회전시키는 시간을 조정하여 상기 도포피막의 막두께를 조정하도록 한 것을 특징으로 하는 도포액 도포방법.
- 제1항에 있어서, 상기 기판을 공급 회전수로 저속회전시킨 상태로 도포액의 공급을 개시하고, 상기 기판의 회전수가 목표 회전수에 도달한 후에 도포액의 공급을 정지함과 동시에, 이 공급장치 시점을 기준으로 하여 기판을 목표 회전수로 고속회전시키는 시간을 조정하는 것을 특징으로 하는 도포액 도포방법.
- 제1항에 있어서, 상기 기판을 정지시킨 상태로 도포액의 공급을 개시하고, 상기 기판의 회전수가 목표 회전수에 도달한 후에 도포액의 공급을 정지함과 동시에, 이 공급정지 시점을 기준으로 기판을 목표 회전수로 고속회전시키는 시간을 조정하는 것을 특징으로 하는 도포액 도포방법.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP30880296A JP3315608B2 (ja) | 1996-11-20 | 1996-11-20 | 塗布液塗布方法 |
JP96-308802 | 1996-11-20 | ||
JP1996-308802 | 1996-11-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR19980041854A KR19980041854A (ko) | 1998-08-17 |
KR100257282B1 true KR100257282B1 (ko) | 2000-06-01 |
Family
ID=17985493
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019970043599A Expired - Lifetime KR100257282B1 (ko) | 1996-11-20 | 1997-08-30 | 도포액 도포방법 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5976620A (ko) |
JP (1) | JP3315608B2 (ko) |
KR (1) | KR100257282B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100585071B1 (ko) * | 1999-09-13 | 2006-06-01 | 삼성전자주식회사 | 스핀 코팅을 이용한 포토레지스트막의 도포 방법 |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000082647A (ja) * | 1998-09-04 | 2000-03-21 | Nec Corp | レジスト膜の塗布方法及び塗布装置 |
JP3800282B2 (ja) * | 1998-11-30 | 2006-07-26 | 大日本スクリーン製造株式会社 | 塗布液塗布方法 |
EP1124252A2 (en) * | 2000-02-10 | 2001-08-16 | Applied Materials, Inc. | Apparatus and process for processing substrates |
TW509966B (en) * | 2000-03-14 | 2002-11-11 | Tokyo Electron Ltd | Substrate processing method and substrate processing apparatus |
US6281130B1 (en) * | 2000-06-16 | 2001-08-28 | Advanced Micro Devices, Inc. | Method for developing ultra-thin resist films |
US6524754B2 (en) | 2001-01-22 | 2003-02-25 | Photronics, Inc. | Fused silica pellicle |
US7351503B2 (en) * | 2001-01-22 | 2008-04-01 | Photronics, Inc. | Fused silica pellicle in intimate contact with the surface of a photomask |
US7371022B2 (en) | 2004-12-22 | 2008-05-13 | Sokudo Co., Ltd. | Developer endpoint detection in a track lithography system |
US7819079B2 (en) | 2004-12-22 | 2010-10-26 | Applied Materials, Inc. | Cartesian cluster tool configuration for lithography type processes |
US7699021B2 (en) | 2004-12-22 | 2010-04-20 | Sokudo Co., Ltd. | Cluster tool substrate throughput optimization |
US7798764B2 (en) | 2005-12-22 | 2010-09-21 | Applied Materials, Inc. | Substrate processing sequence in a cartesian robot cluster tool |
US7651306B2 (en) | 2004-12-22 | 2010-01-26 | Applied Materials, Inc. | Cartesian robot cluster tool architecture |
JP2007299941A (ja) * | 2006-04-28 | 2007-11-15 | Tokyo Electron Ltd | レジスト塗布方法、レジスト塗布装置及び記憶媒体 |
JP2008124368A (ja) * | 2006-11-15 | 2008-05-29 | Asahi Kasei Electronics Co Ltd | 塗布方法 |
JP4611961B2 (ja) * | 2006-11-15 | 2011-01-12 | 旭化成エレクトロニクス株式会社 | 塗布方法 |
KR100818674B1 (ko) * | 2007-02-07 | 2008-04-02 | 주식회사 에스앤에스텍 | 블랭크 마스크의 레지스트 코팅방법 및 이를 이용하여제조된 블랭크 마스크 및 포토마스크 |
JP5133641B2 (ja) * | 2007-09-27 | 2013-01-30 | 東京エレクトロン株式会社 | 塗布処理方法、塗布処理装置及びコンピュータ読み取り可能な記憶媒体 |
JP5337180B2 (ja) * | 2010-04-08 | 2013-11-06 | 東京エレクトロン株式会社 | 塗布処理方法、プログラム、コンピュータ記憶媒体及び塗布処理装置 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5405813A (en) * | 1994-03-17 | 1995-04-11 | Vlsi Technology, Inc. | Optimized photoresist dispense method |
US5677001A (en) * | 1996-08-22 | 1997-10-14 | Vanguard International Semiconductor Corporation | Striation-free coating method for high viscosity resist coating |
US5773082A (en) * | 1997-01-16 | 1998-06-30 | United Microelectronics Corp. | Method for applying photoresist on wafer |
US5780105A (en) * | 1997-07-31 | 1998-07-14 | Vanguard International Semiconductor Corporation | Method for uniformly coating a semiconductor wafer with photoresist |
-
1996
- 1996-11-20 JP JP30880296A patent/JP3315608B2/ja not_active Expired - Lifetime
-
1997
- 1997-08-30 KR KR1019970043599A patent/KR100257282B1/ko not_active Expired - Lifetime
- 1997-11-13 US US08/969,273 patent/US5976620A/en not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100585071B1 (ko) * | 1999-09-13 | 2006-06-01 | 삼성전자주식회사 | 스핀 코팅을 이용한 포토레지스트막의 도포 방법 |
Also Published As
Publication number | Publication date |
---|---|
JPH10146561A (ja) | 1998-06-02 |
JP3315608B2 (ja) | 2002-08-19 |
US5976620A (en) | 1999-11-02 |
KR19980041854A (ko) | 1998-08-17 |
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