KR0164591B1 - 집적회로 - Google Patents
집적회로 Download PDFInfo
- Publication number
- KR0164591B1 KR0164591B1 KR1019900018159A KR900018159A KR0164591B1 KR 0164591 B1 KR0164591 B1 KR 0164591B1 KR 1019900018159 A KR1019900018159 A KR 1019900018159A KR 900018159 A KR900018159 A KR 900018159A KR 0164591 B1 KR0164591 B1 KR 0164591B1
- Authority
- KR
- South Korea
- Prior art keywords
- contact
- region
- semiconductor substrate
- gate electrode
- mis transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/85—Complementary IGFETs, e.g. CMOS
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP29262789 | 1989-11-10 | ||
| JP292627 | 1989-11-10 | ||
| JP271555 | 1990-10-08 | ||
| JP02271555A JP3041931B2 (ja) | 1989-11-10 | 1990-10-08 | Misトランジスタを備えた半導体集積回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR910010704A KR910010704A (ko) | 1991-06-29 |
| KR0164591B1 true KR0164591B1 (ko) | 1999-01-15 |
Family
ID=17784249
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019900018159A Expired - Fee Related KR0164591B1 (ko) | 1989-11-10 | 1990-11-10 | 집적회로 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP3041931B2 (OSRAM) |
| KR (1) | KR0164591B1 (OSRAM) |
| TW (2) | TW230831B (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20250085122A (ko) | 2023-12-05 | 2025-06-12 | 조대훈 | 안경의 탄성경첩 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0685160A (ja) * | 1992-08-31 | 1994-03-25 | Nec Corp | 半導体集積回路装置 |
| WO2023223501A1 (ja) * | 2022-05-19 | 2023-11-23 | 株式会社ソシオネクスト | 半導体装置 |
-
1990
- 1990-10-08 JP JP02271555A patent/JP3041931B2/ja not_active Expired - Lifetime
- 1990-11-10 KR KR1019900018159A patent/KR0164591B1/ko not_active Expired - Fee Related
- 1990-11-16 TW TW081107077A patent/TW230831B/zh active
- 1990-11-16 TW TW081107078A patent/TW273041B/zh active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20250085122A (ko) | 2023-12-05 | 2025-06-12 | 조대훈 | 안경의 탄성경첩 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH03224270A (ja) | 1991-10-03 |
| JP3041931B2 (ja) | 2000-05-15 |
| TW230831B (OSRAM) | 1994-09-21 |
| KR910010704A (ko) | 1991-06-29 |
| TW273041B (OSRAM) | 1996-03-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR0164908B1 (ko) | 보호 트랜지스터를 가진 반도체 장치 | |
| US7247923B2 (en) | Semiconductor device having a lateral MOSFET and combined IC using the same | |
| EP0161983B1 (en) | Input protection arrangement for vlsi integrated circuit devices | |
| JP2810874B2 (ja) | 半導体デバイス | |
| JP4017187B2 (ja) | 静電放電保護回路 | |
| US5701024A (en) | Electrostatic discharge (ESD) protection structure for high voltage pins | |
| US4672584A (en) | CMOS integrated circuit | |
| US6855586B2 (en) | Low voltage breakdown element for ESD trigger device | |
| US4481521A (en) | Insulated gate field effect transistor provided with a protective device for a gate insulating film | |
| US4691217A (en) | Semiconductor integrated circuit device | |
| EP0242383B1 (en) | Protection of igfet integrated circuits from electrostatic discharge | |
| US6611027B2 (en) | Protection transistor with improved edge structure | |
| EP0360477B1 (en) | Integrated circuit power supply contact | |
| US4261004A (en) | Semiconductor device | |
| US5844281A (en) | Semiconductor integrated circuit device with electrostatic protective function | |
| HK1002542B (en) | Integrated circuit power supply contact | |
| US5565698A (en) | IC protection structure having n-channel MOSFET with n-type resistor region | |
| US5726844A (en) | Protection circuit and a circuit for a semiconductor-on-insulator device | |
| US5227327A (en) | Method for making high impedance pull-up and pull-down input protection resistors for active integrated circuits | |
| US20030043517A1 (en) | Electro-static discharge protecting circuit | |
| US5504361A (en) | Polarity-reversal protection for integrated electronic circuits in CMOS technology | |
| KR0164591B1 (ko) | 집적회로 | |
| JPH0653497A (ja) | 入出力保護回路を備えた半導体装置 | |
| US5121179A (en) | Higher impedance pull-up and pull-down input protection resistors for MIS transistor integrated circuits | |
| EP0083699A2 (en) | Protective circuit for semiconductor devices |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 5 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 6 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 7 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 8 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 9 |
|
| FPAY | Annual fee payment |
Payment date: 20070906 Year of fee payment: 10 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 10 |
|
| LAPS | Lapse due to unpaid annual fee | ||
| PC1903 | Unpaid annual fee |
St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 20080915 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
|
| PC1903 | Unpaid annual fee |
St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 20080915 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |