JPWO2025013432A1 - - Google Patents
Info
- Publication number
- JPWO2025013432A1 JPWO2025013432A1 JP2025532413A JP2025532413A JPWO2025013432A1 JP WO2025013432 A1 JPWO2025013432 A1 JP WO2025013432A1 JP 2025532413 A JP2025532413 A JP 2025532413A JP 2025532413 A JP2025532413 A JP 2025532413A JP WO2025013432 A1 JPWO2025013432 A1 JP WO2025013432A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
- Geometry (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023112543 | 2023-07-07 | ||
| JP2023183975 | 2023-10-26 | ||
| PCT/JP2024/018901 WO2025013432A1 (ja) | 2023-07-07 | 2024-05-22 | プローブ装置およびその製造方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2025013432A1 true JPWO2025013432A1 (https=) | 2025-01-16 |
Family
ID=94215327
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2025532413A Pending JPWO2025013432A1 (https=) | 2023-07-07 | 2024-05-22 |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JPWO2025013432A1 (https=) |
| KR (1) | KR20260035129A (https=) |
| CN (1) | CN121511409A (https=) |
| TW (1) | TW202507300A (https=) |
| WO (1) | WO2025013432A1 (https=) |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2533431Y2 (ja) * | 1990-10-03 | 1997-04-23 | 株式会社アドバンテスト | Ｉｃウエーハ試験用プローブ |
| JPH05226430A (ja) * | 1992-02-10 | 1993-09-03 | Nitto Denko Corp | プローブカード構造体およびその製法 |
| US5477160A (en) * | 1992-08-12 | 1995-12-19 | Fujitsu Limited | Module test card |
| JPH0763787A (ja) * | 1993-06-16 | 1995-03-10 | Nitto Denko Corp | プローブ構造 |
| JPH0763788A (ja) * | 1993-08-21 | 1995-03-10 | Hewlett Packard Co <Hp> | プローブおよび電気部品／回路検査装置ならびに電気部品／回路検査方法 |
| JP3793945B2 (ja) * | 2002-05-30 | 2006-07-05 | 松下電器産業株式会社 | 電圧プローブ、これを用いた半導体装置の検査方法、およびモニタ機能付き半導体装置 |
-
2024
- 2024-05-22 JP JP2025532413A patent/JPWO2025013432A1/ja active Pending
- 2024-05-22 WO PCT/JP2024/018901 patent/WO2025013432A1/ja not_active Ceased
- 2024-05-22 KR KR1020257039358A patent/KR20260035129A/ko active Pending
- 2024-05-22 CN CN202480042575.1A patent/CN121511409A/zh active Pending
- 2024-06-05 TW TW113120841A patent/TW202507300A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| TW202507300A (zh) | 2025-02-16 |
| WO2025013432A1 (ja) | 2025-01-16 |
| KR20260035129A (ko) | 2026-03-12 |
| CN121511409A (zh) | 2026-02-10 |