JPWO2023210633A5 - - Google Patents

Download PDF

Info

Publication number
JPWO2023210633A5
JPWO2023210633A5 JP2024517336A JP2024517336A JPWO2023210633A5 JP WO2023210633 A5 JPWO2023210633 A5 JP WO2023210633A5 JP 2024517336 A JP2024517336 A JP 2024517336A JP 2024517336 A JP2024517336 A JP 2024517336A JP WO2023210633 A5 JPWO2023210633 A5 JP WO2023210633A5
Authority
JP
Japan
Prior art keywords
radiation detection
block
magnetic field
generating unit
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024517336A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2023210633A1 (https=
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/JP2023/016267 external-priority patent/WO2023210633A1/ja
Publication of JPWO2023210633A1 publication Critical patent/JPWO2023210633A1/ja
Publication of JPWO2023210633A5 publication Critical patent/JPWO2023210633A5/ja
Pending legal-status Critical Current

Links

JP2024517336A 2022-04-28 2023-04-25 Pending JPWO2023210633A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022075250 2022-04-28
PCT/JP2023/016267 WO2023210633A1 (ja) 2022-04-28 2023-04-25 放射線検出装置及び放射線検出器

Publications (2)

Publication Number Publication Date
JPWO2023210633A1 JPWO2023210633A1 (https=) 2023-11-02
JPWO2023210633A5 true JPWO2023210633A5 (https=) 2025-01-15

Family

ID=88518990

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024517336A Pending JPWO2023210633A1 (https=) 2022-04-28 2023-04-25

Country Status (4)

Country Link
US (1) US20250224351A1 (https=)
JP (1) JPWO2023210633A1 (https=)
DE (1) DE112023002175T5 (https=)
WO (1) WO2023210633A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4563989A1 (en) * 2023-11-29 2025-06-04 Bruker Nano GmbH A handheld x-ray fluorescence, xrf, analyzer and a method for elemental analysis with a handheld xrf analyzer

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59141045A (ja) * 1983-01-31 1984-08-13 Shimadzu Corp Ｘ線分析装置
JP2602849Y2 (ja) * 1993-03-15 2000-01-31 セイコーインスツルメンツ株式会社 半導体ｘ線検出器
JP2001116847A (ja) * 1999-10-20 2001-04-27 Hitachi Ltd Ｘ線検出装置、元素分析装置および半導体製造装置
JP2001208857A (ja) * 2000-01-27 2001-08-03 Ion Kasokuki Kk 元素分析装置用ｘ線検出器の散乱陽子リムーバ
WO2009010914A2 (en) * 2007-07-17 2009-01-22 Koninklijke Philips Electronics N. V. Multi-layer sandwich structure of an x-ray detector cover for sufficient magnetic shielding with reduced x-ray absorption
JP2009068955A (ja) * 2007-09-12 2009-04-02 Shimadzu Corp 蛍光ｘ線分析装置及び蛍光ｘ線分析方法
US8618508B2 (en) * 2008-09-25 2013-12-31 Koninklijke Philips N.V. Detection system and method
DE102011109822B4 (de) * 2011-08-09 2019-10-10 Ketek Gmbh Vorrichtung für einen Strahlungsdetektor sowie Strahlungsdetektor mit der Vorrichtung
GB2529375A (en) * 2014-05-16 2016-02-24 Ibex Innovations Ltd Multi-pixel x-ray detector apparatus
EP3279699A1 (en) * 2016-08-05 2018-02-07 Universitätsklinikum Regensburg Imaging technologies
US10614997B2 (en) * 2017-08-04 2020-04-07 EDAX, Incorporated Systems and methods for high energy X-ray detection in electron microscopes
WO2022091749A1 (ja) * 2020-11-02 2022-05-05 株式会社堀場製作所 放射線検出モジュール、及び放射線検出装置

Similar Documents

Publication Publication Date Title
US12253480B2 (en) Methods and apparatus for determining information regarding chemical composition using x-ray radiation
JP6596414B2 (ja) Ｘ線検出器におけるｘ線線量パラメータを測定するための装置、及び放射線学的情報を取り扱うためのコンピュータネットワーク
US8138481B2 (en) Determination of a spatial gain distribution of a scintillator
JP2016038350A (ja) Ｘ線透過検査装置及び異物検出方法
EA202092309A1 (ru) Рентгеновский флуоресцентный анализатор с несколькими каналами детектирования и способ выполнения флуоресцентного анализа
EP3396419A1 (en) Radiation detection device, radiation testing system, and method for adjusting radiation detection device
CN101135657A (zh) X射线分析设备
CN111065333B (zh) 会聚x射线成像装置和方法
US6442236B1 (en) X-ray analysis
JP6952055B2 (ja) 放射線検出装置
JPWO2023210633A5 (https=)
JP2012122737A (ja) Ｘ線回折装置
Vernekohl et al. Reduced acquisition time for L‐shell x‐ray fluorescence computed tomography using polycapillary x‐ray optics
US12422383B2 (en) Imaging unit, radiological image acquisition system, and radiological image acquisition method
JP5446182B2 (ja) 透過型ｘ線回折装置および透過型ｘ線回折方法
CN103731966A (zh) 一体化荧光发生装置
JP6506629B2 (ja) Ｘ線受光装置およびこれを備えたｘ線検査装置
JP6697518B2 (ja) Ｘ線円管及び該ｘ線円管を含むｘ線機器
JP7701934B2 (ja) 放射線検出モジュール、及び放射線検出装置
WO2023210633A1 (ja) 放射線検出装置及び放射線検出器
WO2023017664A1 (ja) 放射線検出器
JP5759257B2 (ja) Ｘ線装置
JP7100910B2 (ja) 全反射蛍光ｘ線分析装置
JP2002340825A (ja) 蛍光線分析装置及び蛍光線分析方法
JP5646147B2 (ja) 二次元分布を測定する方法及び装置