DE112023002175T5 - Strahlungsdetektionsvorrichtung und strahlungsdetektor - Google Patents

Strahlungsdetektionsvorrichtung und strahlungsdetektor Download PDF

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Publication number
DE112023002175T5
DE112023002175T5 DE112023002175.9T DE112023002175T DE112023002175T5 DE 112023002175 T5 DE112023002175 T5 DE 112023002175T5 DE 112023002175 T DE112023002175 T DE 112023002175T DE 112023002175 T5 DE112023002175 T5 DE 112023002175T5
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DE
Germany
Prior art keywords
radiation detection
detection element
sample
magnetic field
block
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE112023002175.9T
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German (de)
English (en)
Inventor
Daisuke Matsunaga
Hiroki Minowa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Ltd
Original Assignee
Horiba Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Ltd filed Critical Horiba Ltd
Publication of DE112023002175T5 publication Critical patent/DE112023002175T5/de
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/313—Accessories, mechanical or electrical features filters, rotating filter disc
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/316—Accessories, mechanical or electrical features collimators

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE112023002175.9T 2022-04-28 2023-04-25 Strahlungsdetektionsvorrichtung und strahlungsdetektor Pending DE112023002175T5 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2022075250 2022-04-28
JP2022-075250 2022-04-28
PCT/JP2023/016267 WO2023210633A1 (ja) 2022-04-28 2023-04-25 放射線検出装置及び放射線検出器

Publications (1)

Publication Number Publication Date
DE112023002175T5 true DE112023002175T5 (de) 2025-05-15

Family

ID=88518990

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112023002175.9T Pending DE112023002175T5 (de) 2022-04-28 2023-04-25 Strahlungsdetektionsvorrichtung und strahlungsdetektor

Country Status (4)

Country Link
US (1) US20250224351A1 (https=)
JP (1) JPWO2023210633A1 (https=)
DE (1) DE112023002175T5 (https=)
WO (1) WO2023210633A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4563989A1 (en) * 2023-11-29 2025-06-04 Bruker Nano GmbH A handheld x-ray fluorescence, xrf, analyzer and a method for elemental analysis with a handheld xrf analyzer

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59141045A (ja) * 1983-01-31 1984-08-13 Shimadzu Corp Ｘ線分析装置
JP2602849Y2 (ja) * 1993-03-15 2000-01-31 セイコーインスツルメンツ株式会社 半導体ｘ線検出器
JP2001116847A (ja) * 1999-10-20 2001-04-27 Hitachi Ltd Ｘ線検出装置、元素分析装置および半導体製造装置
JP2001208857A (ja) * 2000-01-27 2001-08-03 Ion Kasokuki Kk 元素分析装置用ｘ線検出器の散乱陽子リムーバ
WO2009010914A2 (en) * 2007-07-17 2009-01-22 Koninklijke Philips Electronics N. V. Multi-layer sandwich structure of an x-ray detector cover for sufficient magnetic shielding with reduced x-ray absorption
JP2009068955A (ja) * 2007-09-12 2009-04-02 Shimadzu Corp 蛍光ｘ線分析装置及び蛍光ｘ線分析方法
US8618508B2 (en) * 2008-09-25 2013-12-31 Koninklijke Philips N.V. Detection system and method
DE102011109822B4 (de) * 2011-08-09 2019-10-10 Ketek Gmbh Vorrichtung für einen Strahlungsdetektor sowie Strahlungsdetektor mit der Vorrichtung
GB2529375A (en) * 2014-05-16 2016-02-24 Ibex Innovations Ltd Multi-pixel x-ray detector apparatus
EP3279699A1 (en) * 2016-08-05 2018-02-07 Universitätsklinikum Regensburg Imaging technologies
US10614997B2 (en) * 2017-08-04 2020-04-07 EDAX, Incorporated Systems and methods for high energy X-ray detection in electron microscopes
WO2022091749A1 (ja) * 2020-11-02 2022-05-05 株式会社堀場製作所 放射線検出モジュール、及び放射線検出装置

Also Published As

Publication number Publication date
WO2023210633A1 (ja) 2023-11-02
US20250224351A1 (en) 2025-07-10
JPWO2023210633A1 (https=) 2023-11-02

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