JPWO2023210633A1 - - Google Patents
Info
- Publication number
- JPWO2023210633A1 JPWO2023210633A1 JP2024517336A JP2024517336A JPWO2023210633A1 JP WO2023210633 A1 JPWO2023210633 A1 JP WO2023210633A1 JP 2024517336 A JP2024517336 A JP 2024517336A JP 2024517336 A JP2024517336 A JP 2024517336A JP WO2023210633 A1 JPWO2023210633 A1 JP WO2023210633A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/313—Accessories, mechanical or electrical features filters, rotating filter disc
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/316—Accessories, mechanical or electrical features collimators
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- High Energy & Nuclear Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022075250 | 2022-04-28 | ||
| PCT/JP2023/016267 WO2023210633A1 (ja) | 2022-04-28 | 2023-04-25 | 放射線検出装置及び放射線検出器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2023210633A1 true JPWO2023210633A1 (https=) | 2023-11-02 |
| JPWO2023210633A5 JPWO2023210633A5 (https=) | 2025-01-15 |
Family
ID=88518990
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024517336A Pending JPWO2023210633A1 (https=) | 2022-04-28 | 2023-04-25 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20250224351A1 (https=) |
| JP (1) | JPWO2023210633A1 (https=) |
| DE (1) | DE112023002175T5 (https=) |
| WO (1) | WO2023210633A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP4563989A1 (en) * | 2023-11-29 | 2025-06-04 | Bruker Nano GmbH | A handheld x-ray fluorescence, xrf, analyzer and a method for elemental analysis with a handheld xrf analyzer |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59141045A (ja) * | 1983-01-31 | 1984-08-13 | Shimadzu Corp | Ｘ線分析装置 |
| JP2602849Y2 (ja) * | 1993-03-15 | 2000-01-31 | セイコーインスツルメンツ株式会社 | 半導体ｘ線検出器 |
| JP2001116847A (ja) * | 1999-10-20 | 2001-04-27 | Hitachi Ltd | Ｘ線検出装置、元素分析装置および半導体製造装置 |
| JP2001208857A (ja) * | 2000-01-27 | 2001-08-03 | Ion Kasokuki Kk | 元素分析装置用ｘ線検出器の散乱陽子リムーバ |
| WO2009010914A2 (en) * | 2007-07-17 | 2009-01-22 | Koninklijke Philips Electronics N. V. | Multi-layer sandwich structure of an x-ray detector cover for sufficient magnetic shielding with reduced x-ray absorption |
| JP2009068955A (ja) * | 2007-09-12 | 2009-04-02 | Shimadzu Corp | 蛍光ｘ線分析装置及び蛍光ｘ線分析方法 |
| US8618508B2 (en) * | 2008-09-25 | 2013-12-31 | Koninklijke Philips N.V. | Detection system and method |
| DE102011109822B4 (de) * | 2011-08-09 | 2019-10-10 | Ketek Gmbh | Vorrichtung für einen Strahlungsdetektor sowie Strahlungsdetektor mit der Vorrichtung |
| GB2529375A (en) * | 2014-05-16 | 2016-02-24 | Ibex Innovations Ltd | Multi-pixel x-ray detector apparatus |
| EP3279699A1 (en) * | 2016-08-05 | 2018-02-07 | Universitätsklinikum Regensburg | Imaging technologies |
| US10614997B2 (en) * | 2017-08-04 | 2020-04-07 | EDAX, Incorporated | Systems and methods for high energy X-ray detection in electron microscopes |
| WO2022091749A1 (ja) * | 2020-11-02 | 2022-05-05 | 株式会社堀場製作所 | 放射線検出モジュール、及び放射線検出装置 |
-
2023
- 2023-04-25 US US18/851,523 patent/US20250224351A1/en active Pending
- 2023-04-25 DE DE112023002175.9T patent/DE112023002175T5/de active Pending
- 2023-04-25 JP JP2024517336A patent/JPWO2023210633A1/ja active Pending
- 2023-04-25 WO PCT/JP2023/016267 patent/WO2023210633A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2023210633A1 (ja) | 2023-11-02 |
| DE112023002175T5 (de) | 2025-05-15 |
| US20250224351A1 (en) | 2025-07-10 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240917 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20260121 |