JPWO2022264809A5 - - Google Patents

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Publication number
JPWO2022264809A5
JPWO2022264809A5 JP2023529764A JP2023529764A JPWO2022264809A5 JP WO2022264809 A5 JPWO2022264809 A5 JP WO2022264809A5 JP 2023529764 A JP2023529764 A JP 2023529764A JP 2023529764 A JP2023529764 A JP 2023529764A JP WO2022264809 A5 JPWO2022264809 A5 JP WO2022264809A5
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JP
Japan
Prior art keywords
test strip
immunochromatographic test
electron gun
space
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023529764A
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English (en)
Japanese (ja)
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JPWO2022264809A1 (cs
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Publication date
Application filed filed Critical
Priority claimed from PCT/JP2022/022260 external-priority patent/WO2022264809A1/ja
Publication of JPWO2022264809A1 publication Critical patent/JPWO2022264809A1/ja
Publication of JPWO2022264809A5 publication Critical patent/JPWO2022264809A5/ja
Pending legal-status Critical Current

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JP2023529764A 2021-06-14 2022-06-01 Pending JPWO2022264809A1 (cs)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021098532 2021-06-14
PCT/JP2022/022260 WO2022264809A1 (ja) 2021-06-14 2022-06-01 イムノクロマトテストストリップの検査装置および検査方法、ならびに検査システム

Publications (2)

Publication Number Publication Date
JPWO2022264809A1 JPWO2022264809A1 (cs) 2022-12-22
JPWO2022264809A5 true JPWO2022264809A5 (cs) 2025-04-10

Family

ID=84526205

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023529764A Pending JPWO2022264809A1 (cs) 2021-06-14 2022-06-01

Country Status (2)

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JP (1) JPWO2022264809A1 (cs)
WO (1) WO2022264809A1 (cs)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5648050A (en) * 1979-09-28 1981-05-01 Hitachi Ltd Reflected electron detector
JPS58112231A (ja) * 1981-12-26 1983-07-04 Jeol Ltd 電子線放出角度分布検出方式
GB8607222D0 (en) * 1986-03-24 1986-04-30 Welding Inst Charged particle collection
US7435956B2 (en) * 2004-09-10 2008-10-14 Multibeam Systems, Inc. Apparatus and method for inspection and testing of flat panel display substrates
EP2105944A1 (en) * 2008-03-28 2009-09-30 FEI Company Environmental cell for a particle-optical apparatus
JP5699023B2 (ja) * 2011-04-11 2015-04-08 株式会社日立ハイテクノロジーズ 荷電粒子線装置

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