JPWO2022064846A5 - - Google Patents

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JPWO2022064846A5
JPWO2022064846A5 JP2022551172A JP2022551172A JPWO2022064846A5 JP WO2022064846 A5 JPWO2022064846 A5 JP WO2022064846A5 JP 2022551172 A JP2022551172 A JP 2022551172A JP 2022551172 A JP2022551172 A JP 2022551172A JP WO2022064846 A5 JPWO2022064846 A5 JP WO2022064846A5
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value
radiation
tube voltage
body thickness
mas
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JP2022551172A
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JP7439286B2 (ja
JPWO2022064846A1 (https=
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JP2022551172A 2020-09-25 2021-07-30 設定装置、設定方法、及び設定プログラム Active JP7439286B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020161414 2020-09-25
JP2020161414 2020-09-25
PCT/JP2021/028494 WO2022064846A1 (ja) 2020-09-25 2021-07-30 設定装置、設定方法、及び設定プログラム

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JPWO2022064846A1 JPWO2022064846A1 (https=) 2022-03-31
JPWO2022064846A5 true JPWO2022064846A5 (https=) 2023-06-07
JP7439286B2 JP7439286B2 (ja) 2024-02-27

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US (1) US12564333B2 (https=)
EP (1) EP4218584B1 (https=)
JP (1) JP7439286B2 (https=)
CN (1) CN116249487A (https=)
WO (1) WO2022064846A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2025004455A (ja) * 2023-06-26 2025-01-15 株式会社日立ハイテク 放射線撮像装置及び撮像条件算出方法
US20250375178A1 (en) * 2024-06-07 2025-12-11 Canon Medical Systems Corporation X-ray imaging system, information processing apparatus, medical imaging system, and image processing method

Family Cites Families (20)

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DE2523887C3 (de) * 1975-05-30 1979-06-13 Siemens Ag, 1000 Berlin Und 8000 Muenchen Röntgendiagnostikanlage mit mehreren röntgenologischen Aufnahmesystemen
US4160906A (en) * 1977-06-23 1979-07-10 General Electric Company Anatomically coordinated user dominated programmer for diagnostic x-ray apparatus
EP0346530A1 (en) * 1988-06-16 1989-12-20 Nicola Elias Yanaki Method and structure for optimizing radiographic quality by controlling X-ray tube voltage, current, focal spot size and exposure time
JP3554129B2 (ja) * 1997-01-17 2004-08-18 キヤノン株式会社 放射線撮影装置
JP4122575B2 (ja) * 1998-06-24 2008-07-23 株式会社島津製作所 X線シネ撮影装置
JP2003115399A (ja) * 2001-10-02 2003-04-18 Toshiba Corp X線診断装置
JP2010005032A (ja) * 2008-06-25 2010-01-14 Hitachi Medical Corp X線撮影装置
JP5277861B2 (ja) 2008-10-22 2013-08-28 株式会社島津製作所 X線高電圧装置
JP5844296B2 (ja) * 2012-06-11 2016-01-13 富士フイルム株式会社 放射線画像処理装置および方法
CN106233357B (zh) * 2013-10-07 2020-09-04 曼帝斯有限公司 基于医疗程序模拟的辐射估算和防护
JP6145889B2 (ja) * 2014-03-24 2017-06-14 富士フイルム株式会社 放射線画像処理装置および方法並びにプログラム
JP6339684B2 (ja) * 2014-09-11 2018-06-06 株式会社日立製作所 フォトンカウンティングct装置および推定被ばく量算出方法
JP6184925B2 (ja) * 2014-09-30 2017-08-23 富士フイルム株式会社 放射線画像解析装置、方法、及びプログラム
JP6548386B2 (ja) * 2014-12-09 2019-07-24 キヤノンメディカルシステムズ株式会社 X線条件決定装置、x線条件決定方法およびx線診断装置
EP3159715A1 (en) * 2015-10-21 2017-04-26 Agfa Healthcare A method for reshaping the characteristic exposure response and dosimetry of a direct radiography system
TWI606752B (zh) 2016-10-28 2017-11-21 Iner Aec 用於數位x光機的自動曝露控制系統與其方法
JP6842281B2 (ja) * 2016-11-25 2021-03-17 株式会社日立製作所 X線撮影システムおよび操作パネル
JP6125126B1 (ja) * 2017-01-18 2017-05-10 典人 畠山 X線撮影条件補正方法、プログラム、及び、x線システム
KR20190021027A (ko) * 2017-08-22 2019-03-05 삼성전자주식회사 엑스선 영상 장치 및 그 제어 방법
JP7131456B2 (ja) 2019-03-27 2022-09-06 株式会社デンソーウェーブ Rfidリーダ装置

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