JPWO2020105716A5 - - Google Patents
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- Publication number
- JPWO2020105716A5 JPWO2020105716A5 JP2020557640A JP2020557640A JPWO2020105716A5 JP WO2020105716 A5 JPWO2020105716 A5 JP WO2020105716A5 JP 2020557640 A JP2020557640 A JP 2020557640A JP 2020557640 A JP2020557640 A JP 2020557640A JP WO2020105716 A5 JPWO2020105716 A5 JP WO2020105716A5
- Authority
- JP
- Japan
- Prior art keywords
- sample
- sample holder
- ray
- single crystal
- rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013078 crystal Substances 0.000 claims description 28
- 239000011148 porous material Substances 0.000 claims description 9
- 238000012982 x-ray structure analysis Methods 0.000 claims 9
- 238000000034 method Methods 0.000 claims 8
- 238000001514 detection method Methods 0.000 claims 4
- 238000005259 measurement Methods 0.000 claims 4
- 238000012916 structural analysis Methods 0.000 claims 3
- 230000001678 irradiating effect Effects 0.000 claims 2
- 239000000126 substance Substances 0.000 claims 2
- 239000002904 solvent Substances 0.000 description 3
- 238000005251 capillar electrophoresis Methods 0.000 description 2
- 238000001962 electrophoresis Methods 0.000 description 2
- 239000012530 fluid Substances 0.000 description 2
- 238000004817 gas chromatography Methods 0.000 description 2
- 238000004808 supercritical fluid chromatography Methods 0.000 description 2
- 238000000533 capillary isoelectric focusing Methods 0.000 description 1
- 238000004811 liquid chromatography Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000002791 soaking Methods 0.000 description 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018217814 | 2018-11-21 | ||
| JP2018217814 | 2018-11-21 | ||
| PCT/JP2019/045685 WO2020105716A1 (ja) | 2018-11-21 | 2019-11-21 | 単結晶x線構造解析装置と方法、及び、そのための試料ホルダ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2020105716A1 JPWO2020105716A1 (ja) | 2021-11-11 |
| JPWO2020105716A5 true JPWO2020105716A5 (https=) | 2022-01-20 |
Family
ID=70774214
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2020557640A Pending JPWO2020105716A1 (ja) | 2018-11-21 | 2019-11-21 | 単結晶x線構造解析装置と方法、及び、そのための試料ホルダ |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20220018791A1 (https=) |
| EP (1) | EP3885752A4 (https=) |
| JP (1) | JPWO2020105716A1 (https=) |
| CN (1) | CN113056669A (https=) |
| WO (1) | WO2020105716A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3961199A1 (en) * | 2020-08-24 | 2022-03-02 | Malvern Panalytical B.V. | X-ray detector for x-ray diffraction analysis apparatus |
| EP4148421A1 (en) * | 2021-09-10 | 2023-03-15 | Merck Patent GmbH | Sample holder arrangement for structure elucidation with porous frameworks |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3053502B2 (ja) * | 1992-12-25 | 2000-06-19 | 日機装株式会社 | 粉末品分析用試料の精秤分取装置 |
| JPH06265489A (ja) * | 1993-03-15 | 1994-09-22 | Hitachi Ltd | X線回折装置 |
| JP3821414B2 (ja) * | 1998-04-03 | 2006-09-13 | 株式会社リガク | X線回折分析方法及びx線回折分析装置 |
| JP3640383B2 (ja) * | 2001-09-10 | 2005-04-20 | 独立行政法人理化学研究所 | サンプルの支持機構 |
| WO2003050598A2 (en) * | 2001-12-12 | 2003-06-19 | The Regents Of The University Of California | Integrated crystal mounting and alignment system for high-throughput biological crystallography |
| JP4466991B2 (ja) * | 2003-05-22 | 2010-05-26 | 英明 森山 | 結晶成長装置及び方法 |
| JP2005147826A (ja) * | 2003-11-14 | 2005-06-09 | Hamamatsu Photonics Kk | 蛍光測定装置 |
| JP4121146B2 (ja) | 2005-06-24 | 2008-07-23 | 株式会社リガク | 双晶解析装置 |
| WO2009001602A1 (ja) * | 2007-06-25 | 2008-12-31 | Sai Corporation | ガス充填式キャピラリーおよび試料充填方法 |
| US7660389B1 (en) * | 2007-08-17 | 2010-02-09 | Bruker Axs, Inc. | Sample alignment mechanism for X-ray diffraction instrumentation |
| JP2013156218A (ja) * | 2012-01-31 | 2013-08-15 | Japan Synchrotron Radiation Research Institute | 微小試料用キャピラリー |
| DE102012208710B3 (de) * | 2012-05-24 | 2013-09-19 | Incoatec Gmbh | Verfahren zur Herstellung einer einkristallinen Röntgenblende und Röntgenanalysegerät mit einkristalliner Röntgenblende |
| WO2014038220A1 (ja) * | 2012-09-07 | 2014-03-13 | 独立行政法人 科学技術振興機構 | ゲスト化合物内包高分子金属錯体結晶、その製造方法、結晶構造解析用試料の作製方法、及び有機化合物の分子構造決定方法 |
| JP6131595B2 (ja) * | 2012-12-28 | 2017-05-24 | 株式会社ニコン | 測定方法 |
| EP3176568B1 (en) | 2014-07-31 | 2025-05-07 | Japan Science and Technology Agency | Diffraction data analysis method, computer program, and recording medium |
-
2019
- 2019-11-21 CN CN201980076225.6A patent/CN113056669A/zh active Pending
- 2019-11-21 JP JP2020557640A patent/JPWO2020105716A1/ja active Pending
- 2019-11-21 US US17/295,854 patent/US20220018791A1/en not_active Abandoned
- 2019-11-21 WO PCT/JP2019/045685 patent/WO2020105716A1/ja not_active Ceased
- 2019-11-21 EP EP19887578.3A patent/EP3885752A4/en not_active Withdrawn
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