JPWO2020105716A1 - 単結晶ｘ線構造解析装置と方法、及び、そのための試料ホルダ - Google Patents

単結晶ｘ線構造解析装置と方法、及び、そのための試料ホルダ Download PDF

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Publication number
JPWO2020105716A1
JPWO2020105716A1 JP2020557640A JP2020557640A JPWO2020105716A1 JP WO2020105716 A1 JPWO2020105716 A1 JP WO2020105716A1 JP 2020557640 A JP2020557640 A JP 2020557640A JP 2020557640 A JP2020557640 A JP 2020557640A JP WO2020105716 A1 JPWO2020105716 A1 JP WO2020105716A1
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Japan
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sample
ray
sample holder
single crystal
crystal
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Pending
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JP2020557640A
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Japanese (ja)
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JPWO2020105716A5 (https=
Inventor
孝 佐藤
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Rigaku Corp
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Rigaku Corp
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Publication of JPWO2020105716A1 publication Critical patent/JPWO2020105716A1/ja
Publication of JPWO2020105716A5 publication Critical patent/JPWO2020105716A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20016—Goniometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

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  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
JP2020557640A 2018-11-21 2019-11-21 単結晶ｘ線構造解析装置と方法、及び、そのための試料ホルダ Pending JPWO2020105716A1 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2018217814 2018-11-21
JP2018217814 2018-11-21
PCT/JP2019/045685 WO2020105716A1 (ja) 2018-11-21 2019-11-21 単結晶ｘ線構造解析装置と方法、及び、そのための試料ホルダ

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JPWO2020105716A1 true JPWO2020105716A1 (ja) 2021-11-11
JPWO2020105716A5 JPWO2020105716A5 (https=) 2022-01-20

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JP2020557640A Pending JPWO2020105716A1 (ja) 2018-11-21 2019-11-21 単結晶ｘ線構造解析装置と方法、及び、そのための試料ホルダ

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US (1) US20220018791A1 (https=)
EP (1) EP3885752A4 (https=)
JP (1) JPWO2020105716A1 (https=)
CN (1) CN113056669A (https=)
WO (1) WO2020105716A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3961199A1 (en) * 2020-08-24 2022-03-02 Malvern Panalytical B.V. X-ray detector for x-ray diffraction analysis apparatus
EP4148421A1 (en) * 2021-09-10 2023-03-15 Merck Patent GmbH Sample holder arrangement for structure elucidation with porous frameworks

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030152194A1 (en) * 2001-12-12 2003-08-14 The Regents Of The University Of California Integrated crystal mounting and alignment system for high-throughput biological crystallography
JPWO2009001602A1 (ja) * 2007-06-25 2010-08-26 Ｓａｉ株式会社 ガス充填式キャピラリー及び試料充填方法
JP2013156218A (ja) * 2012-01-31 2013-08-15 Japan Synchrotron Radiation Research Institute 微小試料用キャピラリー
JPWO2014038220A1 (ja) * 2012-09-07 2016-08-08 国立研究開発法人科学技術振興機構 ゲスト化合物内包高分子金属錯体結晶、その製造方法、結晶構造解析用試料の作製方法、及び有機化合物の分子構造決定方法

Family Cites Families (11)

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Publication number Priority date Publication date Assignee Title
JP3053502B2 (ja) * 1992-12-25 2000-06-19 日機装株式会社 粉末品分析用試料の精秤分取装置
JPH06265489A (ja) * 1993-03-15 1994-09-22 Hitachi Ltd Ｘ線回折装置
JP3821414B2 (ja) * 1998-04-03 2006-09-13 株式会社リガク Ｘ線回折分析方法及びｘ線回折分析装置
JP3640383B2 (ja) * 2001-09-10 2005-04-20 独立行政法人理化学研究所 サンプルの支持機構
JP4466991B2 (ja) * 2003-05-22 2010-05-26 英明 森山 結晶成長装置及び方法
JP2005147826A (ja) * 2003-11-14 2005-06-09 Hamamatsu Photonics Kk 蛍光測定装置
JP4121146B2 (ja) 2005-06-24 2008-07-23 株式会社リガク 双晶解析装置
US7660389B1 (en) * 2007-08-17 2010-02-09 Bruker Axs, Inc. Sample alignment mechanism for X-ray diffraction instrumentation
DE102012208710B3 (de) * 2012-05-24 2013-09-19 Incoatec Gmbh Verfahren zur Herstellung einer einkristallinen Röntgenblende und Röntgenanalysegerät mit einkristalliner Röntgenblende
JP6131595B2 (ja) * 2012-12-28 2017-05-24 株式会社ニコン 測定方法
EP3176568B1 (en) 2014-07-31 2025-05-07 Japan Science and Technology Agency Diffraction data analysis method, computer program, and recording medium

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030152194A1 (en) * 2001-12-12 2003-08-14 The Regents Of The University Of California Integrated crystal mounting and alignment system for high-throughput biological crystallography
JPWO2009001602A1 (ja) * 2007-06-25 2010-08-26 Ｓａｉ株式会社 ガス充填式キャピラリー及び試料充填方法
JP2013156218A (ja) * 2012-01-31 2013-08-15 Japan Synchrotron Radiation Research Institute 微小試料用キャピラリー
JPWO2014038220A1 (ja) * 2012-09-07 2016-08-08 国立研究開発法人科学技術振興機構 ゲスト化合物内包高分子金属錯体結晶、その製造方法、結晶構造解析用試料の作製方法、及び有機化合物の分子構造決定方法

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Publication number Publication date
US20220018791A1 (en) 2022-01-20
WO2020105716A1 (ja) 2020-05-28
EP3885752A4 (en) 2022-10-19
CN113056669A (zh) 2021-06-29
EP3885752A1 (en) 2021-09-29

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