JPWO2019198558A1 - ガラス板、ガラス板の製造方法および端面検査方法 - Google Patents
ガラス板、ガラス板の製造方法および端面検査方法 Download PDFInfo
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/12—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B24B9/00—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
- B24B9/02—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground
- B24B9/06—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain
- B24B9/08—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain of glass
- B24B9/10—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain of glass of plate glass
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- G—PHYSICS
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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Abstract
Description
以下、本発明の第一実施形態に係るガラス板、ガラス板の製造方法および端面検査方法について、添付の図面を参照しながら説明する。
以下、本発明の第二実施形態に係るガラス板の製造方法について、添付の図面を参照しながら説明する。
G ガラス板
Ga 端面
GC 凹部
GX 検査用ガラス板
L アルカリ洗浄液
R 砥石の周速度
V ガラス板の端面に対する砥石の相対移動速度
2 研磨砥石
6 画像
Claims (9)
- 砥石による加工面でなる端面を有するガラス板について、前記端面の性状を検査するガラス板の端面検査方法であって、
前記端面を化学処理して該端面上での凹部の形成を促進させる処理工程と、化学処理後の前記端面の画像を撮像する撮像工程と、前記画像を用い、前記端面の面積に対して前記凹部の面積が占める割合を算出する算出工程とを備えることを特徴とするガラス板の端面検査方法。 - 前記算出工程では、前記割合の算出前に、前記画像に対して二値化処理を施すことにより、前記凹部と、該凹部以外の部分とを識別することを特徴とする請求項1に記載のガラス板の端面検査方法。
- 前記処理工程では、40℃〜80℃の処理液を用いることを特徴とする請求項1又は2に記載のガラス板の端面検査方法。
- 砥石による加工面でなる端面を有するガラス板を同一条件の下で複数枚作製する作製工程と、前記複数枚のガラス板から検査用ガラス板を抜き取る抜取工程と、前記検査用ガラス板に対して請求項1〜3のいずれかに記載のガラス板の端面検査方法を実行する検査工程と、該検査工程の結果に基づいて前記複数枚のガラス板における端面の性状を判定する判定工程とを備えることを特徴とするガラス板の製造方法。
- 前記作製工程では、動バランスが8g・mm以下である前記砥石を用いて前記ガラス板を複数枚作製することを特徴とする請求項4に記載のガラス板の製造方法。
- 研磨面でなる端面を有するガラス板であって、
KOHを5質量%かつNaOHを5質量%含有する50℃のアルカリ溶液を用いて、前記端面を2時間化学処理して該端面上での凹部の形成を促進させた後、走査型電子顕微鏡を用いて、倍率1000倍で観察した場合に、前記端面の面積に対して前記凹部の面積が占める割合が30%以下であることを特徴とするガラス板。 - 前記割合が7%以下であることを特徴とする請求項7に記載のガラス板。
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JP2018075306 | 2018-04-10 | ||
JP2018075306 | 2018-04-10 | ||
PCT/JP2019/014512 WO2019198558A1 (ja) | 2018-04-10 | 2019-04-01 | ガラス板、ガラス板の製造方法および端面検査方法 |
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JPWO2019198558A1 true JPWO2019198558A1 (ja) | 2021-05-13 |
JP7311842B2 JP7311842B2 (ja) | 2023-07-20 |
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CN114088729B (zh) * | 2022-01-21 | 2022-04-12 | 潍坊佳昇光电科技有限公司 | 载板玻璃端面品质的检测装置及方法 |
CN116394161B (zh) * | 2023-06-05 | 2023-08-11 | 深圳市鑫冠亚科技有限公司 | 一种基于数据分析的电极生产管理方法及系统 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2004082226A (ja) * | 2002-08-22 | 2004-03-18 | Nippon Sheet Glass Co Ltd | ガラス板端面の研削条件決定方法及びガラス板端面の加工方法 |
JP2006030067A (ja) * | 2004-07-20 | 2006-02-02 | Asahi Glass Co Ltd | ガラス板の欠点検査方法及びその装置 |
JP2015187042A (ja) * | 2012-08-13 | 2015-10-29 | 旭硝子株式会社 | ガラス基板及びガラス基板の製造方法 |
JP2017100933A (ja) * | 2015-11-20 | 2017-06-08 | 旭硝子株式会社 | ガラス基板およびガラス板梱包体 |
CN107843604A (zh) * | 2017-12-19 | 2018-03-27 | 苏州精濑光电有限公司 | 一种用于检测双层基板边缘缺陷的装置及检测方法 |
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SU1057864A1 (ru) * | 1982-07-21 | 1983-11-30 | Предприятие П/Я А-7840 | Способ оценки качества поверхности стекла |
JPH02151749A (ja) * | 1988-12-05 | 1990-06-11 | Sumitomo Electric Ind Ltd | 微小部分の分析方法 |
JP2009300313A (ja) * | 2008-06-16 | 2009-12-24 | Asahi Glass Co Ltd | ガラス基板の検査方法、その検査方法により検査されたガラス基板及びガラス基板の検査装置及びガラス基板の製造方法 |
JP5064461B2 (ja) | 2009-03-04 | 2012-10-31 | AvanStrate株式会社 | ガラス板端面のパーティクル測定方法および測定装置 |
JP5708169B2 (ja) * | 2011-04-07 | 2015-04-30 | 旭硝子株式会社 | 光学ガラスの潜傷評価方法及び潜傷評価装置 |
TWI708052B (zh) * | 2011-08-29 | 2020-10-21 | 美商安美基公司 | 用於非破壞性檢測-流體中未溶解粒子之方法及裝置 |
JP6671639B2 (ja) * | 2015-09-29 | 2020-03-25 | Agc株式会社 | ガラス合紙、ガラス板積層体、及びガラス板梱包体 |
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- 2019-04-01 KR KR1020207018843A patent/KR20200139663A/ko active Search and Examination
- 2019-04-01 WO PCT/JP2019/014512 patent/WO2019198558A1/ja active Application Filing
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Publication number | Priority date | Publication date | Assignee | Title |
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JP2004082226A (ja) * | 2002-08-22 | 2004-03-18 | Nippon Sheet Glass Co Ltd | ガラス板端面の研削条件決定方法及びガラス板端面の加工方法 |
JP2006030067A (ja) * | 2004-07-20 | 2006-02-02 | Asahi Glass Co Ltd | ガラス板の欠点検査方法及びその装置 |
JP2015187042A (ja) * | 2012-08-13 | 2015-10-29 | 旭硝子株式会社 | ガラス基板及びガラス基板の製造方法 |
JP2017100933A (ja) * | 2015-11-20 | 2017-06-08 | 旭硝子株式会社 | ガラス基板およびガラス板梱包体 |
CN107843604A (zh) * | 2017-12-19 | 2018-03-27 | 苏州精濑光电有限公司 | 一种用于检测双层基板边缘缺陷的装置及检测方法 |
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CN111465842A (zh) | 2020-07-28 |
WO2019198558A1 (ja) | 2019-10-17 |
KR20200139663A (ko) | 2020-12-14 |
TW201944060A (zh) | 2019-11-16 |
JP7311842B2 (ja) | 2023-07-20 |
TWI803612B (zh) | 2023-06-01 |
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