JPS6491120A - Thin film transistor - Google Patents

Thin film transistor

Info

Publication number
JPS6491120A
JPS6491120A JP24782887A JP24782887A JPS6491120A JP S6491120 A JPS6491120 A JP S6491120A JP 24782887 A JP24782887 A JP 24782887A JP 24782887 A JP24782887 A JP 24782887A JP S6491120 A JPS6491120 A JP S6491120A
Authority
JP
Japan
Prior art keywords
insulating film
gate insulating
light
thin film
channel part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24782887A
Other languages
Japanese (ja)
Inventor
Ken Tsutsui
Yasuo Tanaka
Haruo Matsumaru
Akira Sasano
Toshihisa Tsukada
Yoshiyuki Kaneko
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP24782887A priority Critical patent/JPS6491120A/en
Publication of JPS6491120A publication Critical patent/JPS6491120A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/786Thin film transistors, i.e. transistors with a channel being at least partly a thin film
    • H01L29/78606Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
    • H01L29/78633Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device with a light shield

Abstract

PURPOSE:To suppress light incidence on a semiconductor channel part from both above and below a substrate and to prevent the off characteristics of the thin film transistor (TR) from deteriorating by covering the end surfaces of a gate insulating film in the vicinity of a noncrystal semiconductor pattern with metal. CONSTITUTION:Light from a back light passed through the substrate 1 and then enters the gate insulation film 3. Here, an end part of the gate insulating film connecting with the channel part of a semiconductor (I) 4 is covered with the metal at the time of the formation of a source drain (I) 6 and source drain (II) 7; and the gate insulating film 3 is covered together with a gate 2 to prevent the external light from entering the channel part through the gate insulating film 3. Consequently, the off characteristics of the thin film TR are prevented from deteriorating owing to the light.
JP24782887A 1987-10-02 1987-10-02 Thin film transistor Pending JPS6491120A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24782887A JPS6491120A (en) 1987-10-02 1987-10-02 Thin film transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24782887A JPS6491120A (en) 1987-10-02 1987-10-02 Thin film transistor

Publications (1)

Publication Number Publication Date
JPS6491120A true JPS6491120A (en) 1989-04-10

Family

ID=17169274

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24782887A Pending JPS6491120A (en) 1987-10-02 1987-10-02 Thin film transistor

Country Status (1)

Country Link
JP (1) JPS6491120A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007199188A (en) * 2006-01-24 2007-08-09 Seiko Epson Corp Electrooptical apparatus and method for manufacturing the same, and electronic equipment
JP2013165257A (en) * 2012-02-13 2013-08-22 Samsung Electronics Co Ltd Thin film transistor, and display panel adopting the same
JP2013225683A (en) * 2009-03-27 2013-10-31 Semiconductor Energy Lab Co Ltd Display device
KR20190032316A (en) * 2019-03-14 2019-03-27 삼성전자주식회사 Thin film transistor and display panel employing the same

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007199188A (en) * 2006-01-24 2007-08-09 Seiko Epson Corp Electrooptical apparatus and method for manufacturing the same, and electronic equipment
JP2013225683A (en) * 2009-03-27 2013-10-31 Semiconductor Energy Lab Co Ltd Display device
JP2013232655A (en) * 2009-03-27 2013-11-14 Semiconductor Energy Lab Co Ltd Semiconductor device
US9012918B2 (en) 2009-03-27 2015-04-21 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device including oxide semiconductor
US9705003B2 (en) 2009-03-27 2017-07-11 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device including first and second gate electrodes and stack of insulating layers
JP2013165257A (en) * 2012-02-13 2013-08-22 Samsung Electronics Co Ltd Thin film transistor, and display panel adopting the same
KR20190032316A (en) * 2019-03-14 2019-03-27 삼성전자주식회사 Thin film transistor and display panel employing the same

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