JPS6479743A - Pattern forming method by dry developing - Google Patents
Pattern forming method by dry developingInfo
- Publication number
- JPS6479743A JPS6479743A JP23634387A JP23634387A JPS6479743A JP S6479743 A JPS6479743 A JP S6479743A JP 23634387 A JP23634387 A JP 23634387A JP 23634387 A JP23634387 A JP 23634387A JP S6479743 A JPS6479743 A JP S6479743A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- resist film
- pattern
- dry
- silylated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0755—Non-macromolecular compounds containing Si-O, Si-C or Si-N bonds
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
PURPOSE:To form a pattern with high accuracy by forming an absorption layer with increased absorbance, on a resist film positioned on a selectively exposed part, and forming a silylated layer with an increased silicon content on said absorption layer, followed by dry-etching the obtd. layer. CONSTITUTION:The absorption layer 7 which has a prescribed pattern and the increased absorbance is formed on the resist film 4 by applying an upper layer resist film 4 composed of an org. polymer on a substrate 3, followed by exposing selectively the upper layer resist film with an electron beam or a far infra-red radiation, etc. Next, the silylated layer 8 with the increased silicon content is formed on the absorption layer part 7 by subjecting said layer to silylation with the far infra-red radiation while bringing into contact said layer with a halogenated alkylsilane solution. And then, the obtd. silylated layer is dry-etched with a dry-etching gas to form the pattern. Thus, the pattern with the high accuracy can be formed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP23634387A JPS6479743A (en) | 1987-09-22 | 1987-09-22 | Pattern forming method by dry developing |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP23634387A JPS6479743A (en) | 1987-09-22 | 1987-09-22 | Pattern forming method by dry developing |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6479743A true JPS6479743A (en) | 1989-03-24 |
Family
ID=16999405
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP23634387A Pending JPS6479743A (en) | 1987-09-22 | 1987-09-22 | Pattern forming method by dry developing |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6479743A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03126036A (en) * | 1989-10-11 | 1991-05-29 | Oki Electric Ind Co Ltd | Intermediate layer forming material for three-layer resist method |
JP2008233552A (en) * | 2007-03-20 | 2008-10-02 | Sony Corp | Pattern formation substrate, pattern forming method, and metal mold |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61107346A (en) * | 1984-10-26 | 1986-05-26 | ユセベ エレクトロニックス,ソシエテ アノニム | Formation of negative graphic in photoresist and integrated semiconductor circuit thereby |
JPS61219034A (en) * | 1985-03-19 | 1986-09-29 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Plasma resistant polymer material and making thereof |
JPS6225424A (en) * | 1985-07-26 | 1987-02-03 | Nippon Telegr & Teleph Corp <Ntt> | Pattern forming method |
JPS62165650A (en) * | 1986-01-14 | 1987-07-22 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Manufacture of positive photoresist |
-
1987
- 1987-09-22 JP JP23634387A patent/JPS6479743A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61107346A (en) * | 1984-10-26 | 1986-05-26 | ユセベ エレクトロニックス,ソシエテ アノニム | Formation of negative graphic in photoresist and integrated semiconductor circuit thereby |
JPS61219034A (en) * | 1985-03-19 | 1986-09-29 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Plasma resistant polymer material and making thereof |
JPS6225424A (en) * | 1985-07-26 | 1987-02-03 | Nippon Telegr & Teleph Corp <Ntt> | Pattern forming method |
JPS62165650A (en) * | 1986-01-14 | 1987-07-22 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Manufacture of positive photoresist |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03126036A (en) * | 1989-10-11 | 1991-05-29 | Oki Electric Ind Co Ltd | Intermediate layer forming material for three-layer resist method |
JP2008233552A (en) * | 2007-03-20 | 2008-10-02 | Sony Corp | Pattern formation substrate, pattern forming method, and metal mold |
US8545969B2 (en) | 2007-03-20 | 2013-10-01 | Sony Corporation | Pattern-formed substrate, pattern-forming method, and die |
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