JPS6475975A - Handling apparatus of ic - Google Patents
Handling apparatus of icInfo
- Publication number
- JPS6475975A JPS6475975A JP62234517A JP23451787A JPS6475975A JP S6475975 A JPS6475975 A JP S6475975A JP 62234517 A JP62234517 A JP 62234517A JP 23451787 A JP23451787 A JP 23451787A JP S6475975 A JPS6475975 A JP S6475975A
- Authority
- JP
- Japan
- Prior art keywords
- product
- measurement
- sent
- marking
- measuring element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To make measurement efficient and to improve a production capacity, by providing marking elements and product-detecting elements between a measuring element and right and left tape reel elements respectively. CONSTITUTION:IC 50 before measurement is supplied to a tape reel 1a on the left side and taken out by a conveyance roller 2a, and after the presence of the IC 50 is detected by a product detecting element 5a, the IC is sent to a measuring element 3. On the occasion, a product presser 4 is lowered to make the IC 50 contact with the measuring element 3, and thereby electric measurement is conducted. When the measurement is ended, the IC 50 is sent to a marking element and only a good product is marked by a good product marking element 6b according to the result of the measurement. Next, the feeding direction being reversed, IC 50 is taken out of a tape reel 1b on the right side, and only the IC determined as bad by the measurement conducted when the product is sent to the right is detected by a product detecting element 5b and sent to the measuring element 3. In the measuring element 3 only the IC detected by the detecting element 5b is measured. When the measurement is ended, the measured IC 50 is sent to the marking element, and the good product is marked by a good product marking element 6a, while a defective product is marked by a defective product marking element 7a.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62234517A JPS6475975A (en) | 1987-09-18 | 1987-09-18 | Handling apparatus of ic |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62234517A JPS6475975A (en) | 1987-09-18 | 1987-09-18 | Handling apparatus of ic |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6475975A true JPS6475975A (en) | 1989-03-22 |
Family
ID=16972264
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62234517A Pending JPS6475975A (en) | 1987-09-18 | 1987-09-18 | Handling apparatus of ic |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6475975A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008149729A1 (en) * | 2007-06-06 | 2008-12-11 | Advantest Corporation | Tcp testing method and tcp testing apparatus |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5457968A (en) * | 1977-10-18 | 1979-05-10 | Nec Corp | Electrical testing unit of semiconductor device and its production |
JPS61207046A (en) * | 1985-03-12 | 1986-09-13 | Nec Corp | Autohandler for selection of tape carrier semiconductor device |
-
1987
- 1987-09-18 JP JP62234517A patent/JPS6475975A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5457968A (en) * | 1977-10-18 | 1979-05-10 | Nec Corp | Electrical testing unit of semiconductor device and its production |
JPS61207046A (en) * | 1985-03-12 | 1986-09-13 | Nec Corp | Autohandler for selection of tape carrier semiconductor device |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008149729A1 (en) * | 2007-06-06 | 2008-12-11 | Advantest Corporation | Tcp testing method and tcp testing apparatus |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ES431898A1 (en) | Equipment for introduction of a strip of paper, cardboard or similar material into a printing machine | |
DE3769440D1 (en) | DEVICE FOR FEEDING REELS WITH STRIPE MATERIAL, IN PARTICULAR REELS OF CIGARETTE PAPER. | |
JPS6437905A (en) | Auxiliary film welding apparatus of slide fastener chain | |
JPS6475975A (en) | Handling apparatus of ic | |
GB1397640A (en) | Method of and apparatus for handling material | |
ES8202758A1 (en) | Machine for coiling strip material with a device for momentary immobilization of the tails of the strips | |
ATE25934T1 (en) | STRIP FEED DEVICE. | |
GB1509274A (en) | Copying apparatus | |
ES8700161A1 (en) | Tire marker. | |
GB1417972A (en) | Apparatus for splicing a moving web | |
DE3873475D1 (en) | DEVICE FOR CORRECTLY DELIVERING CONTINUOUS TAPES WITH SHAPED SIDE SURFACE TO PUNCHING MACHINES. | |
CH610403A5 (en) | Bearing device for rollers used in rotary printing machines for measuring the paper web tension | |
JPS644044A (en) | Handling device of tab-type ic | |
ATE104903T1 (en) | EQUIPMENT FOR THE MANUFACTURE OF RUBBER PRODUCTS IN WEB SHAPE. | |
JPS57146643A (en) | Ply supplier | |
JPS5552811A (en) | Automatic inspection device | |
JPS5738143A (en) | Mark indicating apparatus for hose cutting device in standard size | |
JPS56122750A (en) | High speed feeder | |
JPH01235866A (en) | Handling device for tab ic | |
JPS6437330A (en) | Automatic cutting apparatus for continuously packaged articles | |
JPS57105335A (en) | Feeding device for tire component material | |
JPS55149805A (en) | Length monitoring method of continuous cloth | |
JPS5599010A (en) | Measuring apparatus for size of plate material | |
JPS52153762A (en) | Material feed error detector | |
SU618770A1 (en) | Device for registering and monitoring machine downtime |