JPS6475975A - Handling apparatus of ic - Google Patents

Handling apparatus of ic

Info

Publication number
JPS6475975A
JPS6475975A JP62234517A JP23451787A JPS6475975A JP S6475975 A JPS6475975 A JP S6475975A JP 62234517 A JP62234517 A JP 62234517A JP 23451787 A JP23451787 A JP 23451787A JP S6475975 A JPS6475975 A JP S6475975A
Authority
JP
Japan
Prior art keywords
product
measurement
sent
marking
measuring element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62234517A
Other languages
Japanese (ja)
Inventor
Akito Tanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62234517A priority Critical patent/JPS6475975A/en
Publication of JPS6475975A publication Critical patent/JPS6475975A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To make measurement efficient and to improve a production capacity, by providing marking elements and product-detecting elements between a measuring element and right and left tape reel elements respectively. CONSTITUTION:IC 50 before measurement is supplied to a tape reel 1a on the left side and taken out by a conveyance roller 2a, and after the presence of the IC 50 is detected by a product detecting element 5a, the IC is sent to a measuring element 3. On the occasion, a product presser 4 is lowered to make the IC 50 contact with the measuring element 3, and thereby electric measurement is conducted. When the measurement is ended, the IC 50 is sent to a marking element and only a good product is marked by a good product marking element 6b according to the result of the measurement. Next, the feeding direction being reversed, IC 50 is taken out of a tape reel 1b on the right side, and only the IC determined as bad by the measurement conducted when the product is sent to the right is detected by a product detecting element 5b and sent to the measuring element 3. In the measuring element 3 only the IC detected by the detecting element 5b is measured. When the measurement is ended, the measured IC 50 is sent to the marking element, and the good product is marked by a good product marking element 6a, while a defective product is marked by a defective product marking element 7a.
JP62234517A 1987-09-18 1987-09-18 Handling apparatus of ic Pending JPS6475975A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62234517A JPS6475975A (en) 1987-09-18 1987-09-18 Handling apparatus of ic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62234517A JPS6475975A (en) 1987-09-18 1987-09-18 Handling apparatus of ic

Publications (1)

Publication Number Publication Date
JPS6475975A true JPS6475975A (en) 1989-03-22

Family

ID=16972264

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62234517A Pending JPS6475975A (en) 1987-09-18 1987-09-18 Handling apparatus of ic

Country Status (1)

Country Link
JP (1) JPS6475975A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008149729A1 (en) * 2007-06-06 2008-12-11 Advantest Corporation Tcp testing method and tcp testing apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5457968A (en) * 1977-10-18 1979-05-10 Nec Corp Electrical testing unit of semiconductor device and its production
JPS61207046A (en) * 1985-03-12 1986-09-13 Nec Corp Autohandler for selection of tape carrier semiconductor device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5457968A (en) * 1977-10-18 1979-05-10 Nec Corp Electrical testing unit of semiconductor device and its production
JPS61207046A (en) * 1985-03-12 1986-09-13 Nec Corp Autohandler for selection of tape carrier semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008149729A1 (en) * 2007-06-06 2008-12-11 Advantest Corporation Tcp testing method and tcp testing apparatus

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