JPH01235866A - Handling device for tab ic - Google Patents

Abstract

PURPOSE:To eliminate the area for executing marking of conforming articles at the time of classification and to increase the scale of ICs by providing a memory device which stores the classifications of measurement results. CONSTITUTION:Carrying rollers 2a, 2b are disposed below tape reel sections 1a, 1b and a measurement section 3 is provided between the same. Product detecting sections 5a, 5b and non-conforming article marking sections 7a, 7b are provided respectively between the rollers 2a, 2b and the measurement section 3. The IC 50 prior to measurement is supplied to the tape reel section 1a. This IC 50 is taken out by the roller 2a and is electrically measured in the measurement section 3. The result of the measurement is stored in the memory device 10. The IC 50 with which the measurement is completed is housed via the roller 2b into the tape reel section 1b. The feed direction is then reversed and the IC is taken out by the roller 2b. The results of the measurement obtd. by the just made measurement are collated with the data stored in the memory device 10 and only the IC which is decided to be non-conforming is identified and is sent to the measurement section 3. The results of the measurement are stored in the memory device 10. Only the non-conforming articles are marked in the non-conforming article marking section 7b.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a handling device for electrically measuring an IC (integrated circuit), and in particular to a handling device for electrically measuring an IC (integrated circuit).
rated dan onti;na 5ystel)
The present invention relates to a handling device for electrically measuring IC.

[Conventional technology]

Conventionally, a handling device for electrically measuring this type of TAB IC has tape reel sections 1a and 1b provided on both left and right sides, a measuring section 3, and a measuring section 3, as shown in Fig. 2.
and the tape reel section 1a, a product detection section 5a that detects one IC at a time, marking sections 6a and 7a for good products and defective products, and between the measurement section 3 and the tape reel section 1b. It is provided with a product detection section 5b that detects each Ic+1 product, and marking sections 6b and 7b for good products and defective products. 2a, 2b! , are conveying rollers, 4 is a product presser, and 8 is a frame.

Measurements were carried out while the ICAO was being fed from left to right or in the opposite direction, and classification based on the measurement results was performed by marking good products and marking defective products.

[Problem to be solved by the invention]

The conventional handling device that performs electrical measurements on TAB ICs described above performs classification based on measurement results by marking good products and marking defective products.
It is necessary to provide an area on the top for marking good products and marking defective products, which has the drawback of contradicting recent efforts to increase the density of ICs (increase in the number of pins) and reduce manufacturing costs.

In addition, as products become more diverse, the markings for good and defective products cannot always be the same, and the positions of the good and defective product markings need to be changed every time the product changes. It also had the disadvantage of being too expensive.

An object of the present invention is to provide a handling device that solves the above problems.

[Differences between the invention and the prior art]

The present invention differs from the above-described conventional handling device that performs electrical measurements on TAB ICs in that it performs classification by storing measurement results in a storage unit.

[Means for Solving the Problems] In order to achieve the above object, in the handling device of the present invention, a T.
One that has a measuring section that performs electrical measurements of AB ICs, a storage device that stores the measurement results of the measuring section, and a marking section that marks only defective TAB ICs based on the data in the storage device. It is.

〔Example〕

Next, one embodiment of the present invention will be described with reference to the drawings.

FIG. 1 is a schematic front view of one embodiment of the present invention. 1st
As shown in the figure, tape reel parts 1a and lb are provided on both left and right sides.
Conveyance rollers 2a and 2b are arranged below, a measuring section 3 (measuring section 3 is connected to a measuring device not shown) is arranged in the center, and a product presser 4 is arranged above it. Further, a defective product marking section (product punching section) 7a and a product detection section (left) 5a are installed between the conveyance roller 2a and the measurement section 3, and a product detection section 5b is installed between the conveyance roller 2b and the measurement section 3.
, a defective product marking section (product punching section) 7b are respectively arranged. The above components are located in a frame 8, with a control section 9 of the handling device at the bottom of the frame 8, and a storage device (for example, using a floppy disk drive) 10 next to it for storing measurement results. will be established.

Supply IC50 before measurement to the left tape reel part 1a,
The IC 50 is taken out by the conveyance roller 2a, and after the presence or absence of the IC is detected by the product detection section 5a, it is sent to the measurement section 3.

When the IC 50 is sent to the measurement section 3, the product holder 4 is lowered, the IC 50 is brought into contact with the measurement section 3, and an electrical measurement is performed using a measuring device (not shown).

When the measurement is completed, save the measurement results in the memory bag. , 10. The following describes the operation when re-measuring an IC that has been determined to be defective.

After the measurement, the IC passes through the conveyance roller 2b and is stored in the tape reel section 1b. In addition, defective products should not be marked as defective (product punching).
All the measurement results of the ICs 50 wound on the tape reel portion 1b are stored in the storage device 10 in the order of the ICs 50.

Next, the feeding direction is reversed, the IC 50 is taken out from the tape reel section 1b through the conveyance roller 2b, and the IC 50 detected by the product detection section 5b is compared with the data in the storage device 10 containing the measurement results measured earlier. Only ICs determined to be defective are identified and sent to the measuring section 3. The measurement unit 3 measures only the ICs identified as defective.

When the measurement is completed, the measurement result is stored in the storage device 10,
Then, it is sent to a defective product marking section (product punching section), and only defective products are marked according to the data in the storage device 10. Then, it passes through the conveying roller 2a and is stored in the tape reel section 1a.

With the above steps, normal sorting (when feeding to the right) and reselection of defective products (when feeding to the left) are completed. Note that the tape feeding direction may be the opposite direction.

In addition, when performing grade classification (difference in operation speed), the measurement results are stored in the storage device 10, and the stored data is used at the time of re-selection or as 0LB (Ω) in the next process.
It may also be used when ut Lf3ad ondina).

〔Effect of the invention〕

As explained above, the present invention provides a storage device for storing classifications of measurement results in a handling device that performs electrical measurements of TAB ICs, thereby eliminating the need for any area for marking non-defective products during classification, and improving the quality of ICs.
This has the effect of increasing the density of the material and, in turn, reducing manufacturing costs. Furthermore, by eliminating the need for non-defective product marking, there is also the effect that it is possible to easily handle a wide variety of products with various patterns.

[Brief explanation of the drawing]

Fig. 1 is a plan view showing one embodiment of the present invention;
The figure is a schematic plan view of a conventional example. la, lb...Tape reel parts 2a, 2b...Conveyance roller 3...Measurement part 4...Product holder 5a
, 5b... Product detection section 6a, 6b... Good product marking section 7a, 7b... Defective product marking section (product punching section) 8... Frame 9... Control section 10...
・Storage device 50...IC diagram 1

Claims (1)

[Claims] 1. In the handling device used for electrical measurement of TAB-IC, it is installed between the tape reel parts on both the left and right sides,
A measuring section that performs electrical measurements on TAB-ICs, a storage device that stores the measurement results of the measuring section, and a marking section that marks only defective TAB-ICs based on the data in the storage device. TAB-I characterized by having
C handling equipment.