JPH01235866A - Handling device for tab ic - Google Patents
Handling device for tab icInfo
- Publication number
- JPH01235866A JPH01235866A JP63062982A JP6298288A JPH01235866A JP H01235866 A JPH01235866 A JP H01235866A JP 63062982 A JP63062982 A JP 63062982A JP 6298288 A JP6298288 A JP 6298288A JP H01235866 A JPH01235866 A JP H01235866A
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- section
- marking
- tape reel
- conforming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims abstract description 43
- 230000002950 deficient Effects 0.000 claims description 22
- 238000003860 storage Methods 0.000 claims description 13
- 238000001514 detection method Methods 0.000 description 7
- 238000004080 punching Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 241000765083 Ondina Species 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、IC(集積回路)の電気的測定を行うハンド
リング装置に間し、特にTAB(工apeΔutoIl
lated 旦onti;na 5ystel)
I Cの電気的測定を行うハンドリング装置に関する
。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a handling device for electrically measuring an IC (integrated circuit), and in particular to a handling device for electrically measuring an IC (integrated circuit).
rated dan onti;na 5ystel)
The present invention relates to a handling device for electrically measuring IC.
従来、この種のTAB ICの電気的測定を行うハン
ドリング装置は、第2図に示すように、左右両側に設け
たテープリール部1a、lbと、測定部3と、測定部3
とテープリール部1aとの間に設けられ、ICを1ケず
つ検出する製品検出部5aと、良品用及び不良品用のマ
ーキング部6a及び7aと、測定部3とテープリール部
1bとの間に設けられ、Ic+1ケずつ検出する製品検
出部5bと、良品用及び不良品用マーキング部6b及び
7bより構成されている。2a、2b!、を搬送ローラ
、4は製品押さえ、8はフレームである。Conventionally, a handling device for electrically measuring this type of TAB IC has tape reel sections 1a and 1b provided on both left and right sides, a measuring section 3, and a measuring section 3, as shown in Fig. 2.
and the tape reel section 1a, a product detection section 5a that detects one IC at a time, marking sections 6a and 7a for good products and defective products, and between the measurement section 3 and the tape reel section 1b. It is provided with a product detection section 5b that detects each Ic+1 product, and marking sections 6b and 7b for good products and defective products. 2a, 2b! , are conveying rollers, 4 is a product presser, and 8 is a frame.
ICAOを左から右方向にあるいはその逆方向に送りな
がら測定を行い、測定結果による分類を良品マーキング
と不良品マーキングで行っていた。Measurements were carried out while the ICAO was being fed from left to right or in the opposite direction, and classification based on the measurement results was performed by marking good products and marking defective products.
上述した従来のTAB ICの電気的測定を行うハン
ドリング装置は、測定結果による分類を良品マーキング
と不良品マーキングで行っているので、TAB IC
上に良品マーキングと不良品マーキングを行うエリアを
設ける必要があり、最近のICの高密度化(ピン数の増
加)及び製造コスト低減に対して、相反するという欠点
があった。The conventional handling device that performs electrical measurements on TAB ICs described above performs classification based on measurement results by marking good products and marking defective products.
It is necessary to provide an area on the top for marking good products and marking defective products, which has the drawback of contradicting recent efforts to increase the density of ICs (increase in the number of pins) and reduce manufacturing costs.
また、製品の多様化に対して、良品マーキングと不良品
マーキングは、常に同一とする事が出来ず、製品が変る
毎に良品マーキングと不良品マーキングの位置を変える
必要があり、装置の汎用性にかけるという欠点もあった
。In addition, as products become more diverse, the markings for good and defective products cannot always be the same, and the positions of the good and defective product markings need to be changed every time the product changes. It also had the disadvantage of being too expensive.
本発明の目的は前記課題を解決したハンドリング装置を
提供することにある。An object of the present invention is to provide a handling device that solves the above problems.
上述した従来のTAB ICの電気的測定を行うハン
ドリング装置に対し、本発明は、測定結果を記憶装置部
に記憶することにより分類を行うという相違点を有する
。The present invention differs from the above-described conventional handling device that performs electrical measurements on TAB ICs in that it performs classification by storing measurement results in a storage unit.
〔課題を解決するための手段〕
上記目的を達成するため、本発明のハンドリング装置に
おいては、左右両側のテープリール部間に設けられ、T
AB ICの電気的測定を行う測定部と、該測定部の
測定結果を記憶させる記憶装置と、該記憶装置のデータ
に基いて、不良品のTAB ICにのみマーキングを
付すマーキング部とを有するものである。[Means for Solving the Problems] In order to achieve the above object, in the handling device of the present invention, a T.
One that has a measuring section that performs electrical measurements of AB ICs, a storage device that stores the measurement results of the measuring section, and a marking section that marks only defective TAB ICs based on the data in the storage device. It is.
次に本発明の一実施例を図面により説明する。 Next, one embodiment of the present invention will be described with reference to the drawings.
第1図は、本発明の一実施例の概略正面図である。第1
図に示すように、左右両側にテープリール部1a、lb
の下方に搬送ローラ2a、2bを配置し、中央部に測定
部3(測定部3は、図示されていない測定器に接続され
ている)を、その上方に製品押さえ4を配置する。更に
、搬送ローラ2aと測定部3との間に、不良品マーキン
グ部(製品打ち抜き部)7a、製品検出部(左)5aを
、搬送ローラ2bと測定部3との間に、製品検出部5b
、不良品マーキング部(製品打ち抜き部)7bをそれぞ
れ配置する。そして、以上のものは、フレーム8内にあ
り、そのフレーム8の下部に本ハンドリング装置の制御
部9を、その横に測定結果を記憶する記憶装置(例えば
、フロッピー・ディスク・ドライブを用いる)10を設
ける。FIG. 1 is a schematic front view of one embodiment of the present invention. 1st
As shown in the figure, tape reel parts 1a and lb are provided on both left and right sides.
Conveyance rollers 2a and 2b are arranged below, a measuring section 3 (measuring section 3 is connected to a measuring device not shown) is arranged in the center, and a product presser 4 is arranged above it. Further, a defective product marking section (product punching section) 7a and a product detection section (left) 5a are installed between the conveyance roller 2a and the measurement section 3, and a product detection section 5b is installed between the conveyance roller 2b and the measurement section 3.
, a defective product marking section (product punching section) 7b are respectively arranged. The above components are located in a frame 8, with a control section 9 of the handling device at the bottom of the frame 8, and a storage device (for example, using a floppy disk drive) 10 next to it for storing measurement results. will be established.
左のテープリール部1aに測定前のIC50を供給し、
搬送ローラ2aによりIC50を取り出し、製品検出部
5aでICの有無を検出した後、測定部3に送られる。Supply IC50 before measurement to the left tape reel part 1a,
The IC 50 is taken out by the conveyance roller 2a, and after the presence or absence of the IC is detected by the product detection section 5a, it is sent to the measurement section 3.
測定部3にIC50が送られた時、製品押さえ4を下降
させ、IC50を測定部3にコンタクトさせ、図示され
ていない測定器で電気的測定を行う。When the IC 50 is sent to the measurement section 3, the product holder 4 is lowered, the IC 50 is brought into contact with the measurement section 3, and an electrical measurement is performed using a measuring device (not shown).
測定が終了すると、測定結果を記憶袋′I!、10で記
憶する。以下、不良品と測定されたICについて、再度
測定を行う場合の動作を説明する。When the measurement is completed, save the measurement results in the memory bag. , 10. The following describes the operation when re-measuring an IC that has been determined to be defective.
測定終了したICは、搬送ローラ2bを通ってテープリ
ール部1bに収納される。なお、不良品は、不良品のマ
ーキング(製品打ち抜き)を行わないでおく、これで、
テープリール部1bに巻き取られているIC50の測定
結果は、全て記憶装置10にIC50の順番通りに記憶
されたことになる。After the measurement, the IC passes through the conveyance roller 2b and is stored in the tape reel section 1b. In addition, defective products should not be marked as defective (product punching).
All the measurement results of the ICs 50 wound on the tape reel portion 1b are stored in the storage device 10 in the order of the ICs 50.
次に、送り方向を逆にして、テープリール部1bから搬
送ローラ2bを通してIC50を取り出し、製品検出部
5bで検出したIC50と先程測定した測定結果を収納
した記憶装置10のデータとを照合し、不良と測定され
たICだけを識別し測定部3に送る。測定部3では、不
良と識別されたICだけを測定する。Next, the feeding direction is reversed, the IC 50 is taken out from the tape reel section 1b through the conveyance roller 2b, and the IC 50 detected by the product detection section 5b is compared with the data in the storage device 10 containing the measurement results measured earlier. Only ICs determined to be defective are identified and sent to the measuring section 3. The measurement unit 3 measures only the ICs identified as defective.
測定が終了すると、測定結果を記憶装置10で記憶し、
それから、不良品マーキング部(製品打ち抜き部)に送
り、記憶装置10のデータに従い、不良品だけをマーキ
ングする。それから、搬送ローラ2aを通ってテープリ
ール部1aに収納される。When the measurement is completed, the measurement result is stored in the storage device 10,
Then, it is sent to a defective product marking section (product punching section), and only defective products are marked according to the data in the storage device 10. Then, it passes through the conveying roller 2a and is stored in the tape reel section 1a.
以上で、通常の選別(右送り時)と不良品再選(左送り
時)が完了する。なお、テープの送り方向は、上記の逆
方向であってもよい。With the above steps, normal sorting (when feeding to the right) and reselection of defective products (when feeding to the left) are completed. Note that the tape feeding direction may be the opposite direction.
尚、グレード分け(動作スピードの違い)の選別を実施
する場合、その測定結果を記憶装置10に記憶し、その
記憶データを再選時、又は、次工程における0LB(Ω
ut Lf3ad 旦ondina)の際に使用す
るようにしてもよい。In addition, when performing grade classification (difference in operation speed), the measurement results are stored in the storage device 10, and the stored data is used at the time of re-selection or as 0LB (Ω) in the next process.
It may also be used when ut Lf3ad ondina).
以上説明したように本発明は、TAB ICの電気的
測定を行うハンドリング装置において、測定結果に対す
る分類を記憶する記憶装置を設けることにより、分類時
の良品マーキングを行うエリアを一切必要とせず、IC
の高密度化がはかれ、ひいては製造コストの低減がはか
れるという効果がある。また良品マーキングを不要とし
たことにより、各種パターンの多種品の製品に容易に対
応することができるという効果もある。As explained above, the present invention provides a storage device for storing classifications of measurement results in a handling device that performs electrical measurements of TAB ICs, thereby eliminating the need for any area for marking non-defective products during classification, and improving the quality of ICs.
This has the effect of increasing the density of the material and, in turn, reducing manufacturing costs. Furthermore, by eliminating the need for non-defective product marking, there is also the effect that it is possible to easily handle a wide variety of products with various patterns.
第1図は、本発明の一実施例を示すits平面図、第2
図は従来例の概略平面図である。
la、lb・・・テープリール部
2a、2b・・・搬送ローラ
3・・・測定部 4・・・製品押さえ5a
、5b・・・製品検出部
6a、6b・・・良品マーキング部
7a、7b・・・不良品マーキング部(製品打ち抜き部
)
8・・・フレーム 9・・・制御部10・・
・記憶装置 50・・・IC第1図Fig. 1 is a plan view showing one embodiment of the present invention;
The figure is a schematic plan view of a conventional example. la, lb...Tape reel parts 2a, 2b...Conveyance roller 3...Measurement part 4...Product holder 5a
, 5b... Product detection section 6a, 6b... Good product marking section 7a, 7b... Defective product marking section (product punching section) 8... Frame 9... Control section 10...
・Storage device 50...IC diagram 1
Claims (1)
置において、左右両側のテープリール部間に設けられ、
TAB−ICの電気的測定を行う測定部と、該測定部の
測定結果を記憶させる記憶装置と、該記憶装置のデータ
に基いて、不良品のTAB−ICにのみマーキングを付
すマーキング部とを有することを特徴とするTAB−I
Cのハンドリング装置。1. In the handling device used for electrical measurement of TAB-IC, it is installed between the tape reel parts on both the left and right sides,
A measuring section that performs electrical measurements on TAB-ICs, a storage device that stores the measurement results of the measuring section, and a marking section that marks only defective TAB-ICs based on the data in the storage device. TAB-I characterized by having
C handling equipment.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63062982A JPH01235866A (en) | 1988-03-16 | 1988-03-16 | Handling device for tab ic |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63062982A JPH01235866A (en) | 1988-03-16 | 1988-03-16 | Handling device for tab ic |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01235866A true JPH01235866A (en) | 1989-09-20 |
Family
ID=13216077
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63062982A Pending JPH01235866A (en) | 1988-03-16 | 1988-03-16 | Handling device for tab ic |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01235866A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0594780U (en) * | 1992-05-26 | 1993-12-24 | 安藤電気株式会社 | TAB device defective device classification / accommodation mechanism |
JP2007010601A (en) * | 2005-07-04 | 2007-01-18 | Matsushita Electric Ind Co Ltd | Inspection device |
WO2008149729A1 (en) * | 2007-06-06 | 2008-12-11 | Advantest Corporation | Tcp testing method and tcp testing apparatus |
JP2013007633A (en) * | 2011-06-23 | 2013-01-10 | Sharp Corp | Test device of semiconductor device and concentration punching device |
-
1988
- 1988-03-16 JP JP63062982A patent/JPH01235866A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0594780U (en) * | 1992-05-26 | 1993-12-24 | 安藤電気株式会社 | TAB device defective device classification / accommodation mechanism |
JP2007010601A (en) * | 2005-07-04 | 2007-01-18 | Matsushita Electric Ind Co Ltd | Inspection device |
WO2008149729A1 (en) * | 2007-06-06 | 2008-12-11 | Advantest Corporation | Tcp testing method and tcp testing apparatus |
JP2013007633A (en) * | 2011-06-23 | 2013-01-10 | Sharp Corp | Test device of semiconductor device and concentration punching device |
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