WO2008149729A1 - Tcp testing method and tcp testing apparatus - Google Patents

Tcp testing method and tcp testing apparatus Download PDF

Info

Publication number
WO2008149729A1
WO2008149729A1 PCT/JP2008/059725 JP2008059725W WO2008149729A1 WO 2008149729 A1 WO2008149729 A1 WO 2008149729A1 JP 2008059725 W JP2008059725 W JP 2008059725W WO 2008149729 A1 WO2008149729 A1 WO 2008149729A1
Authority
WO
WIPO (PCT)
Prior art keywords
tcp
tcp testing
reel
tcps
carrier tape
Prior art date
Application number
PCT/JP2008/059725
Other languages
French (fr)
Japanese (ja)
Inventor
Takeshi Onishi
Katsuhiro Imaizumi
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Publication of WO2008149729A1 publication Critical patent/WO2008149729A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0475—Sockets for IC's or transistors for TAB IC's

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Wire Bonding (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

A TCP testing method for testing TCPs (31) in sequence is provided with a test step (S32) wherein a carrier tape (30) is transferred in a forward direction from a supplying reel (21) to a take-up reel (22) and the TCPs (31) are tested in sequence; and a punching step (S42) wherein the carrier tape (30) is transferred in a backward direction from the take-up reel (22) to the supplying reel (21) and the TCPs (31) on the carrier tape (30) are punched based on the results of a prescribed test.
PCT/JP2008/059725 2007-06-06 2008-05-27 Tcp testing method and tcp testing apparatus WO2008149729A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007150413 2007-06-06
JP2007-150413 2007-06-06

Publications (1)

Publication Number Publication Date
WO2008149729A1 true WO2008149729A1 (en) 2008-12-11

Family

ID=40093550

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/059725 WO2008149729A1 (en) 2007-06-06 2008-05-27 Tcp testing method and tcp testing apparatus

Country Status (2)

Country Link
TW (1) TW200912341A (en)
WO (1) WO2008149729A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI416681B (en) * 2010-06-10 2013-11-21 Novatek Microelectronics Corp Chip on film arrangement

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6475975A (en) * 1987-09-18 1989-03-22 Nec Corp Handling apparatus of ic
JPH01235866A (en) * 1988-03-16 1989-09-20 Nec Corp Handling device for tab ic
JP2003107127A (en) * 2001-07-25 2003-04-09 Ando Electric Co Ltd Handler for tcp and illumination method for tcp

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6475975A (en) * 1987-09-18 1989-03-22 Nec Corp Handling apparatus of ic
JPH01235866A (en) * 1988-03-16 1989-09-20 Nec Corp Handling device for tab ic
JP2003107127A (en) * 2001-07-25 2003-04-09 Ando Electric Co Ltd Handler for tcp and illumination method for tcp

Also Published As

Publication number Publication date
TW200912341A (en) 2009-03-16

Similar Documents

Publication Publication Date Title
WO2010093424A3 (en) Methods, apparatus, and systems for facilitating and/or verifying locate and/or marking operations
TW200631887A (en) Peeling apparatus and peeling method
MY148803A (en) Electronic component pressing device and electronic component test apparatus
MY123531A (en) Method and apparatus for dividing a conduit into compartments
WO2006113114A3 (en) Networking cable tracer system
WO2008100919A3 (en) Method and apparatus for conserving battery power
WO2009129069A3 (en) Bulk feeding disk drives to disk drive testing systems
EP2019422A3 (en) Apparatus and method for arranging magnetic solder balls
PL1832519T3 (en) Method and device for marking elongated objects
WO2012027151A3 (en) System and method for performing calculations using a portable electronic device
WO2011153419A3 (en) Battery pack maintenance for electric vehicle
TW200514156A (en) Releasing method and releasing apparatus of work having adhesive tape
MY147294A (en) A method and device for aligning components
HK1147158A1 (en) Method and device for filling carrier tapes with electronic components
GB0303477D0 (en) On board diagnostics (OBD)
EP4215874A4 (en) Positioning method and apparatus, and electronic device and storage medium
EP4152023A4 (en) Apparatus and method for diagnosing battery
EP4174147A4 (en) Adhesive tape, method for fixing electronic device component or on-board device component, and method for producing electronic device or on-board device
WO2008149729A1 (en) Tcp testing method and tcp testing apparatus
WO2008120519A1 (en) Tcp handling apparatus
DE502008001662D1 (en) BAND APPLICATION METHOD AND BAND APPLYING DEVICE
EP4092538A4 (en) Method and apparatus for testing electronic map, and electronic device and storage medium
TW200744833A (en) TCP handler, and method of detecting defective punching hole therefor
EP1406198A3 (en) Method and apparatus for interactive annotation and measurement of time series data
WO2008063747A3 (en) Pick-and-place card guide clip-on grounding members

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 08764753

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 08764753

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: JP