JPS646735A - Method and apparatus for measuring refractive index distribution - Google Patents

Method and apparatus for measuring refractive index distribution

Info

Publication number
JPS646735A
JPS646735A JP15960187A JP15960187A JPS646735A JP S646735 A JPS646735 A JP S646735A JP 15960187 A JP15960187 A JP 15960187A JP 15960187 A JP15960187 A JP 15960187A JP S646735 A JPS646735 A JP S646735A
Authority
JP
Japan
Prior art keywords
refractive index
prism
medium
substrate
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15960187A
Other languages
Japanese (ja)
Other versions
JPH0820336B2 (en
Inventor
Hidemi Sato
Yasuo Hiyoshi
Takako Fukushima
Kazutami Kawamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP62159601A priority Critical patent/JPH0820336B2/en
Publication of JPS646735A publication Critical patent/JPS646735A/en
Publication of JPH0820336B2 publication Critical patent/JPH0820336B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To measure a refractive index distribution nondestructively at a high accuracy, by a method wherein a prism integrated with a light receiving element is put tight on a medium to calculate an execution refractive index of a medium at two points from a relationship between an angle of incidence of a laser light into the prism and intensity of reflected light on the bottom surface of the prism and changes in refractive index of the medium are determined by a numerical calculation using the refractive index. CONSTITUTION:A substrate 1 of a refractive index distribution measuring apparatus employs an LiNbO3 crystal to prepare a light waveguide 2 with the refractive index varying continuously in the depth of a substrate 1 by heat diffusion method. A prism 3 is put tightly on the waveguide 2 through an air layer. The prism 3 employs TiO2, is fixed on a holder 5 and the adhesion to the substrate 1 is adjusted with a set screw 7. The substrate 1 and the prism 3 are placed on a turntable 5 of a measuring device and a laser light from a light source 4 is made incident into the prism 3 at a specified angle of incidence to calculate an execution refractive index of the medium at two points from a relationship with intensity of reflection on the bottom surface of the prism 3. Thus, changes in the refractive index of the medium are determined by numerical calculation using the refractive index thus calculated.
JP62159601A 1987-06-29 1987-06-29 Refractive index distribution measuring method and measuring apparatus therefor Expired - Lifetime JPH0820336B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62159601A JPH0820336B2 (en) 1987-06-29 1987-06-29 Refractive index distribution measuring method and measuring apparatus therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62159601A JPH0820336B2 (en) 1987-06-29 1987-06-29 Refractive index distribution measuring method and measuring apparatus therefor

Publications (2)

Publication Number Publication Date
JPS646735A true JPS646735A (en) 1989-01-11
JPH0820336B2 JPH0820336B2 (en) 1996-03-04

Family

ID=15697266

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62159601A Expired - Lifetime JPH0820336B2 (en) 1987-06-29 1987-06-29 Refractive index distribution measuring method and measuring apparatus therefor

Country Status (1)

Country Link
JP (1) JPH0820336B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02244106A (en) * 1989-03-17 1990-09-28 Hitachi Ltd Method for measuring optical constant of thin film and optical integrated circuit or semiconductor element produced by using this method
JP2006275568A (en) * 2005-03-28 2006-10-12 Institute Of Physical & Chemical Research Method and instrument for measuring photonic band structure of photonic crystal waveguide
CN103884490A (en) * 2014-03-05 2014-06-25 内蒙古科技大学 Method and device for measuring double-prism refractive index on basis of optical levers

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5643529A (en) * 1979-09-18 1981-04-22 Nec Corp Measuring method of minute refractive index difference between optical waveguide line and its substrate
JPS6212840A (en) * 1985-07-10 1987-01-21 Morioka Shoji Kk Method and instrument for measuring concentration of liquid to be examined

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5643529A (en) * 1979-09-18 1981-04-22 Nec Corp Measuring method of minute refractive index difference between optical waveguide line and its substrate
JPS6212840A (en) * 1985-07-10 1987-01-21 Morioka Shoji Kk Method and instrument for measuring concentration of liquid to be examined

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02244106A (en) * 1989-03-17 1990-09-28 Hitachi Ltd Method for measuring optical constant of thin film and optical integrated circuit or semiconductor element produced by using this method
JP2006275568A (en) * 2005-03-28 2006-10-12 Institute Of Physical & Chemical Research Method and instrument for measuring photonic band structure of photonic crystal waveguide
CN103884490A (en) * 2014-03-05 2014-06-25 内蒙古科技大学 Method and device for measuring double-prism refractive index on basis of optical levers

Also Published As

Publication number Publication date
JPH0820336B2 (en) 1996-03-04

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