JPS6465874A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS6465874A
JPS6465874A JP22325987A JP22325987A JPS6465874A JP S6465874 A JPS6465874 A JP S6465874A JP 22325987 A JP22325987 A JP 22325987A JP 22325987 A JP22325987 A JP 22325987A JP S6465874 A JPS6465874 A JP S6465874A
Authority
JP
Japan
Prior art keywords
source
substrate
diffusion layer
drain
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22325987A
Other languages
Japanese (ja)
Inventor
Hidehiro Muneno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Casio Computer Co Ltd
Original Assignee
Casio Computer Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Casio Computer Co Ltd filed Critical Casio Computer Co Ltd
Priority to JP22325987A priority Critical patent/JPS6465874A/en
Publication of JPS6465874A publication Critical patent/JPS6465874A/en
Pending legal-status Critical Current

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  • Electrodes Of Semiconductors (AREA)

Abstract

PURPOSE:To manufacture a semiconductor device easily which is provided with a diffusion layer not only thin but also small in electric resistance by a method wherein a diffusion layer is formed in a substrate through a source poly-silicon layer and a drain poly-silicon layer both formed on the substrate as a diffusing source, and an electrode is formed on these layers each. CONSTITUTION:A poly-silicon layer is provided to a silicon substrate 1, patterning is performed thereon by implanting the impurity ions for the formation of a source section 4 and a drain section 5, and the substrate 1 is subjected to a heat treatment tor the formation of a silicon oxide film 6 which covers the whole face, when impurity is diffused into the corresponding regions of the substrate 1 for the formation of a low concentrated diffusion layer 7 through the source section 4 and the drain section 5 utilized as a diffusion source. A gate electrode 9 of aluminum is formed through sputtering evaporation, etching, or the like and impurity ions are implanted through the gate electrode used as a mask, so that a high concentrated diffusion layer is formed in the region 7. Thereafter, a source electrode 13 and a drain electrode 14 both of aluminum are formed on the layers 4 and 5 respectively, and thus a MOSFET semiconductor device short in a gate length is easily formed, which is provided with a diffusion layer not only shallow but also small in electric resistance.
JP22325987A 1987-09-07 1987-09-07 Manufacture of semiconductor device Pending JPS6465874A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22325987A JPS6465874A (en) 1987-09-07 1987-09-07 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22325987A JPS6465874A (en) 1987-09-07 1987-09-07 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS6465874A true JPS6465874A (en) 1989-03-13

Family

ID=16795299

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22325987A Pending JPS6465874A (en) 1987-09-07 1987-09-07 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS6465874A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0297027A (en) * 1988-10-03 1990-04-09 Mitsubishi Electric Corp Semiconductor device and manufacture thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0297027A (en) * 1988-10-03 1990-04-09 Mitsubishi Electric Corp Semiconductor device and manufacture thereof

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