JPS6465874A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS6465874A JPS6465874A JP22325987A JP22325987A JPS6465874A JP S6465874 A JPS6465874 A JP S6465874A JP 22325987 A JP22325987 A JP 22325987A JP 22325987 A JP22325987 A JP 22325987A JP S6465874 A JPS6465874 A JP S6465874A
- Authority
- JP
- Japan
- Prior art keywords
- source
- substrate
- diffusion layer
- drain
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Electrodes Of Semiconductors (AREA)
Abstract
PURPOSE:To manufacture a semiconductor device easily which is provided with a diffusion layer not only thin but also small in electric resistance by a method wherein a diffusion layer is formed in a substrate through a source poly-silicon layer and a drain poly-silicon layer both formed on the substrate as a diffusing source, and an electrode is formed on these layers each. CONSTITUTION:A poly-silicon layer is provided to a silicon substrate 1, patterning is performed thereon by implanting the impurity ions for the formation of a source section 4 and a drain section 5, and the substrate 1 is subjected to a heat treatment tor the formation of a silicon oxide film 6 which covers the whole face, when impurity is diffused into the corresponding regions of the substrate 1 for the formation of a low concentrated diffusion layer 7 through the source section 4 and the drain section 5 utilized as a diffusion source. A gate electrode 9 of aluminum is formed through sputtering evaporation, etching, or the like and impurity ions are implanted through the gate electrode used as a mask, so that a high concentrated diffusion layer is formed in the region 7. Thereafter, a source electrode 13 and a drain electrode 14 both of aluminum are formed on the layers 4 and 5 respectively, and thus a MOSFET semiconductor device short in a gate length is easily formed, which is provided with a diffusion layer not only shallow but also small in electric resistance.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22325987A JPS6465874A (en) | 1987-09-07 | 1987-09-07 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22325987A JPS6465874A (en) | 1987-09-07 | 1987-09-07 | Manufacture of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6465874A true JPS6465874A (en) | 1989-03-13 |
Family
ID=16795299
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22325987A Pending JPS6465874A (en) | 1987-09-07 | 1987-09-07 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6465874A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0297027A (en) * | 1988-10-03 | 1990-04-09 | Mitsubishi Electric Corp | Semiconductor device and manufacture thereof |
-
1987
- 1987-09-07 JP JP22325987A patent/JPS6465874A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0297027A (en) * | 1988-10-03 | 1990-04-09 | Mitsubishi Electric Corp | Semiconductor device and manufacture thereof |
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