JPS6465471A - Pattern generating device - Google Patents

Pattern generating device

Info

Publication number
JPS6465471A
JPS6465471A JP62221618A JP22161887A JPS6465471A JP S6465471 A JPS6465471 A JP S6465471A JP 62221618 A JP62221618 A JP 62221618A JP 22161887 A JP22161887 A JP 22161887A JP S6465471 A JPS6465471 A JP S6465471A
Authority
JP
Japan
Prior art keywords
counter
pattern
clock
data
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62221618A
Other languages
Japanese (ja)
Other versions
JP2620089B2 (en
Inventor
Mitsuaki Kagawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP62221618A priority Critical patent/JP2620089B2/en
Publication of JPS6465471A publication Critical patent/JPS6465471A/en
Application granted granted Critical
Publication of JP2620089B2 publication Critical patent/JP2620089B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Dc Digital Transmission (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To obtain a secure test pattern by synchronizing an address counter, a loop counter, and a pattern parameter specifying counter with a prescribed clock and generating pattern data which differ in pattern length and the number of times of repetition. CONSTITUTION:The clock of prescribed frequency is frequency-divided 19 with a reset signal from a patter setting means 11 and a frequency-divided clock 1/2 is supplied to counters 21-25 and a multiplexer 27. For the purpose, pattern length N from a pattern length selector 15 is preset in the pattern address counter 21, the number M of times of reception from a looping frequency selector 17 is preset in the loop counter 23, and the counter value of the pattern parameter specifying counter 25 is 0. The counter 21, therefore,counts down every time the clock 1/2 is inputted and supplies address data to a memory 13. Further, the memory 13 is supplied with the data 0 from the counter 25 and the data on the pattern length N is read out of the memory 13 and sent out to an LSI through a multiplexer 27 and a shift register 29.
JP62221618A 1987-09-04 1987-09-04 Pattern generator Expired - Lifetime JP2620089B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62221618A JP2620089B2 (en) 1987-09-04 1987-09-04 Pattern generator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62221618A JP2620089B2 (en) 1987-09-04 1987-09-04 Pattern generator

Publications (2)

Publication Number Publication Date
JPS6465471A true JPS6465471A (en) 1989-03-10
JP2620089B2 JP2620089B2 (en) 1997-06-11

Family

ID=16769577

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62221618A Expired - Lifetime JP2620089B2 (en) 1987-09-04 1987-09-04 Pattern generator

Country Status (1)

Country Link
JP (1) JP2620089B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0310333A (en) * 1989-06-07 1991-01-17 Mitsubishi Electric Corp Test equipment
WO2005013546A1 (en) * 2003-07-31 2005-02-10 Advantest Corporation Clock transfer unit and test equipment
JP2007292603A (en) * 2006-04-25 2007-11-08 Advantest Corp Testing device and testing method
JP2008287573A (en) * 2007-05-18 2008-11-27 Ricoh Co Ltd Data processor and self-diagnostic method therefor

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0310333A (en) * 1989-06-07 1991-01-17 Mitsubishi Electric Corp Test equipment
WO2005013546A1 (en) * 2003-07-31 2005-02-10 Advantest Corporation Clock transfer unit and test equipment
US7509517B2 (en) 2003-07-31 2009-03-24 Advantest Corporation Clock transferring apparatus for synchronizing input data with internal clock and test apparatus having the same
JP2007292603A (en) * 2006-04-25 2007-11-08 Advantest Corp Testing device and testing method
JP2008287573A (en) * 2007-05-18 2008-11-27 Ricoh Co Ltd Data processor and self-diagnostic method therefor

Also Published As

Publication number Publication date
JP2620089B2 (en) 1997-06-11

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