JPS6459018A - Method and measuring instrument for long time resolution total reflection spectrum analyzing - Google Patents

Method and measuring instrument for long time resolution total reflection spectrum analyzing

Info

Publication number
JPS6459018A
JPS6459018A JP21501087A JP21501087A JPS6459018A JP S6459018 A JPS6459018 A JP S6459018A JP 21501087 A JP21501087 A JP 21501087A JP 21501087 A JP21501087 A JP 21501087A JP S6459018 A JPS6459018 A JP S6459018A
Authority
JP
Japan
Prior art keywords
spectrum
light
probe light
time
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP21501087A
Other languages
English (en)
Other versions
JPH0776711B2 (ja
Inventor
Hiroshi Masuhara
Kensho Ikeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Science and Technology Agency
Original Assignee
Research Development Corp of Japan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Research Development Corp of Japan filed Critical Research Development Corp of Japan
Priority to JP62215010A priority Critical patent/JPH0776711B2/ja
Publication of JPS6459018A publication Critical patent/JPS6459018A/ja
Publication of JPH0776711B2 publication Critical patent/JPH0776711B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP62215010A 1987-08-31 1987-08-31 高時間分解全反射分光法及び測定装置 Expired - Fee Related JPH0776711B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62215010A JPH0776711B2 (ja) 1987-08-31 1987-08-31 高時間分解全反射分光法及び測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62215010A JPH0776711B2 (ja) 1987-08-31 1987-08-31 高時間分解全反射分光法及び測定装置

Publications (2)

Publication Number Publication Date
JPS6459018A true JPS6459018A (en) 1989-03-06
JPH0776711B2 JPH0776711B2 (ja) 1995-08-16

Family

ID=16665219

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62215010A Expired - Fee Related JPH0776711B2 (ja) 1987-08-31 1987-08-31 高時間分解全反射分光法及び測定装置

Country Status (1)

Country Link
JP (1) JPH0776711B2 (ja)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02290538A (ja) * 1989-04-28 1990-11-30 Hitachi Chem Co Ltd 改良された時間分解赤外分光光度計及び改良された時間分解赤外分光光度測定法
JPH03113349A (ja) * 1989-09-27 1991-05-14 Res Dev Corp Of Japan ３次元空間分解・時間分解吸収スペクトル測定装置
JPH04143637A (ja) * 1990-10-05 1992-05-18 Hamamatsu Photonics Kk 時間分解吸収測定装置
JPH0875639A (ja) * 1994-09-09 1996-03-22 Agency Of Ind Science & Technol スラブ光導波路を利用した光吸収スペクトル測定装置
WO2017169656A1 (ja) * 2016-03-31 2017-10-05 パナソニックＩｐマネジメント株式会社 撮像装置
JP2017194426A (ja) * 2016-04-22 2017-10-26 株式会社松栄堂 沈香の品質評価方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4173746B2 (ja) * 2003-02-12 2008-10-29 富士フイルム株式会社 測定装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61122548A (ja) * 1984-11-20 1986-06-10 Canon Inc 薄膜の光吸収特性測定装置
JPS62132132A (ja) * 1985-12-04 1987-06-15 Hitachi Ltd 全反射赤外スペクトル測定方法およびその測定用プリズム

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61122548A (ja) * 1984-11-20 1986-06-10 Canon Inc 薄膜の光吸収特性測定装置
JPS62132132A (ja) * 1985-12-04 1987-06-15 Hitachi Ltd 全反射赤外スペクトル測定方法およびその測定用プリズム

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02290538A (ja) * 1989-04-28 1990-11-30 Hitachi Chem Co Ltd 改良された時間分解赤外分光光度計及び改良された時間分解赤外分光光度測定法
JPH03113349A (ja) * 1989-09-27 1991-05-14 Res Dev Corp Of Japan ３次元空間分解・時間分解吸収スペクトル測定装置
JPH04143637A (ja) * 1990-10-05 1992-05-18 Hamamatsu Photonics Kk 時間分解吸収測定装置
JPH0875639A (ja) * 1994-09-09 1996-03-22 Agency Of Ind Science & Technol スラブ光導波路を利用した光吸収スペクトル測定装置
WO2017169656A1 (ja) * 2016-03-31 2017-10-05 パナソニックＩｐマネジメント株式会社 撮像装置
JPWO2017169656A1 (ja) * 2016-03-31 2019-02-14 パナソニックＩｐマネジメント株式会社 撮像装置
JP2017194426A (ja) * 2016-04-22 2017-10-26 株式会社松栄堂 沈香の品質評価方法

Also Published As

Publication number Publication date
JPH0776711B2 (ja) 1995-08-16

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