JPS6450410A - Manufacture of semiconductor single crystal layer - Google Patents

Manufacture of semiconductor single crystal layer

Info

Publication number
JPS6450410A
JPS6450410A JP20626887A JP20626887A JPS6450410A JP S6450410 A JPS6450410 A JP S6450410A JP 20626887 A JP20626887 A JP 20626887A JP 20626887 A JP20626887 A JP 20626887A JP S6450410 A JPS6450410 A JP S6450410A
Authority
JP
Japan
Prior art keywords
film
silicon
single crystal
layer
sio2
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP20626887A
Other languages
Japanese (ja)
Other versions
JPH0834176B2 (en
Inventor
Shigeru Kanbayashi
Tomoyasu Inoue
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP62206268A priority Critical patent/JPH0834176B2/en
Publication of JPS6450410A publication Critical patent/JPS6450410A/en
Publication of JPH0834176B2 publication Critical patent/JPH0834176B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Recrystallisation Techniques (AREA)

Abstract

PURPOSE:To make it possible to form a silicon single crystal layer on an insulating film without thermal damage to a silicon substrate, by forming a metal film, whose heat conductivity is larger than that of a protective film, on the protective film formed on a silicon film to be formed into a single crystal, and discharging heat from fused silicon into the metal film when a silicon layer is fused. CONSTITUTION:An SiO2 film 11 is deposited on a single crystal Si substrate 10. A polycrystalline Si film 13, and an SiO2 film are further deposited. A metal material, whose heat conductivity is larger than that of the SiO2 film 14, e.g., an Al film 15, is deposited. An SiO2 film 16 is deposted thereon. When an electron beam 20 is projected on the film 16 and scenned, the beat from the fused Si layer flows out in the lateral direction through the Al film 15. Therefore, the decrease in solidifying speed of the fuzed Si layer can be prevented. The beam scanning speed can be made to agree with the solidifying speed of the silicon layer. Thus, a single crystal silicon layer can be formed in an insulating film without damage on the silicon substrate.
JP62206268A 1987-08-21 1987-08-21 Method for manufacturing semiconductor single crystal layer Expired - Lifetime JPH0834176B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62206268A JPH0834176B2 (en) 1987-08-21 1987-08-21 Method for manufacturing semiconductor single crystal layer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62206268A JPH0834176B2 (en) 1987-08-21 1987-08-21 Method for manufacturing semiconductor single crystal layer

Publications (2)

Publication Number Publication Date
JPS6450410A true JPS6450410A (en) 1989-02-27
JPH0834176B2 JPH0834176B2 (en) 1996-03-29

Family

ID=16520514

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62206268A Expired - Lifetime JPH0834176B2 (en) 1987-08-21 1987-08-21 Method for manufacturing semiconductor single crystal layer

Country Status (1)

Country Link
JP (1) JPH0834176B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102538146B1 (en) * 2021-09-07 2023-05-30 (주)알엔알랩 Method of forming epitaxial semiconductor layer and method of manufacturing semiconductor device using the same

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61113229A (en) * 1984-11-08 1986-05-31 Agency Of Ind Science & Technol Manufacture of semiconductor thin film crystal layer
JPS61160924A (en) * 1985-01-09 1986-07-21 Agency Of Ind Science & Technol Manufacture of semiconductor thin film crystal layer

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61113229A (en) * 1984-11-08 1986-05-31 Agency Of Ind Science & Technol Manufacture of semiconductor thin film crystal layer
JPS61160924A (en) * 1985-01-09 1986-07-21 Agency Of Ind Science & Technol Manufacture of semiconductor thin film crystal layer

Also Published As

Publication number Publication date
JPH0834176B2 (en) 1996-03-29

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term