JPS5522811A - Manufacturing of semiconductor apparatus - Google Patents

Manufacturing of semiconductor apparatus

Info

Publication number
JPS5522811A
JPS5522811A JP9456978A JP9456978A JPS5522811A JP S5522811 A JPS5522811 A JP S5522811A JP 9456978 A JP9456978 A JP 9456978A JP 9456978 A JP9456978 A JP 9456978A JP S5522811 A JPS5522811 A JP S5522811A
Authority
JP
Japan
Prior art keywords
type
film
substrate
regions
sio
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9456978A
Other languages
Japanese (ja)
Inventor
Seiichi Iwamatsu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CHIYOU LSI GIJUTSU KENKYU KUMIAI
CHO LSI GIJUTSU KENKYU KUMIAI
Original Assignee
CHIYOU LSI GIJUTSU KENKYU KUMIAI
CHO LSI GIJUTSU KENKYU KUMIAI
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CHIYOU LSI GIJUTSU KENKYU KUMIAI, CHO LSI GIJUTSU KENKYU KUMIAI filed Critical CHIYOU LSI GIJUTSU KENKYU KUMIAI
Priority to JP9456978A priority Critical patent/JPS5522811A/en
Publication of JPS5522811A publication Critical patent/JPS5522811A/en
Pending legal-status Critical Current

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  • Electrodes Of Semiconductors (AREA)

Abstract

PURPOSE: To eliminate the formation of heat strain and, at the same time, avoid the necessity of gradual heating and gradual cooling when heat-treating semiconductor element regions provided on a sapphire substrate by irradiating interfaces among the regions with laser rays from the under surface of the substrate.
CONSTITUTION: An N type Si monocrystal layer 2 is gas phase-grown on a sapphire substrate 1, and a SiO2 film 3 and a Si3N4 film 4 are laminated and coated on the entire surface of the substrate 1. A double mask for the films 3 and 4 is formed by etching, and a layer 2 at the both ends of the mask is converted into a SiO2 film 5 reaching the substrate 1. Thereafter, the films 4 and 2 are converted into a thin SiO2 film 6, through which P type impurity ions are injected to provide a P type region 7 for controlling the voltage. Then a polycrystal Si layer 8 is grown on the whole surface and etched to make only a gate electrode region 80 remain therein, and P type impurity ions are again injected to change the region 80 into P type and, at the same time, to form P type regions 21 and 22. Thereafter, irradiating from the back surface with a scanning laser light, these regions are heat-treated.
COPYRIGHT: (C)1980,JPO&Japio
JP9456978A 1978-08-04 1978-08-04 Manufacturing of semiconductor apparatus Pending JPS5522811A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9456978A JPS5522811A (en) 1978-08-04 1978-08-04 Manufacturing of semiconductor apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9456978A JPS5522811A (en) 1978-08-04 1978-08-04 Manufacturing of semiconductor apparatus

Publications (1)

Publication Number Publication Date
JPS5522811A true JPS5522811A (en) 1980-02-18

Family

ID=14113930

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9456978A Pending JPS5522811A (en) 1978-08-04 1978-08-04 Manufacturing of semiconductor apparatus

Country Status (1)

Country Link
JP (1) JPS5522811A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5563819A (en) * 1978-11-06 1980-05-14 Nec Corp Manufacture of semiconductor device
JPS57180148A (en) * 1981-04-30 1982-11-06 Fujitsu Ltd Manufacture of semiconductor device having dielectric isolation structure
JPS58184732A (en) * 1982-04-23 1983-10-28 Nec Corp Annealing of semiconductor device
JPS58207627A (en) * 1982-05-28 1983-12-03 Fujitsu Ltd Manufacture of semiconductor device
US4650524A (en) * 1984-06-20 1987-03-17 Sanyo Electric Co., Ltd Method for dividing semiconductor film formed on a substrate into plural regions by backside energy beam irradiation
US5294555A (en) * 1982-04-13 1994-03-15 Seiko Epson Corporation Method of manufacturing thin film transistor and active matrix assembly including same

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4825816A (en) * 1971-08-11 1973-04-04
JPS5157294A (en) * 1974-11-15 1976-05-19 Kogyo Gijutsuin Handotaisochino seizohoho

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4825816A (en) * 1971-08-11 1973-04-04
JPS5157294A (en) * 1974-11-15 1976-05-19 Kogyo Gijutsuin Handotaisochino seizohoho

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5563819A (en) * 1978-11-06 1980-05-14 Nec Corp Manufacture of semiconductor device
JPS57180148A (en) * 1981-04-30 1982-11-06 Fujitsu Ltd Manufacture of semiconductor device having dielectric isolation structure
US5294555A (en) * 1982-04-13 1994-03-15 Seiko Epson Corporation Method of manufacturing thin film transistor and active matrix assembly including same
JPS58184732A (en) * 1982-04-23 1983-10-28 Nec Corp Annealing of semiconductor device
JPS58207627A (en) * 1982-05-28 1983-12-03 Fujitsu Ltd Manufacture of semiconductor device
US4650524A (en) * 1984-06-20 1987-03-17 Sanyo Electric Co., Ltd Method for dividing semiconductor film formed on a substrate into plural regions by backside energy beam irradiation

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