JPS5522811A - Manufacturing of semiconductor apparatus - Google Patents
Manufacturing of semiconductor apparatusInfo
- Publication number
- JPS5522811A JPS5522811A JP9456978A JP9456978A JPS5522811A JP S5522811 A JPS5522811 A JP S5522811A JP 9456978 A JP9456978 A JP 9456978A JP 9456978 A JP9456978 A JP 9456978A JP S5522811 A JPS5522811 A JP S5522811A
- Authority
- JP
- Japan
- Prior art keywords
- type
- film
- substrate
- regions
- sio
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Electrodes Of Semiconductors (AREA)
Abstract
PURPOSE: To eliminate the formation of heat strain and, at the same time, avoid the necessity of gradual heating and gradual cooling when heat-treating semiconductor element regions provided on a sapphire substrate by irradiating interfaces among the regions with laser rays from the under surface of the substrate.
CONSTITUTION: An N type Si monocrystal layer 2 is gas phase-grown on a sapphire substrate 1, and a SiO2 film 3 and a Si3N4 film 4 are laminated and coated on the entire surface of the substrate 1. A double mask for the films 3 and 4 is formed by etching, and a layer 2 at the both ends of the mask is converted into a SiO2 film 5 reaching the substrate 1. Thereafter, the films 4 and 2 are converted into a thin SiO2 film 6, through which P type impurity ions are injected to provide a P type region 7 for controlling the voltage. Then a polycrystal Si layer 8 is grown on the whole surface and etched to make only a gate electrode region 80 remain therein, and P type impurity ions are again injected to change the region 80 into P type and, at the same time, to form P type regions 21 and 22. Thereafter, irradiating from the back surface with a scanning laser light, these regions are heat-treated.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9456978A JPS5522811A (en) | 1978-08-04 | 1978-08-04 | Manufacturing of semiconductor apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9456978A JPS5522811A (en) | 1978-08-04 | 1978-08-04 | Manufacturing of semiconductor apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5522811A true JPS5522811A (en) | 1980-02-18 |
Family
ID=14113930
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9456978A Pending JPS5522811A (en) | 1978-08-04 | 1978-08-04 | Manufacturing of semiconductor apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5522811A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5563819A (en) * | 1978-11-06 | 1980-05-14 | Nec Corp | Manufacture of semiconductor device |
JPS57180148A (en) * | 1981-04-30 | 1982-11-06 | Fujitsu Ltd | Manufacture of semiconductor device having dielectric isolation structure |
JPS58184732A (en) * | 1982-04-23 | 1983-10-28 | Nec Corp | Annealing of semiconductor device |
JPS58207627A (en) * | 1982-05-28 | 1983-12-03 | Fujitsu Ltd | Manufacture of semiconductor device |
US4650524A (en) * | 1984-06-20 | 1987-03-17 | Sanyo Electric Co., Ltd | Method for dividing semiconductor film formed on a substrate into plural regions by backside energy beam irradiation |
US5294555A (en) * | 1982-04-13 | 1994-03-15 | Seiko Epson Corporation | Method of manufacturing thin film transistor and active matrix assembly including same |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4825816A (en) * | 1971-08-11 | 1973-04-04 | ||
JPS5157294A (en) * | 1974-11-15 | 1976-05-19 | Kogyo Gijutsuin | Handotaisochino seizohoho |
-
1978
- 1978-08-04 JP JP9456978A patent/JPS5522811A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4825816A (en) * | 1971-08-11 | 1973-04-04 | ||
JPS5157294A (en) * | 1974-11-15 | 1976-05-19 | Kogyo Gijutsuin | Handotaisochino seizohoho |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5563819A (en) * | 1978-11-06 | 1980-05-14 | Nec Corp | Manufacture of semiconductor device |
JPS57180148A (en) * | 1981-04-30 | 1982-11-06 | Fujitsu Ltd | Manufacture of semiconductor device having dielectric isolation structure |
US5294555A (en) * | 1982-04-13 | 1994-03-15 | Seiko Epson Corporation | Method of manufacturing thin film transistor and active matrix assembly including same |
JPS58184732A (en) * | 1982-04-23 | 1983-10-28 | Nec Corp | Annealing of semiconductor device |
JPS58207627A (en) * | 1982-05-28 | 1983-12-03 | Fujitsu Ltd | Manufacture of semiconductor device |
US4650524A (en) * | 1984-06-20 | 1987-03-17 | Sanyo Electric Co., Ltd | Method for dividing semiconductor film formed on a substrate into plural regions by backside energy beam irradiation |
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