JPS6441878A - Lsi tester - Google Patents

Lsi tester

Info

Publication number
JPS6441878A
JPS6441878A JP62198246A JP19824687A JPS6441878A JP S6441878 A JPS6441878 A JP S6441878A JP 62198246 A JP62198246 A JP 62198246A JP 19824687 A JP19824687 A JP 19824687A JP S6441878 A JPS6441878 A JP S6441878A
Authority
JP
Japan
Prior art keywords
test
data
unit
set values
memory circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62198246A
Other languages
Japanese (ja)
Inventor
Naoaki Narumi
Takako Maekawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP62198246A priority Critical patent/JPS6441878A/en
Publication of JPS6441878A publication Critical patent/JPS6441878A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To achieve a higher efficiency of a test, by storing test condition within a pin electronics prior to the test to eliminate exchanges of data with an external controller during the test. CONSTITUTION:A pin electronics is made up of a test unit such as timing generator and level generator, a unit controller which directly controls the setting of a data or other operation through a unit bus in test units and a memory circuit for storing unit data for the test units. Then, the memory circuit stores addresses and set data of test units for controlling them, alteration methods for set values and set data for the number of steps and the frequency of altering set values in the alteration of set values.
JP62198246A 1987-08-10 1987-08-10 Lsi tester Pending JPS6441878A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62198246A JPS6441878A (en) 1987-08-10 1987-08-10 Lsi tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62198246A JPS6441878A (en) 1987-08-10 1987-08-10 Lsi tester

Publications (1)

Publication Number Publication Date
JPS6441878A true JPS6441878A (en) 1989-02-14

Family

ID=16387936

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62198246A Pending JPS6441878A (en) 1987-08-10 1987-08-10 Lsi tester

Country Status (1)

Country Link
JP (1) JPS6441878A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5273009A (en) * 1991-08-26 1993-12-28 Ngk Insulators, Ltd. Silicon-nitride-inserted piston
US6314746B2 (en) 1998-09-25 2001-11-13 Mitsubishi Denki Kabushiki Kaisha Refrigerator with a freezer compartment and method of using it
JP2011009553A (en) * 2009-06-26 2011-01-13 Fujitsu Semiconductor Ltd Inspection system and inspection method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5273009A (en) * 1991-08-26 1993-12-28 Ngk Insulators, Ltd. Silicon-nitride-inserted piston
US6314746B2 (en) 1998-09-25 2001-11-13 Mitsubishi Denki Kabushiki Kaisha Refrigerator with a freezer compartment and method of using it
JP2011009553A (en) * 2009-06-26 2011-01-13 Fujitsu Semiconductor Ltd Inspection system and inspection method

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